Phase contrast microscope

• US 5,751,475 A
• Filed: 12/16/1994
• Issued: 05/12/1998
• Est. Priority Date: 12/17/1993
• Status: Expired due to Term

• Current Assignee: Olympus Optical Corporation Limited (Olympus Corporation)
• Original Assignee: Olympus Optical Corporation Limited (Olympus Corporation)
• Inventors: Ishiwata, Hiroshi, Nagano, Chikara
• Primary Examiner(s): NGUYEN, THONG Q
• Application Number:
  US08/357,317
• Time in Patent Office: 1,243 Days
• Field of Search: 359/368-371, 359/385-389, 359/36, 359/47, 359/48, 359/54, 359/55, 359/80, 359/84, 359/85, 359/87, 359/94, 359/96, 359/558-564
• US Class Current: 359/387
• CPC Class Codes: G02B 21/14 affording illumination for phase-contrast observation
• CPC Class Codes: G02B 27/52 Phase contrast optics in microscopes G02B21/14

Abstract

A phase contrast microscope including an illuminating optical system, a ring slit arranged at a pupil of the illuminating optical system, an imaging optical system, and a phase plate arranged at a pupil of the imaging optical system which is conjugate with the pupil of the illuminating optical system with respect to a specimen plane on which a specimen under inspection is placed. The phase plate is formed by a liquid crystal and a pair of transparent ring-shaped electrodes arranged on both sides of the liquid crystal. A voltage applied across the liquid crystal via the electrodes is changed such that a phase difference introduced by the phase plate is set to ±π/2 to obtain a dark contrast image and a bright contrast image. A difference between these dark and bright contrast images is derived to obtain a phase contrast image having high contrast and resolution.

Claims

1. A phase contrast microscope comprising:

an illumination optical system for illuminating a specimen under inspection;

an aperture arranged at a pupil of said illumination optical system;

an imaging optical system for forming an image of the specimen;

a phase plate arranged near a pupil of said imaging optical system, said pupil of the imaging optical system being arranged at a conjugate position with said aperture with respect to a specimen plane on which said specimen situates;

an image pick-up means provided at a imaging plane on which an image of the specimen is formed by said imaging optical system for picking-up the image to produce an image signal;

a storing means for storing said image signal produced by said image pick-up means; and

a signal processing means for processing the image signal read out of said storing means;

wherein said phase plate is constructed to give phase differences which have substantially a same amount but have opposite signs, two images at said different phase differences are separately picked-up by said image pick-up means and stored in said storing means, an image of a difference between said two images is derived as a phase contrast image, said phase plate comprises a liquid crystal and substantially transparent electrodes arranged on both sides of said liquid crystal, and a voltage applied to the liquid crystal via the electrodes is changed such that said phase differences having substantially the same amount but having said opposite signs are obtained.

2. A phase contrast microscope according to claim 1, wherein said voltage is set to such values that said phase differences are +π

/2 and -π

/2.

3. A phase contrast microscope according to claim 2, wherein at least one of said transparent electrodes of the phase plate is formed as a ring, and a ratio of a radius r of a center circle of the ring to a radius R of the pupil of the imaging optical system is set to 1>

r/R≧

0.5.

4. A phase contrast microscope according to claim 3, wherein both of said electrodes of the phase plate are formed as rings.

5. A phase contrast microscope according to claim 3, wherein one of said electrodes of the phase plate is formed as a ring and the other electrode is formed as a full face electrode.

6. A phase contrast microscope according to claim 1, further comprising at least one absorption film.

7. A phase contrast microscope according to claim 6, wherein said absorption film has an absorbance of about 10 to 15%.

8. A phase contrast microscope according to claim 1, wherein:

said two images at said different phase differences comprise a dark contrast image having an intensity distribution Ia and a bright contrast image having an intensity distribution Ib; and

said phase contrast image has an intensity distribution Ia-Ib.

9. A phase contrast microscope according to claim 8, wherein:

said dark contrast image is formed at a first phase difference +π

/2; and

said bright contrast image is formed at a second phase difference -π

/2.

10. A phase contrast microscope comprising:

an illumination optical system for illuminating a specimen under inspection;

an aperture arranged at a pupil of said illumination optical system;

an imaging optical system for forming an image of the specimen;

a phase plate arranged near a pupil of said imaging optical system, said pupil of the imaging optical system being arranged at a conjugate position with the aperture with respect to a specimen plane on which said specimen situates, said phase plate including an element which introduces an electrically variable phase difference between a zero order diffracted beam and higher order diffracted beams, and substantially transparent electrodes arranged on opposite sides of said element such that a voltage is applied across the element via the electrodes; and

a controlling means for adjusting a value of said voltage applied across said element to set said phase difference to such values that a dark contrast image, a bright contrast image and a high resolution image are selectively observed under a same condition.

11. A phase contrast microscope according to claim 10, wherein said element of the phase plate is formed by a liquid crystal and said controlling means is constructed to adjust the voltage applied across the liquid crystal such that said phase differences are set to ±

π

/2.

12. A phase contrast microscope according to claim 11, wherein said aperture is formed by a ring slit and at least one of said electrodes of the phase plate is formed as a ring.

13. A phase contrast microscope according to claim 12, wherein said controlling means is constructed to adjust the voltage applied across the liquid crystal such that said phase difference is set to π

/6 to observe said high resolution image.

14. A phase contrast microscope according to claim 10, wherein said phase plate further comprises at least one absorption film having a same shape of at least one electrode.

15. A phase contrast microscope according to claim 14, wherein said absorption film has an absorbance of about 10 to 15%.

16. A phase contrast microscope according to claim 10, wherein said controlling means adjusts said value of said voltage applied across said element to set said phase difference to at least three values.

17. A phase contrast microscope comprising:

an illumination optical system for illuminating a specimen under inspection, the specimen being disposed at a specimen plane;

an aperture arranged at a pupil of said illumination optical system;

an imaging optical system for forming an image of the specimen at an imaging plane;

a phase plate arranged near a pupil of said imaging optical system, said pupil of the imaging optical system being arranged at a conjugate position with said aperture with respect to the specimen plane;

an image pick-up means provided at the imaging plane for picking-up the image to produce an image signal;

a storing means for storing said image signal produced by said image pick-up means; and

a signal processing means for processing the image signal read out of said storing means;

wherein said phase plate is constructed to give phase differences which have substantially a same amount but have opposite signs, two images at said phase differences comprising a dark contrast image having an intensity distribution Ia and a bright contrast image having an intensity distribution Ib and are separately picked-up by said image pick-up means and stored in said storing means, and an image of a difference between said two images is derived as a phase contrast image having an intensity distribution Ia-Ib.

18. A phase contrast microscope according to claim 17, wherein:

the dark contrast image is formed at a first phase difference +π

/2; and

the bright contrast image is formed at a second phase difference -π

/2.

19. A phase contrast microscope comprising:

an illumination optical system for illuminating a specimen under inspection, the specimen being disposed at a specimen plane;

an aperture arranged at a pupil of said illumination optical system;

an imaging optical system for forming an image of the specimen at an imaging plane;

a phase plate arranged near a pupil of said imaging optical system, said pupil of the imaging optical system being arranged at a conjugate position with said aperture with respect to the specimen plane, said phase plate comprising a liquid crystal and substantially transparent electrodes arranged on both sides of the liquid crystal;

an image pick-up means provided at the imaging plane for picking-up the image to produce an image signal;

a storing means for storing said image signal produced by said image pick-up means; and

a signal processing means for processing the image signal read out of said storing means;

wherein said phase plate is constructed to give phase differences which have substantially a same amount but have opposite signs, two images at said different phase differences are separately picked-up by said image pick-up means and stored in said storing means, an image of a difference between said two images is derived as a phase contrast image, at least one of said transparent electrodes of the phase plate is formed as a ring and a ratio of a radius r of a center circle of the ring and a radius R of the pupil of the imaging optical system is set to 1>

r/R>

0.5.

20. A phase contrast microscope comprising:

an illumination optical system for illuminating a specimen under inspection, the specimen being disposed at a specimen plane;

an aperture arranged at a pupil of said illumination optical system;

an imaging optical system for forming an image of the specimen at an imaging plane;

a phase plate arranged near a pupil of said imaging optical system, said pupil of the imaging optical system being arranged at a conjugate position with said aperture with respect to the specimen plane;

an image pick-up means provided at the imaging plane for picking-up the image to produce an image signal;

a storing means for storing said image signal produced by said image pick-up means;

a signal processing means for processing the image signal read out of said storing means to produce a phase contrast image; and

a calculating means for effecting a deconvolution of the phase contrast image obtained by said signal processing means;

wherein said phase plate is constructed to give phase differences which have substantially a same amount but have opposite signs, two images at said different phase differences are separately picked-up by said image pick-up means and stored in said storing means, and an image of a difference between said two images is derived as said phase contrast image.

21. A phase contrast microscope according to claim 20, wherein said calculating means performs a Fourier transform for the phase contrast image derived by said signal processing means, divides a Fourier transformed value thereof by an optical transfer function to derive a quotients, and finally performs a Fourier transform for the quotients.