System and method for an antifuse bank

• US 5,724,282 A
• Filed: 09/06/1996
• Issued: 03/03/1998
• Est. Priority Date: 09/06/1996
• Status: Expired due to Term

• Current Assignee: Micron Technology, Inc.
• Original Assignee: Micron Technology, Inc.
• Inventors: Duesman, Kevin G., Loughmiller, Daniel R.
• Primary Examiner(s): NGUYEN, TAN
• Application Number:
  US08/708,920
• Time in Patent Office: 543 Days
• Field of Search: 365/225.7, 365/96, 365/200, 365/201, 365/230.03, 257/50, 257/530
• US Class Current: 365/96
• CPC Class Codes: G11C 17/16 using electrically-fusible links

Abstract

An antifuse bank (200) for an integrated circuit. The antifuse bank (200) includes a plurality of word lines (246) and digit lines (244) disposed to form an array. The antifuse bank (200) also includes a plurality of antifuse cells (230). Each antifuse cell (230) includes an antifuse (242) that is programmable to one of two fixed states. Each antifuse cell (230) also includes an access device (240) coupled to one of the word lines (246) and one of the digit lines (244) and coupled to the antifuse (242) of the antifuse cell (230). The antifuse bank (200) further includes an addressing circuit (248, 250) coupled to the array thin selects an antifuse (242) of the array to be accessed. The antifuse bank (200) also includes a sensing circuit (228) coupled to the array that senses the state of the selected antifuse (242).

Claims

1. An antifuse bank for an integrated circuit, the antifuse bank comprising:

a plurality of word and digit lines disposed to form an array;

a plurality of antifuse cells, each antifuse cell including;

an antifuse that is programmable to one of two states;

an access device coupled to one of the word lines and one of the digit lines and coupled to the antifuse;

an addressing circuit coupled to the array that selects an antifuse of the array to be accessed; and

a sensing circuit coupled to the array that senses the state of the selected antifuse, wherein each sensing circuit comprises a transistor that is coupled to one of the digit lines to impose a first voltage on the digit line, wherein a cell coupled to the digit line overcomes the effect of the transistor during a read operation when the antifuse of the cell is in a first state, thus producing a second voltage on the digit line.

2. The antifuse bank of claim 1, wherein the antifuse of each antifuse cell is coupled to a common node.

3. The antifuse bank of claim 1, wherein the transistor of the sensing circuit is a long L device, such that the effect of the transistor on the voltage of the digit line can be easily overcome by an antifuse cell.

4. The antifuse bank of claim 1, wherein a sensing circuit is coupled to each digit line.

5. The antifuse bank of claim 1, wherein the antifuse of each antifuse cell comprises a capacitive element, wherein the capacitance does not exceed 25 nanofarads.

6. A memory device, comprising:

an array of storage cells for storing data for the memory device;

an address decoder coupled to the array of storage cells that selects a cell of the array to be accessed;

an array of antifuses that is coupled to provide data to the address decoder for use in selecting cells of the array of storage cells; and

wherein the array of antifuses comprises;

an array of word and digit lines;

a number of access devices, each access device coupled to one of the word lines and one of the digit lines and coupled to an antifuse;

an addressing circuit coupled to the array of word and digit lines that selects an antifuse; and

a sensing circuit coupled to at least one of the digit lines that retrieves the data stored in the antifuse.

7. A method for reading data from a cell of an antifuse array, comprising the steps of:

establishing a first voltage on a digit line that is coupled to the cell of the antifuse array;

setting a common node of each cell to a second voltage;

activating an access device of the cell;

monitoring the voltage on the digit line with a sensing circuit coupled to the digit line to determine the state of an antifuse of the cell; and

wherein the step of activating an access device comprises the step of contemporaneously activating the access devices for a plurality of cells that are coupled to the same digit line to provide redundant storage of data.

9. A method for shorting an antifuse of a cell of an antifuse array, comprising the steps of:

activating an access transistor of the cell;

establishing a first voltage on a digit line coupled to the cell; and

applying a voltage pulse to a node common to a plurality of antifuses of the antifuse array.

10. A method of determining an operational margin of a programmed array of antifuses, comprising the steps of:

establishing a first voltage on a node common to each antifuse of the array within normal operating range;

varying the voltage on the common node; and

monitoring the operation of the antifuses of the array.

11. The method of step 10, wherein the step of varying the voltage on the common node is performed incrementally.

8. The method of claim 11, wherein the step of establishing a first voltage on a digit line comprises the step of establishing a high voltage level on the digit line with a long L device.

12. An antifuse bank for an integrated circuit, the antifuse bank comprising:

a plurality of word and digit lines disposed to form an array;

a plurality of antifuse cells, each antifuse cell coupled to a common node, each antifuse cell having;

an antifuse having a capacitive element, wherein the capacitance does not exceed 25 nanofarads, wherein the antifuse is programmable to one of two states, wherein the antifuses of each antifuse cell coupled to the same digit line are programmed to the same state;

an access device coupled to one of the word lines and one of the digit lines and coupled to the antifuse;

an addressing circuit coupled to the array that selects an antifuse of the array to be accessed; and

a sensing circuit coupled to the array that senses the state of the selected antifuse, the sensing circuit having a long L transistor that is coupled to each digit line to impose a first voltage on the digit line, wherein a cell coupled to the digit line overcomes the effect of the transistor during a read operation when the antifuse of the cell is in the first state, thus producing a second voltage on the digit line.