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Ambiguity resolving algorithm for interferometers of arbitray topologies

  • US 5,742,252 A
  • Filed: 08/26/1996
  • Issued: 04/21/1998
  • Est. Priority Date: 08/26/1996
  • Status: Expired due to Term
First Claim
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1. A system for determining an angle of incidence for an incoming electromagnetic signal, the system comprising:

  • a plurality of interferometers for detecting the incoming electromagnetic signal, each interferometer measuring a phase based upon the incoming electromagnetic signal in accordance with the position of the interferometer relative the incoming electromagnetic energy, where each interferometer is separated by a distance defined as a linear baseline between the two; and

    a signal processor for computing the angle of the electromagnetic signal in accordance with the phases measured by the interferometers, the processor performing the steps of;

    (a) determining an initial phase estimate in accordance with two selected baselines in order to predict a phase measured for another of the plurality of baselines,(b) for the other baselines, predicting a phase for a next baseline in accordance with the phases measured for a previously selected baseline and measuring the phase of the next baseline to determine if the measured phase is within a predetermined range of the predicted phase, and(c) determining the angle of the incoming electromagnetic signal in accordance with the phases of the last baseline falling within the predetermined ranges of the predicted phases;

    wherein the phase measurements φ

    i for an ith baseline may be defined as follows;

    ##EQU7## dxi,dyi are the x and y components, respectively, of baseline i;

    ni is the phase noise with zero mean and variance σ

    n2 ;

    Az and El are the azimuth and elevation, respectively, defined with respect to the normal of the antenna plane; and

    λ

    is the wavelength of the incoming electromagnetic signal.

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