Apparatus for the simultaneous acquisition of high bandwidth information in very long arrays containing large numbers of sensor elements
First Claim
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1. Apparatus for the measurement of one or more physical parameters, which apparatus comprises:
- source means for providing a source of electromagnetic radiation;
sensing network means which comprises a plurality of sensing interferometer means each of which includes a wavelength filter means for selecting a band of wavelengths of electromagnetic radiation provided by the source means and is suitable for converting the magnitude of one or more physical parameters to a change in sensor optical path length delay;
a reference interferometer means for selecting a reference optical path delay;
modulation means which is for modulating one or more paths of the reference interferometer means to provide means for electronically processing a resulting interfered signal to high accuracy;
a wavelength selection means for simultaneously selecting the bands of wavelengths filtered by a plurality of the sensing interferometer means; and
detection means containing more than one detector for simultaneously converting the electromagnetic radiation selected by the wavelength selection means to a plurality of electrical signals; and
the apparatus being such that;
the optical path delay of the sensing interferometer means is greater than the coherence length of the source means, the coherence length of the electromagnetic radiation selected by each of the wavelength filter means, and the coherence length of the electromagnetic radiation selected by the wavelength selection means;
the reference optical path delay of the reference interferometer means is equal to the optical path delay of the respective sensing interferometer means to approximately within the coherence length of the electromagnetic radiation selected by the respective wavelength filter means in order to achieve coherent interference from the respective sensing interferometer means;
the source is sufficiently broadband that the spectrum illuminates more than one of the sensing interferometer means simultaneously;
the wavelength filter means in each sensing interferometer means being interrogated simultaneously are non-overlapping spectrally;
the returned light from the sensing interferometer means being illuminated are simultaneously modulated by the modulation means; and
the wavelength selection means directs the returned light from each sensor interferometer means being illuminated to a separate detector in the detection means in order that the apparatus may be used to provide simultaneous acquisition of high-bandwidth information from multiple sensing interferometer means.
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Abstract
Apparatus comprising a source (1) of electromagnetic radiation; a sensing network (5) which comprises a plurality of sensing interferometers (10) each of which includes a wavelength filter for selecting a band of wavelengths (11) of electromagnetic radiation provided by the source (1) and is suitable for converting the magnitude of one or more physical parameters to a change in a sensor optical path length delay; a reference interferometer (7) for selecting a reference optical path delay; a wavelength selection device (8) for selecting one or more of the band of wavelengths (11) filtered by one or more of the sensing interferometers (10); and a detector (9) for converting the electromagnetic radiation selected by the wavelength selection device (8) to an electrical signal.
86 Citations
9 Claims
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1. Apparatus for the measurement of one or more physical parameters, which apparatus comprises:
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source means for providing a source of electromagnetic radiation; sensing network means which comprises a plurality of sensing interferometer means each of which includes a wavelength filter means for selecting a band of wavelengths of electromagnetic radiation provided by the source means and is suitable for converting the magnitude of one or more physical parameters to a change in sensor optical path length delay; a reference interferometer means for selecting a reference optical path delay; modulation means which is for modulating one or more paths of the reference interferometer means to provide means for electronically processing a resulting interfered signal to high accuracy; a wavelength selection means for simultaneously selecting the bands of wavelengths filtered by a plurality of the sensing interferometer means; and detection means containing more than one detector for simultaneously converting the electromagnetic radiation selected by the wavelength selection means to a plurality of electrical signals; and the apparatus being such that; the optical path delay of the sensing interferometer means is greater than the coherence length of the source means, the coherence length of the electromagnetic radiation selected by each of the wavelength filter means, and the coherence length of the electromagnetic radiation selected by the wavelength selection means; the reference optical path delay of the reference interferometer means is equal to the optical path delay of the respective sensing interferometer means to approximately within the coherence length of the electromagnetic radiation selected by the respective wavelength filter means in order to achieve coherent interference from the respective sensing interferometer means; the source is sufficiently broadband that the spectrum illuminates more than one of the sensing interferometer means simultaneously; the wavelength filter means in each sensing interferometer means being interrogated simultaneously are non-overlapping spectrally; the returned light from the sensing interferometer means being illuminated are simultaneously modulated by the modulation means; and the wavelength selection means directs the returned light from each sensor interferometer means being illuminated to a separate detector in the detection means in order that the apparatus may be used to provide simultaneous acquisition of high-bandwidth information from multiple sensing interferometer means. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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Current AssigneeSensor Dynamics Ltd. (Schlumberger NV)
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Original AssigneeSensor Dynamics Ltd. (Schlumberger NV)
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InventorsFarhadiroushan, Mahmoud
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Primary Examiner(s)Font, Frank G.
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Assistant Examiner(s)KIM, ROBERT H
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Application NumberUS08/779,216Time in Patent Office498 DaysField of Search356/345, 356/352, 356/35.5US Class Current356/478CPC Class CodesG01D 5/35383 using multiple sensor devic...
