Method and apparatus for testing electronic circuitry in a manufacturing environment
First Claim
1. In a manufacturing environment, a method of testing circuitry, comprising the steps of:
- locating an array of electromagnetic probes in close proximity to the circuitry, each of the array of electromagnetic probes being selectable to receive electromagnetic emissions emanating from the circuitry when activated by a stimulus signal;
activating a particular electromagnetic probe, selected from the array of electromagnetic probes, to directly stimulate a localized portion of the circuitry with a wireless signal; and
determining functional operation of the circuitry by measuring a response from the circuitry.
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Accused Products
Abstract
A manufacturing environment(100) includes test equipment (130) that tests circuitry (110) for functional operation. An electromagnetic probe (137) is operated adjacent to a substrate having electronic circuitry to be tested (310). The electromagnetic probe is activated to directly stimulate a localized portion of the electronic circuitry with a wireless signal (320). Functional operation of the circuitry is determined by measuring the response of the electronic circuitry (330, 340). In one embodiment, an array of electromagnetic probes is operated to receive near-field electromagnetic emissions emanating from the circuitry. These emissions are measured and an electromagnetic profile generated for a portion of the circuitry (330). The electromagnetic profile is analyzed to determine functional operation of the circuitry (340).
72 Citations
15 Claims
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1. In a manufacturing environment, a method of testing circuitry, comprising the steps of:
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locating an array of electromagnetic probes in close proximity to the circuitry, each of the array of electromagnetic probes being selectable to receive electromagnetic emissions emanating from the circuitry when activated by a stimulus signal; activating a particular electromagnetic probe, selected from the array of electromagnetic probes, to directly stimulate a localized portion of the circuitry with a wireless signal; and determining functional operation of the circuitry by measuring a response from the circuitry. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method of testing circuitry, comprising the steps of:
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locating an array of electromagnetic probes in close proximity to the circuitry, each of the array of electromagnetic probes being selectable to receive electromagnetic emissions emanating from the circuitry when the circuitry is activated by a stimulus signal, each of the array of electromagnetic probes being selectable to transmit a stimulus signal for the circuitry; activating a particular electromagnetic probe, selected from the array of electromagnetic probes, to directly stimulate a localized portion of the circuitry with a wireless signal; and determining functional operation of the circuitry by measuring a response from the circuitry, via at least some of the array of electromagnetic probes. - View Dependent Claims (13, 14)
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15. A method of testing circuitry, comprising the steps of:
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locating an array of electromagnetic probes in close proximity to the circuitry, each of the array of electromagnetic probes being selectable to receive electromagnetic emissions emanating from the circuitry when the circuitry is activated by a stimulus signal, each of the array of electromagnetic probes being selectable to transmit a stimulus signal for the circuitry; simultaneously activating a plurality of electromagnetic probes, selected from the array of electromagnetic probes, to directly stimulate localized portions of the circuitry with a wireless signal; determining functional operation of the circuitry by measuring a response from the circuitry, via at least some of the array of electromagnetic probes, including the steps of; measuring near-field electromagnetic emissions from the circuitry, using at least some electromagnetic probes of the array of electromagnetic probes, to generate an electromagnetic profile of at least a portion of the circuitry; retrieving a reference profile from a database; and comparing the electromagnetic profile to the reference profile.
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Specification