CMOS voltage clamp

• US 5,734,186 A
• Filed: 09/16/1996
• Issued: 03/31/1998
• Est. Priority Date: 09/16/1996
• Status: Expired due to Term

• Current Assignee: Delphi Technologies, Inc. (BorgWarner Incorporated)
• Original Assignee: Delco Electronics Corporation (Motors Liquidation Co. GUC Trust)
• Inventors: Honnigford, Edward Herbert, Noll, Tracy Adam, Parrish, Jack Duane
• Primary Examiner(s): Crane, Sara W.
• Application Number:
  US08/715,284
• Time in Patent Office: 561 Days
• Field of Search: 257/356, 257/357, 257/360, 257/361, 257/362
• US Class Current: 257/360
• CPC Class Codes: H01L 27/0251 for MOS devices
• CPC Class Codes: Y10S 148/009 Bi-MOS

Abstract

An IC voltage clamp and a process for forming the voltage clamp. The voltage clamp includes an MGFO device having an n-type source region, an n-type drain region, and a p-type field implant diffusion between the source and drain regions. The voltage clamp further employs a parasitic NPN device having a collector region coincident with the MGFO drain region, an emitter region coincident with the MGFO source region, and a base region formed by the substrate. A metal gate electrode overlies and is insulated from the field implant diffusion, but electrically connects the source and emitter regions to ground. An input electrode contacts the drain region so as to electrically connect the drain and collector regions to the input voltage of an integrated circuit. The field implant diffusion and drain/collector regions are formed by overlapping their masks, such that a lower breakdown voltage is achieved between the NPN collector and the substrate and field implant diffusion (the NPN base). The voltage clamp is capable of withstanding electrostatic discharge pulses of greater than about 8000 Vdc, and is particularly adapted for use in protecting a CMOS IC that operates at high voltages, such as automotive battery voltages with 40 Vdc transients, without interfering with the operation of the IC.

Claims

1. A voltage clamp of an integrated circuit for which the voltage clamp operates to shunt to ground any integrated circuit input voltage that exceeds a breakdown voltage of the voltage clamp, the voltage clamp comprising:

a substrate;

an MGFO device formed in the substrate and having a channel, the MGFO device having a source region, a drain region formed by a well region, and a field implant diffusion between the source and drain regions such that the source and well regions are separated by the field implant diffusion;

a bipolar device formed in the substrate, the bipolar device having a collector region formed by the well region, an emitter region formed by the source region, and a base region formed by the field implant diffusion and the substrate;

a metal gate electrode overlying the field implant diffusion, the metal gate electrode being electrically insulated from the field implant diffusion and electrically contacting the source and emitter regions so as to connect the source and emitter regions to ground; and

an input electrode contacting the drain region so as to electrically connect the drain region and the collector region to the input voltage of the integrated circuit;

wherein the well region and the substrate define a junction therebetween and the field implant diffusion and the well region overlap at the junction so as to yield a breakdown voltage for the voltage clamp of at least 40 Vdc.

2. A voltage clamp as recited in claim 1 wherein the field implant diffusion and the well region overlap at the junction by about 4.4 micrometers.

3. A voltage clamp as recited in claim 1 wherein the breakdown voltage of the voltage clamp is less than 62 Vdc.

4. A voltage clamp as recited in claim 1 wherein the integrated circuit is a CMOS integrated circuit.

5. A voltage clamp as recited in claim 1 wherein the voltage clamp withstands an electrostatic discharge pulse of at least 8000 Vdc.

6. A voltage clamp of a CMOS integrated circuit for which the voltage clamp operates to shunt to ground any integrated circuit input voltage that exceeds a breakdown voltage of the voltage clamp, the voltage clamp comprising:

a p-type substrate;

an n-well, an n-type first region and a p-type field implant diffusion formed in the substrate, the field implant diffusion being between the first region and the n-well, an n-type second region residing in the n-well such that the first and second regions are separated by the n-well and the field implant diffusion;

a metal gate electrode overlying the field implant diffusion, the metal gate electrode being electrically insulated from the field implant diffusion and electrically connecting the first region to ground;

an electrode contacting the second region so as to electrically connect the second region and the n-well to the CMOS integrated circuit;

an n-channel MGFO device having a source region formed by the first region, a drain region formed by the n-well, and a gate formed by the metal gate electrode; and

an NPN device having an emitter region formed by the first region, a collector region formed by the n-well, and a base region formed by the substrate;

wherein the n-well and the substrate define a junction therebetween for the MGFO and NPN devices, and wherein the field implant diffusion and the n-well overlap at the junction so as to yield a breakdown voltage for the voltage clamp of at least 40 Vdc.

7. A voltage clamp as recited in claim 6 wherein the field implant diffusion and the n-well overlap at the junction by about 4.4 micrometers.

8. A voltage clamp as recited in claim 6 wherein the breakdown voltage of the voltage clamp is less than 62 Vdc.

9. A voltage clamp as recited in claim 6 wherein the voltage clamp withstands an electrostatic discharge pulse of at least 8000 Vdc.