Method and system for detecting defects in optically transmissive coatings formed on optical media substrates

• US 5,715,051 A
• Filed: 10/21/1996
• Issued: 02/03/1998
• Est. Priority Date: 10/21/1996
• Status: Expired due to Fees

• Current Assignee: Datarius Technologies, Inc.
• Original Assignee: Medar Incorporated (Nadex (Thailand) Co. Ltd.)
• Inventors: Luster, Spencer D.
• Primary Examiner(s): Font, Frank G.
• Assistant Examiner(s): Ratliff, Reginald A.
• Application Number:
  US08/735,197
• Time in Patent Office: 470 Days
• Field of Search: 356/239, 356/237, 356/71
• US Class Current: 356/239.1
• CPC Class Codes: G01B 11/0625 with measurement of absorption or reflection
• CPC Class Codes: G01N 21/9506 Optical discs

Abstract

Spectral transmittance of a dye coating for optical data is determined off-line. Light source wavelength is then matched to the wavelengths at which the dye has the least transmission (i.e. maximum absorbance). The method and system of the present invention are provided for detecting local and global defects in the coating wherein the inspection is done at the maximum absorbance wavelengths to produce a maximum change in a transmitted light signal for a given change in physical thickness of the dye coating. Relative change in thickness is determined based on the change in the transmitted light signal through the dye coating. In order to complete detection and measurement of the transmittance changes, a pair of electronic signals are split from a camera signal wherein one of the electronic signals is filtered by a FIR filter to identify local changes in dye thickness against a globally varying background. In order to detect global variations in the dye thickness, the other electronic signal is processed by a simple thresholding circuit.

Claims

1. A method for detecting defects in an optically transmissive coating formed on an optical media substrate, the method comprising the steps of:

illuminating the coating with light having a wavelength matched to peak absorption wavelengths of the coating to obtain a transmitted light signal;

generating a first electronic signal from the transmitted light signal, the first electronic signal having high frequency defect data and background data having a frequency less than the frequency of the high frequency defect data;

filtering the first electronic signal to pass the high frequency defect data while substantially eliminating the background data; and

processing at least the high frequency defect data to determine the defects in real-time wherein the step of processing determines local defects in real-time.

2. The method as claimed in claim 1 wherein the coating is a dye coating.

3. The method as claimed in claim 1 wherein the optical media substrate is an optical disk.

4. The method as claimed in claim 3 wherein the optical disk is a recordable, compact disk.

5. The method as claimed in claim 1 wherein the optical media substrate is substantially transparent.

6. The method as claimed in claim 1 wherein the step of filtering is accomplished digitally.

7. The method as claimed in claim 1 wherein the first electronic signal includes a data stream of image data wherein the high frequency defect data is based on present and previous sample values of the data stream of image data.

8. A method for detecting defects in an optically transmissive coating formed on an optical media substrate, the method comprising the steps of:

illuminating the coating with light having a wavelength matched to peak absorption wavelengths of the coating to obtain a transmitted light signal;

generating a first electronic signal from the transmitted light signal, the first electronic signal having high frequency defect data and background data having a frequency less than the frequency of the high frequency defect data;

generating a second electronic signal having the high frequency defect data and background data, and

processing at least the high frequency defect data to determine the defect in real time wherein the step of processing includes the step of processing the high frequency defect data and the background data to detect global defects in real-time.

9. The method as claimed in claim 8 wherein the step of processing the high frequency defect data and the background data includes the step of thresholding the high frequency defect data and the background data.

10. A system for detecting defects in an optically transmissive coating formed on an optical media substrate, the system comprising:

a base for supporting the optical media substrate with an optical transmissive coating formed thereon;

means for illuminating the coating with light having a wavelength matched to peak absorption wavelengths of the coating to obtain a transmitted light signal;

means for generating a first electronic signal from the transmitted light signal, the first electronic signal having high frequency defect data and background data having a frequency less than the frequency of the high frequency defect data;

a filter for filtering the first electronic signal to pass the high frequency defect data while substantially eliminating the background data; and

a processor for processing at least the high frequency defect data to determine the defects in real-time wherein the processor processes the high frequency defect data to determine local defects in real-time.

11. The system as claimed in claim 10 wherein the coating is a dye coating.

12. The system as claimed in claim 10 wherein the optical media substrate is an optical disk.

13. The system as claimed in claim 12 wherein the optical disk is a recordable, compact disk.

14. The system as claimed in claim 10 wherein the optical media substrate is substantially transparent.

15. The system as claimed in claim 10 wherein the filter is a finite impulse response filter.

16. The system as claimed in claim 10 wherein the filter is a digital filter.

17. The system of claim 12 wherein the means for illuminating includes a light source for generating light and a spectral filter for spectrally filtering the generated light to pass the light having the wavelength matched to the peak absorption wavelengths of the coating.

18. A system for detecting defects in an optically transmissive coating formed on an optical media substrate, the system comprising:

a base for supporting the optical media substrate with an optical transmissive coating formed thereon;

means for illuminating the coating with light having a wavelength matched to peak absorption wavelengths of the coating to obtain a transmitted light signal;

means for generating a first electronic signal from the transmitted light signal, the first electronic signal having high frequency defect data and background data having a frequency less than the frequency of the high frequency defect data wherein the means for generating includes a camera adapted to respond to the transmitted light signal to obtain a camera signal;

a splitter for splitting the camera signal into the first electronic signal and a second electronic signal, the second electronic signal also having the high frequency defect data and the background data; and

a processor for processing at least the high frequency defect data to determine the defects in real-time.

19. The system of claim 18 wherein the processor processes the high frequency defect data and the background data to obtain global defects.

20. The system as claimed in claim 19 wherein the processor includes a thresholding circuit for thresholding the high frequency defect data and the background data to determine the global defects.

21. The system of claim 20 further comprising a computer coupled to the camera for controllably operating the camera.

22. The system of claim 21 further comprising a motor adapted to move the base in response to a control signal from the computer.

23. The system of claim 22 wherein the base rotatably supports the optical media substrate and wherein the motor rotates the base in response to the control signal.

24. The system of claim 20 wherein the camera is a linear array camera.