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Property determination

  • US 5,712,797 A
  • Filed: 06/06/1995
  • Issued: 01/27/1998
  • Est. Priority Date: 10/07/1994
  • Status: Expired due to Term
First Claim
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1. A method of determining or predicting a value Px which is a value of a property of a material X or a property of a product of a process from said material or yield of said process, which method comprises measuring the absorption Dix of said material at more than one wavelength in the region 600-2600 nm, comparing the said absorptions or a derivative thereof with absorptions Dim or derivatives thereof at the same wavelength for a number of standards S in a bank for which the said property or yield P is known, and choosing from the bank at least one standard Sm with property Pm said standard having the smallest average value of the absolute difference at each wavelength I between the absorption Di x (or derivative thereof) for the material and the absorption Di m (or derivative thereof) for the standard Sm to obtain Px, with averaging of said properties or yields Pm when more than one standard Sm is chosen and wherein the standard Sm chosen for the property or yield wanted is such that in relation to the unknown material X and each chosen standard Sm a function ixm, which is a proximity index defined by i2 (xm)=Σ

  • (Dix Dim)2, is less than a minimal index im which has been determined from preselected standards by (a) calculating for each pair of the standards a value of a corresponding proximity index to obtain a series of proximity indices with corresponding property differences, (b) relating values of the proximity indices to corresponding property differences, (c) calculating an average of the corresponding property differences for predetermined values L which are greater than a corresponding proximity index, and (d) calculating the minimal index based on the average property differences and a reproducibility standard for the property.

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