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Electrode designs for controlling uniformity profiles in plasma processing reactors

  • US 5,716,485 A
  • Filed: 06/07/1995
  • Issued: 02/10/1998
  • Est. Priority Date: 06/07/1995
  • Status: Expired due to Term
First Claim
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1. A plasma reactor for etching a substrate, said reactor comprising:

  • .a first powered electrode adapted to support the substrate, said first powered electrode connected to a source of RF energy;

    a second electrode disposed at a distance from said first powered electrode, said second electrode having a generally conical shape, an apex of said conical shape closer to said first electrode than a base of said conical shape.

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