In-situ monitoring of the change in thickness of films
First Claim
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1. A method of in-situ monitoring of the change in thickness of a conductive film on an underlying body wherein the thickness of the conductive film is decreased by removing a portion of the conductive film comprising the steps of:
- (a) inducing an eddy current in the film by producing a shaped alternating electromagnetic field with a sensor proximate the film; and
(b) detecting a change in the thickness of the film as it changes due to a change in the induced current.
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Abstract
The change in thickness of a film on an underlying body such as a semiconductor substrate is monitored in situ by inducing a current in the film, and as the thickness of the film changes (either increase or decrease), the changes in the current are detected. With a conductive film, eddy currents are induced in the film by a generating an alternating electromagnetic field with a sensor which includes a capacitor and an inductor.
127 Citations
13 Claims
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1. A method of in-situ monitoring of the change in thickness of a conductive film on an underlying body wherein the thickness of the conductive film is decreased by removing a portion of the conductive film comprising the steps of:
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(a) inducing an eddy current in the film by producing a shaped alternating electromagnetic field with a sensor proximate the film; and (b) detecting a change in the thickness of the film as it changes due to a change in the induced current. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A method of in-situ monitoring of the change in thickness of a conductive film on an underlying body comprising the steps of:
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(a) inducing an eddy current in the film by producing a shaped alternating electromagnetic field with a sensor proximate the film, the sensor including an inductive means and a capacitor electrically connected to the inductive means; and (b) detecting a change in the thickness of the film as it changes due to a change in the induced current by monitoring a frequency shift associated with a resonant peak of the sensor due to the change in thickness of the conductive film.
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8. A method of in-situ monitoring of the change in thickness of a conductive film on an underlying body comprising the steps of:
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(a) inducing an eddy current in the film by producing a shaped alternating electromagnetic field with a plurality of sensors located at different locations proximate the underlying body, at least one sensor including an inductive means and a capacitor electrically connected to the inductive means; and (b) detecting a change in the thickness of the film as it changes due to a change in the induced current. - View Dependent Claims (9, 10, 11, 12, 13)
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Specification