Rosette-type optical microsystem of strain gauges having dielectric guides for measuring a longitudinal strain in a planar structure
First Claim
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1. Rosette-type, optical microsystem of strain gauges for measuring a strain applied to a part, said strain having a single component, said microsystem comprising:
- at least one rosette formed from at least two strain gauges positioned in series on a dielectric guide and a calculating circuit for determining said strain, independently of temperature, by resolution of a system of equations.
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Abstract
The present invention relates to a planar, rosette-type, optical microsystem with strain gauges having dielectric guides used for measuring a system of strains or stresses applied to a part, in which the part is under purely longitudinal strain, at least one rosette being formed by at least two strain gauges with dielectric guides (J1, J2, J3) and in which a calculating circuit makes it possible to determine said strain by resolving a system of equations.
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Citations
20 Claims
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1. Rosette-type, optical microsystem of strain gauges for measuring a strain applied to a part, said strain having a single component, said microsystem comprising:
- at least one rosette formed from at least two strain gauges positioned in series on a dielectric guide and a calculating circuit for determining said strain, independently of temperature, by resolution of a system of equations.
- View Dependent Claims (2, 3, 4, 5, 6, 7, 9, 13, 14, 15, 16, 17, 18, 19, 20)
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8. λ
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1. λ
2 and λ
3 being the respective characteristic wavelengths of the three Bragg networks constituting the rosette, said wavelengths being very close to one another and λ
1o, λ
2o and λ
3o are the characteristic wavelengths in the absence of deformations and at a reference temperature To, ξ
1 being a coefficient linking the characteristic wavelength with the deformation and ξ
2 a thermal expansion coefficient, the two angles β
1 and β
2 being of a random nature, but known and non-zero modulo, characterizing the rosette and α
being the angle formed by the orientation of the strain to be determined with the orientation of a reference strain gauge of the rosette, the parameters d and r being respectively the half-sum and half-difference of the deformations to be determined. - View Dependent Claims (10, 11, 12)
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1. λ
Specification