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Method of validating measurement data of a process parameter from a plurality of individual sensor inputs

  • US 5,715,178 A
  • Filed: 04/15/1992
  • Issued: 02/03/1998
  • Est. Priority Date: 11/02/1989
  • Status: Expired due to Term
First Claim
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1. A method for generating a validated measurement of an industrial process parameter at a point in time by using a plurality of individual sensor inputs from a scan of said sensors at said point in time for display at a process control panel, comprising:

  • (a) storing the sensor inputs from said scan;

    (b) performing a first validation pass by computing an initial average of all stored sensor inputs;

    (c) deviation checking each sensor input by comparing each input including a preset tolerance against the initial average input;

    (d) if any deviation check in step (c) is unsatisfactory, flagging as suspect, the sensor which produced the unsatisfactory input;

    (e) determining whether at least two of the sensors have not been flagged as suspect and are therefore considered good sensors;

    (f) if two or more sensors are good, performing a second validation pass by computing a second average of all the inputs from said good sensors;

    (g) deviation checking the good sensor inputs by comparing each good sensor input including a present tolerance against the second average; and

    (h) if the deviation check in step (g) is satisfactory, displaying the second average at said control panel as the validated measurement and flagging the suspect sensor as bad.

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