X-ray and neutron diffractometric imaging of the internal structure of objects

• US 5,717,733 A
• Filed: 05/31/1995
• Issued: 02/10/1998
• Est. Priority Date: 05/31/1995
• Status: Expired due to Fees

• Current Assignee: Quanta Vision, Inc.
• Original Assignee: Quanta Vision, Inc.
• Inventors: Lazarev, Pavel I., Kurbatov, Alexey V.
• Primary Examiner(s): Church, Craig E.
• Application Number:
  US08/454,909
• Time in Patent Office: 986 Days
• Field of Search: 378/2, 378/71
• US Class Current: 378/71
• CPC Class Codes: G01N 23/207 Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Abstract

A method and device for examining the internal structure of an object uses diffracted X-rays or other penetrating radiation. In one embodiment, spatial filters proximate to a source of radiation transmit an array of divergent pixel-beams which irradiate an object being examined. The object absorbs, refracts, diffracts, and incoherently scatters radiation from the pixel-beams. Spatial filters proximate to a detector block undeflected and refracted radiation which exits the object. The detector separately measures diffracted radiation for each pixel-beam. For example, an integral of the diffracted intensity around a pixel-beam provides a pixel intensity in an image of the object. Alternatively, analyzing the intensity in a diffraction pattern around a pixel-beam can identify structures and materials within the object. A non-invasive procedure identifies abnormal tissue by measuring radiation diffracted at an angle characteristic of the diffraction pattern for abnormal tissue. In one embodiment of the invention, two spatial filters which form the pixel-beams have arrays of apertures with apertures in the first and second filters along lines from the source. This allow the pixel-beams to be divergent and increases the percentage of usable radiation from the source.

Claims

1. A method for examining the structure of an object, comprising:

irradiating the object with a plurality of beams, wherein the beams are separated from each other and simultaneously pass through the object;

detecting, for each of the beams, an intensity of diffracted radiation around a non-deflected path of the beam; and

forming an image of the object, Wherein the image comprises an array of pixels such that each pixel is associated with one of the beams and has an intensity that indicates the intensity of diffracted radiation around the non-deflected path of the associated beam.

2. The method of claim 1, wherein detecting intensity for a beam comprises measuring an integral of the intensity of the diffracted radiation around the non-deflected path of the beam.

3. The method of claim 1, further comprising filtering radiation which exits from the object to remove radiation not deflected by the object, wherein filtering occurs before detecting intensity.

4. The method of claim 1, wherein irradiating the object comprises irradiating the object with beams that are sufficiently separated that diffraction patterns caused by diffraction of neighboring beams in the object do not overlap where diffracted intensity is detected.

5. The method of claim 1, wherein detecting intensity for a beam comprises:

blocking radiation which is outside a range of angles with the beam; and

measuring intensity of radiation within the range of angles.

6. The method of claim 1, further comprising irradiating a first spatial filter with a penetrating radiation, wherein the first spatial filter has a first array of apertures formed therethrough and radiation which passes through the first array of apertures forms the beams.

7. A method for examining the structure of an object, comprising:

irradiating a first spatial filter with a penetrating radiation from a radiation source, wherein the first spatial filter has a first array of apertures formed therethrough and radiation which passes through the first array of apertures forms a plurality of beams that are separated from each other and diverge from each other;

irradiating a second spatial filter with the penetrating radiation that passes through the first array of apertures, wherein the second spatial filter has a second array of apertures formed therethrough, wherein each aperture in the second array is centered along a line that passes through the source and a center of a corresponding aperture in the first array;

irradiating the object with the plurality of beams, wherein the beams simultaneously pass through the object; and

detecting, for each of the beams, an intensity of diffracted radiation around a non-deflected path of the beam.

8. A method for examining the structure of an object, comprising:

irradiating the object with a plurality of beams which diverge from each other, wherein the beams are separated from each other and simultaneously pass through the object;

filtering radiation which passes through the object to remove radiation not deflected by the object and radiation refracted in the object, wherein filtering occurs before detecting intensity; and

detecting, for each of the beams, an intensity of diffracted radiation around a non-deflected path of the beam.

9. The method of claim 8, wherein detecting intensity for a beam comprises measuring a diffraction pattern around the non-deflected path of the beam.

10. The method of claim 9, wherein measuring the diffraction pattern comprises measuring an angle at which the diffraction pattern has a reflex.

11. A diagnostic procedure comprising:

irradiating a tissue with a first plurality of beams of a penetrating radiation, wherein the beams are separated from each other and simultaneously pass through the tissue;

spatially filtering radiation which exits from the tissue, wherein for each beam, the filtering selects radiation within a first range of angles with non-deflected path of the beam, and the first range includes a first angle that corresponds to a reflex found in a diffraction pattern for an abnormal tissue; and

measuring, for each beam, radiation which exits the tissue at the first angle relative to the non-deflected path of that beam.

12. The procedure of claim 11, wherein the beams are divergent from each other.

13. The procedure of claim 11, wherein measuring comprises forming an image of the tissue, wherein the image comprises pixels that correspond to the beams, each pixel having an intensity which depends on an intensity of radiation diffracted from a corresponding beam, at the first angle with the corresponding beam.

14. The method of claim 11, further comprising:

irradiating a tissue with a second plurality of beams of the penetrating radiation, wherein the second plurality of beams simultaneously pass through the tissue;

measuring, for each beam in the second plurality, radiation which exits the tissue at a second angle relative to a non-deflected path of that beam, wherein the second angle corresponds to a reflex found in a diffraction pattern for a normal tissue; and

comparing the measurement of the radiation at the first angle to the measurement of the radiation at the second angle.

15. An apparatus for examining an object, comprising:

a source of penetrating radiation;

a first spatial filter positioned to divide radiation from the source into a plurality of separate beams which simultaneously irradiate the object;

a second spatial filter positioned to filter radiation from the beams which emerges from the object, the second spatial filter having an array of separate regions which are opaque to the penetrating radiation, wherein each opaque region corresponds to one of the beams and is positioned and sized to block radiation from the corresponding beam which passes undeflected through the object and block radiation from the corresponding beam which is refracted by the object; and

a detector of the penetrating radiation positioned to measured radiation from the beams, which passes through the second filter.

16. The apparatus of claim 15, wherein the first spatial filter comprises a layer of material which is opaque to the penetrating radiation, the layer having an array of apertures formed therethrough.

17. The apparatus of claim 16, further comprising a third spatial filter which comprises an opaque layer having an array of apertures formed therethrough, wherein each aperture through the third spatial filter is along a line through the source and a corresponding one of the apertures in the first spatial filter and is larger than the corresponding aperture in the first spatial filter.

18. The apparatus of claim 16, wherein the layer of material is formed in the shape of a portion of a sphere centered on the source.

19. The apparatus of claim 15, wherein each opaque region of second spatial filter comprises:

a bottom region having a normal parallel to an undeflected direction of the corresponding beam; and

a wall which surrounds a perimeter of the bottom region.

20. The apparatus of claim 15, wherein the opaque regions have a size which can be adjusted by a user.

21. The apparatus of claim 15, wherein the second spatial filter further comprises a layer of material which is opaque to the penetrating radiation, wherein the layer has an array of apertures formed therethrough, and each of the opaque regions is located in a central portion of one of the apertures through the layer and is surrounded by an area which is transparent to the penetrating radiation.

22. The apparatus of claim 21, wherein the layer of material is formed in the shape of a portion of a sphere centered on the source.