Electron-beam generating device having plurality of cold cathode elements, method of driving said device and image forming apparatus applying same

• US 5,734,361 A
• Filed: 06/06/1995
• Issued: 03/31/1998
• Est. Priority Date: 06/08/1994
• Status: Expired due to Term

• Current Assignee: Canon Kabushiki Kaisha (Canon Inc.)
• Original Assignee: Canon Kabushiki Kaisha (Canon Inc.)
• Inventors: Suzuki, Hidetoshi, Asai, Akira, Yamano, Akihiko, Suzuki, Noritake
• Primary Examiner(s): Hjerpe, Richard
• Assistant Examiner(s): Mengistu, Amare
• Application Number:
  US08/469,680
• Time in Patent Office: 1,029 Days
• Field of Search: 313/306, 313/309, 313/310, 313/312, 313/496, 313/497, 313/514, 345/74, 345/75, 345/65, 345/66, 345/67, 315/169.1
• US Class Current: 345/74.1
• CPC Class Codes: G09G 2320/0209 Crosstalk reduction, i.e. to reduce direct or indirect influences of signals directed to a certain pixel of the displayed image on other pixels of said image, inclusive of influences affecting pixels in different frames or fields or sub-images which constitute a same image, e.g. left and right images of a stereoscopic display
• CPC Class Codes: G09G 2320/0223 Compensation for problems related to R-C delay and attenuation in electrodes of matrix panels, e.g. in gate electrodes or on-substrate video signal electrodes
• CPC Class Codes: G09G 3/22 using controlled light sources
• CPC Class Codes: H01J 2201/3165 Surface conduction emission type cathodes
• CPC Class Codes: H01J 31/127 using large area or array sources, i.e. essentially a source for each pixel group

Abstract

An electron-beam generating device and a method of driving same, in which a number of cold cathode elements are matrix-wired, is applied to an image forming apparatus. Statistical calculations are performed in advance with regard to a required electron-beam output, and loss produced in the matrix wiring is analyzed. Drive signals are corrected by deciding optimum correction values based upon the analytical results. As a result, when rows of the matrix are driven successively row by row, the intensity of the outputted electron beams can made accurate for any driving pattern.

Claims

1. An electron-beam generating device comprising:

a plurality of cold cathode elements arrayed in the form of rows and columns on a substrate;

m-number of row wires and n-number of column wires for wiring said plurality of cold cathode elements into a matrix; and

drive signal generating means for generating signals which drive said plurality of cold cathode elements, said drive signal generating means including;

statistic-quantity calculating means for performing a statistical calculation with regard to externally entered electron-beam demand values;

correction-value generating means for generating correction values on the basis of results of the calculation by said statistic-quantity calculating means;

combining means for combining the externally entered electron-beam demand values and the correction values; and

means for successively driving said matrix-wired cold cathode elements on the basis of an output value from said combining means.

2. The apparatus according to claim 1, wherein said statistic-quantity calculating means includes means for calculating a sum total of one row of electron-beam demand values with regard to the externally entered electron-beam demand values.

3. The apparatus according to claim 1, wherein said correction-value generating means includes means for calculating a current, which will flow into said row wires and column wires at the time of drive, on the basis of results of calculation by said statistic-quantity calculating means and output characteristics of said cold cathode elements, analyzing amount of electrical loss due to wiring resistance, deciding amount of correction for compensating for the loss and outputting the amount of correction.

4. The apparatus according to claim 1, wherein said correction-value generating means includes a look-up table which stores correction values predetermined with regard to all cases of results of calculation capable of being outputted by said statistic-quantity calculating means.

5. The apparatus according to claim 4, wherein the correction values stored in said look-up table in advance are correction quantities obtained by calculating a current, which will flow into said row wires and column wires at the time of drive, on the basis of output characteristics of said cold cathode elements with regard to all cases of results of calculation capable of being outputted by said statistic-quantity calculating means, analyzing beforehand amount of electrical loss due to wiring resistance, and determining the correction quantities in advance based upon results of the analysis.

6. The apparatus according to claim 1, wherein said correction-value generating means comprises means for outputting correction quantities V1-Vn calculated in accordance with the following equation:

##EQU4## where the parameters are as follows;

V1-Vn;

correction quantities for cold cathode elements of columns 1-n in j-th row;

I1-In;

current values, to be passed through column wires of columns 1-n, calculated based upon externally entered electron-beam demand values and electron emission characteristics of cold cathode elements;

Ra;

electrical resistance of extracted portion of row wiring;

I1+I2+. . . +In;

sum total of one row of externally entered electron-beam demand values, namely results of calculation by said statistic calculating means;

Rb;

electrical resistance of extracted portion of column wiring;

ry;

electrical resistance between cold cathode elements of column wiring;

rx;

electrical resistance between cold cathode elements of row wiring;

n;

total number of columns of matrix; and

j;

row number, with 1≦

j≦

m.

7. The apparatus according to claim 6, wherein said correction-value generating means includes a first-in last-out circuit and an adder circuit.

8. The apparatus according to claim 1, wherein said combining means adds or multiplies together the externally entered electron-beam demand values and correction values generated by said correction-value generating means.

9. The apparatus according to claim 1, wherein image information is used as the externally entered electron-beam demand values.

10. The apparatus according to claim 1, wherein said cold cathode elements are surface-conduction electron emission elements.

11. An image forming apparatus comprising:

an electron-beam generating device and an image forming member;

said electron-beam generating device including;

a plurality of cold cathode elements arrayed in the form of rows and columns on a substrate;

m-number of row wires and n-number of column wires for wiring said plurality of cold cathode elements into a matrix; and

drive signal generating means for generating signals which drive said plurality of cold cathode elements, with said drive signal generating means including;

statistic-quantity calculating means for performing a statistical calculation with regard to externally entered electron-beam demand values;

correction-value generating means for generating correction values on the basis of results of calculation by said statistic-quantity calculating means;

combining means for combining the externally entered electron-beam demand values and the correction values; and

means for successively driving said matrix-wired cold cathode elements on the basis of an output value from said combining means;

said image forming member forming an image by irradiation with an electron beam outputted by said electron-beam generating device.

12. The apparatus according to claim 11, wherein said statistic-quantity calculating means includes means for calculating a sum total of one row of electron-beam demand values with regard to the externally entered electron-beam demand values.

13. The apparatus according to claim 11, wherein said correction-value generating means includes means for calculating a current, which will flow into said row wires and column wires at the time of drive, on the basis of results of calculation by said statistic calculating means and output characteristic of said cold cathode elements, analyzing amount of electrical loss due to wiring resistance, deciding amount of correction for compensating for the loss and outputting the amount of correction.

14. The apparatus according to claim 11, wherein said correction-value generating means includes a look-up table which stores correction values predetermined with regard to all cases of results of calculation capable of being outputted by said statistic-quantity calculating means.

15. The apparatus according to claim 14, wherein the correction values stored in said look-up table in advance are correction quantities obtained by calculating a current, which will flow into the row wires and column wires at the time of drive, on the basis of output characteristics of said cold cathode elements with regard to all cases of results of calculation capable of being outputted by said statistic-quantity calculating means, analyzing beforehand amount of electrical loss due to wiring resistance, and determining the correction quantities in advance based upon results of the analysis.

16. The apparatus according to claim 11, wherein said correction-value generating means comprises means for outputting correction quantities V1-Vn calculated in accordance with the following equation:

##EQU5## where the parameters are as follows;

V1-Vn;

correction quantities for cold cathode elements of columns 1-n in j-th row;

I1-In;

current values, to be passed through column wires of columns 1-n, calculated based upon externally entered electron-beam demand values and electron emission characteristics of cold cathode elements;

Ra;

electrical resistance of extracted portion of row wiring;

I1+I2+. . . +In;

sum total of one row of externally entered electron-beam demand values, namely results of calculation by said statistic calculating means;

Rb;

electrical resistance of extracted portion of column wiring;

ry;

electrical resistance between cold cathode elements of column wiring;

rx;

electrical resistance between cold cathode elements of row wiring;

n;

total number of columns of matrix; and

j;

row number, with 1≦

j≦

m.

17. The apparatus according to claim 16, wherein said correction-value generating means includes a first-in last-out circuit and an adder circuit.

18. The apparatus according to claim 11, wherein said combining means adds or multiplies together the externally entered electron-beam demand values and correction values generated by said correction-value generating means.

19. The apparatus according to claim 11, wherein said cold cathode elements are surface-conduction electron emission elements.

20. The apparatus according to claim 11, wherein said image forming member is a phosphor.

21. A method of driving an electron-beam generating device having a plurality of cold cathode elements arrayed in the form of rows and columns on a substrate, and m-number of row wires and n-number of column wires for wiring the plurality of cold cathode elements into a matrix, said method comprising:

a drive signal generating step of generating signals which drive the plurality of cold cathode elements, with said drive signal generating step including the steps of;

performing a statistical-quantity calculation with regard to externally entered electron-beam demand values;

generating correction values on the basis of results of the calculation by the statistic-quantity calculating step;

combining the externally entered electron-beam demand values and the correction values; and

successively driving the matrix-wired cold cathode elements on the basis of an output value from the combining step.

22. The method according to claim 21, wherein the statistic-quantity calculating step includes a step of calculating a sum total of one row of electron-beam demand values with regard to the externally entered electron-beam demand values.

23. The method according to claim 21, wherein the correction-value generating step includes a step of calculating a current, which will flow into the row wires and column wires at the time of drive, on the basis of results of calculation by the statistic-quantity calculating step and output characteristic of the cold cathode elements, analyzing an amount of electrical loss due to wiring resistance, deciding an amount of correction for compensating for the loss and outputting the amount of correction.

24. The method according to claim 21, wherein said correction-value generating step makes use of a look-up table which stores correction values predetermined with regard to all cases of results of calculation capable of being outputted by the statistic-quantity calculating step.

25. The method according to claim 24, wherein the correction values stored in the look-up table in advance are correction quantities obtained by calculating a current, which will flow into the row wires and column wires at the time of drive, on the basis of output characteristics of the cold cathode elements with regard to all cases of results of calculation capable of being outputted by the statistic-quantity calculating step, analyzing beforehand amount of electrical loss due to wiring resistance, and determining the correction quantities in advance based upon results of the analysis.

26. The method according to claim 21, wherein the correction-value generating step comprises a step of outputting correction quantities V1-Vn calculated in accordance with the following equation:

##EQU6## where the parameters are as follows;

V1-Vn;

correction quantities for cold cathode elements of columns 1-n in j-th row;

I1-In;

current values, to be passed through column wires of columns 1-n, calculated based upon externally entered electron-beam demand values and electron emission characteristics of cold cathode elements;

Ra;

electrical resistance of extracted portion of row wiring;

I1+I2+. . . +In;

sum total of one row of externally entered electron-beam demand values, namely results of calculation by the statistic calculating means;

Rb;

electrical resistance of extracted portion of column wiring;

ry;

electrical resistance between cold cathode elements of column wiring;

rx;

electrical resistance between cold cathode elements of row wiring;

n;

total number of columns of matrix; and

j;

row number, with 1≦

j≦

m.

27. The method according to claim 21, wherein the combining step adds or multiplies together the externally entered electron-beam demand values and correction values generated by the correction-value generating step.

28. The method according to claim 21, wherein image information is used as the externally entered electron-beam demand values.

29. The method according to claim 21, wherein the cold cathode elements are surface-conduction electron emission elements.

30. An image forming method comprising:

a drive signal generating step of generating signals which drive a plurality of cold cathode elements, with the drive signal generating step including the steps of;

performing a statistical-quantity calculation with regard to the externally entered electron-beam demand values;

generating correction values on the basis of results of calculation by the statistic-quantity calculating step;

combining the externally entered electron-beam demand values and the correction values;

successively driving matrix-wired cold cathode elements on the basis of an output value from the combining step; and

forming an image by irradiation with an electron beam outputted by the cold cathode elements.

31. The method according to claim 30, wherein the statistic-quantity calculating step includes a step of calculating a sum total of one row of electron-beam demand values with regard to the externally entered electron-beam demand values.

32. The method according to claim 30, wherein the correction-value generating step includes a step of calculating a current, which will flow into the row wires and column wires at the time of drive, on the basis of results of calculation by the statistic calculating step and output characteristics of the cold cathode elements, analyzing amount of electrical loss due to wiring resistance, deciding amount of correction for compensating for the loss and outputting the amount of correction.

33. The method according to claim 30, wherein the correction-value generating step makes use of a look-up table which stores correction values predetermined with regard to all cases of results of calculation capable of being outputted by the statistic-quantity calculating step.

34. The method according to claim 33, wherein the correction values stored in the look-up table in advance are correction quantities obtained by calculating a current, which will flow into the row wires and column wires at the time of drive, on the basis of output characteristics of the cold cathode elements with regard to all cases of results of calculation capable of being outputted by the statistic-quantity calculating step, analyzing beforehand amount of electrical loss due to wiring resistance, and determining the correction quantities in advance based upon results of the analysis.

35. The method according to claim 30, wherein the correction-value generating step comprises a step of outputting correction quantities V1-Vn calculated in accordance with the following equation:

##EQU7## where the parameters are as follows;

V1-Vn;

correction quantities for cold cathode elements of columns 1-n in j-th row;

I1-In;

current values, to be passed through column wires of columns 1-n, calculated based upon externally entered electron-beam demand values and electron emission characteristics of cold cathode elements;

Ra;

electrical resistance of extracted portion of row wiring;

I1+I2+. . . +In;

sum total of one row of externally entered electron-beam demand values, namely results of calculation by the statistic calculating means);

Rb;

electrical resistance of extracted portion of column wiring;

ry;

electrical resistance between cold cathode elements of column wiring;

rx;

electrical resistance between cold cathode elements of row wiring;

n;

total number of columns of matrix; and

j;

row number, with 1≦

j≦

m.

36. The method according to claim 30, wherein the combining step adds or multiplies together the externally entered electron-beam demand values and correction values generated by the correction-value generating step.

37. The method according to claim 30, wherein image information is used as the externally entered electron-beam demand values.