Feedback loop for reading threshold voltage

• US 5,748,534 A
• Filed: 03/26/1996
• Issued: 05/05/1998
• Est. Priority Date: 03/26/1996
• Status: Expired due to Term

• Current Assignee: SanDisk Technologies LLC (Western Digital Corporation)
• Original Assignee: Invox Technology, Inc.
• Inventors: So, Hock C., Wong, Sau C., Dunlap, Frank M.
• Primary Examiner(s): Popek, Joseph A.
• Assistant Examiner(s): HO, HOAI V
• Application Number:
  US08/622,333
• Time in Patent Office: 770 Days
• Field of Search: 365/185.21, 365/207, 365/208, 327/51, 327/54
• US Class Current: 365/185.21
• CPC Class Codes: G11C 11/5642 Sensing or reading circuits; Data output circuits
• CPC Class Codes: G11C 16/28 using differential sensing or reference cells, e.g. dummy cells
• CPC Class Codes: G11C 16/34 Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
• CPC Class Codes: G11C 27/005 with non-volatile charge storage, e.g. on floating gate or MNOS

Abstract

To read the threshold voltage of a transistor such as a floating gate transistor in an analog or multi-level memory cell, the transistor is connected in a feedback loop which contains a differential amplifier having an output terminal and an input terminal respectively connected to the gate and a node (source or drain) of the transistor. A reference voltage is asserted to a second input terminal of the differential amplifier. A load provides a current which charges the node, and the differential amplifier adjusts the gate voltage of the memory cell to an equilibrium value where current through the transistor is equal to current through the reference cell. The equilibrium value of the gate voltage depends on and indicates the threshold voltage of the transistor. In one embodiment of the invention, the load is a current source which mirrors a current through a reference cell that is structurally identical to the transistor, and the drain of the reference cell provides the reference voltage to the amplifier.

Claims

1. A read circuit, comprising:

an amplifier;

means for connecting a node of a selected memory cell to an input terminal of the amplifier;

means for applying a current to the input terminal of the amplifier, the means for applying comprising;

a first transistor coupled between a supply voltage and the input terminal;

a second transistor having a gate and a drain coupled together and to the gate of the first transistor; and

a reference cell coupled in series with the second transistor between the supply voltage and ground; and

means for connecting an output terminal of the amplifier to a gate of the selected memory cell, wherein an output voltage of the amplifier, that is provided while the output terminal is connected to the gate and the input terminal is connected to the node, indicates a data value stored in the selected memory cell.

2. The read circuit of claim 1, wherein connecting the output terminal of the amplifier to the gate of the selected memory cell and connecting the node of the selected memory cell to the input terminal of the amplifier creates a feedback loop having negative feedback.

3. The read circuit of claim 1, wherein the amplifier comprises a differential amplifier having a second input terminal in addition to the first-mentioned input terminal, the second input terminal being coupled to a reference voltage.

4. The read circuit of claim 1, wherein the reference cell is structurally identical to the selected memory cell.

5. The read circuit of claim 1, wherein the node is a drain of a floating gate transistor in the selected memory cell.

6. The read circuit of claim 1, wherein the node is a drain of a metal nitride oxide transistor in the selected memory cell.

18. The read circuit of claim 1, wherein the data value read is an analog value represented by a threshold voltage of the selected memory cell.

19. The read circuit of claim 1, wherein the data value read is a multi-bit digital value represented by a threshold voltage of the selected memory cell.

7. A memory, comprising:

an amplifier;

a load coupled between an input terminal of the amplifier and a constant voltage terminal;

an array of memory cells;

a column decoder adapted to connect a node of a selected memory cell in the array to the input terminal of the amplifier; and

a row decoder adapted to connect an output terminal of the amplifier to a gate of the selected memory cell, wherein

an output voltage from the amplifier, provided while the output terminal is connected to the gate of the selected memory cell and the input terminal is connected to the node of the selected memory cell, indicates a data value stored in the selected memory cell.

8. The memory of claim 7, wherein the load comprises a current source coupled to an input terminal of the amplifier.

9. The memory of claim 7, wherein the load comprises a diode-connected device coupled to an input terminal of the amplifier.

10. The memory of claim 7, wherein the load comprises a resistor coupled to an input terminal of the amplifier.

11. The memory of claim 7, wherein the amplifier is a differential amplifier having a first input terminal and a second input terminal, wherein the first input terminal is the input terminal to which the load is coupled and a reference voltage is applied to the second input terminal.

12. The memory of claim 11, wherein the first input terminal is a positive input terminal, the second input terminal is a negative input terminal, and the column decoder connects a drain of the selected memory cell to the first input terminal.

13. A method for reading the threshold voltage of a transistor, comprising:

connecting a node of the transistor to a first input terminal of a differential amplifier;

connecting an output terminal of the differential amplifier to a gate of the transistor;

applying a reference voltage to a second input terminal of the differential amplifier;

applying a current to the node; and

determining the threshold voltage of the transistor from a voltage on gate of the transistor.

14. The method of claim 13, wherein determining the threshold voltage comprises waiting until a current through the transistor settles to an approximately constant level.

15. The method of claim 13, wherein applying the current comprises:

connecting the transistor to a current mirror so that current to the node of the transistor mirrors current through a reference cell which is substantially identical to the transistor; and

applying to a gate of the reference cell a voltage greater than a threshold voltage of the reference cell.

16. The method of claim 15, wherein applying the reference voltage comprises connecting a source or drain of the reference cell to the second input terminal of the differential amplifier.

17. The method of claim 13, wherein the first input terminal is a positive input terminal and the second input terminal is a negative input terminal.