Method for repairing defective electrical connections on multi-layer thin film (MLTF) electronic packages
First Claim
1. A method for repairing interconnections of multi-layer thin film structures or making engineering changes to the structures which structures comprise a series of layers comprising a dielectric having plated metal thereon in the form of wiring and via interconnections to the next layer and a top layer of the structure which has interconnecting vias to the lower layers and corresponding chip connection pads comprising the steps of:
- building the multi-layer thin film structure layer by layer up to a layer adjacent to the top layer;
testing and/or inspecting the layer adjacent the top layer to determine interconnection faults in the multi-layer thin film structure;
forming the top layer comprising a dielectric and defining, vias, pads and via-pad connecting lines metallization;
depending on the defects determined in the multi-layer thin film structure obtained by testing the layer adjacent the top layer, defining the repair lines on the top surface needed to cure the defects and/or make engineering changes; and
forming the metallization and repair lines on the top surface to cure the defects and/or make engineering changes.
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Abstract
A multi-layer thin film structure having defined repair lines thereon and a method for repairing interconnections in the multi-layer thin film structure (MLTF) and/or making engineering charges (EC) are provided. The method comprises determining any interconnection defects in the MLTF at a thin film layer adjacent the top metal layer of the structure, using lithography, e.g., direct write expose technology, to define the top surface connections needed to repair the interconnections and/or make EC'"'"'s, and forming the top surface metallization and repair lines using additive or substractive metallization techniques.
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Citations
10 Claims
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1. A method for repairing interconnections of multi-layer thin film structures or making engineering changes to the structures which structures comprise a series of layers comprising a dielectric having plated metal thereon in the form of wiring and via interconnections to the next layer and a top layer of the structure which has interconnecting vias to the lower layers and corresponding chip connection pads comprising the steps of:
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building the multi-layer thin film structure layer by layer up to a layer adjacent to the top layer; testing and/or inspecting the layer adjacent the top layer to determine interconnection faults in the multi-layer thin film structure; forming the top layer comprising a dielectric and defining, vias, pads and via-pad connecting lines metallization; depending on the defects determined in the multi-layer thin film structure obtained by testing the layer adjacent the top layer, defining the repair lines on the top surface needed to cure the defects and/or make engineering changes; and forming the metallization and repair lines on the top surface to cure the defects and/or make engineering changes. - View Dependent Claims (2, 3, 4, 5)
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6. A method of forming a multi-layer thin film structure which comprises a series of layers comprising a dielectric having metal thereon in the form of wiring and via interconnections and a top surface layer of the structure which has vias, chip connection pads and via pad connection straps and defined metal repair lines thereon comprising the steps of:
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building a multi-layer thin film structure, having a top surface metal layer, layer by layer up to a layer adjacent to the top surface metal layer of the structure; electrically testing and/or inspecting the layer adjacent to the top surface metal layer and determining faulty interconnections; determining the best metal line routes to repair faulty interconnections and/or making engineering changes; building the top surface layer and defining the metal repair lines thereon; and forming vias, via connection straps, chip connection pads and metal repair and/or engineering change lines on the top surface layer. - View Dependent Claims (7, 8, 9, 10)
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Specification