Method and apparatus for diagnosing and isolating faulty sensors in a redundant sensor system

• US 5,754,963 A
• Filed: 07/30/1996
• Issued: 05/19/1998
• Est. Priority Date: 07/30/1996
• Status: Expired due to Fees

• Current Assignee: Hitachi Automotive Products (USA) Incorporated (Hitachi, Ltd.)
• Original Assignee: Hitachi America Limited (Hitachi, Ltd.)
• Inventors: Sugawara, Hayato, Nunneley, John
• Primary Examiner(s): Chin, Gary
• Application Number:
  US08/688,306
• Time in Patent Office: 658 Days
• Field of Search: 701/29, 701/34, 701/35, 701/63, 701/76, 701/92, 701/107, 340/438, 340/650, 340/651, 340/653, 340/428, 340/514, 340/517, 324/537, 324/555, 324/556, 324/677-679
• US Class Current: 701/34
• CPC Class Codes: G01D 3/08 with provision for safeguarding the apparatus, e.g. against abnormal operation, against breakdown
• CPC Class Codes: G01R 31/2829 Testing of circuits in sensor or actuator systems testing of apparatus for measuring electric or magnetic variables G01R35/00; testing of indicating or recording apparatus G01D; in airbag systems B60R21/0173; checking gas analysers G01N33/007; monitoring or fail-safe circuits for electromagnets H01F7/1844

Abstract

A sensor failure and detection apparatus and method for use in a redundant sensor system are disclosed. A control circuit disconnects reference power supplied to a sensor and then monitors the voltage decay output by the sensor. The monitored rate of voltage decay of the sensor is compared to the expected natural voltage decay of the sensor to detect failures caused by short or open circuits. An error counter keeps track of the number of failures. After a threshold number of times in which the monitored voltage decay does not compare to a predicted rate of decay, power to the sensor is removed and the sensor is isolated from the system.

Claims

1. A sensor diagnostic apparatus for detecting faults, said sensor diagnostic apparatus coupled to a voltage source and comprising:

a sensor means coupled to the voltage source and having an output signal proportional to a variable monitored by said sensor means;

a switching means having an off position and an on position, said switching means coupled between the voltage source and said sensor for providing a reference voltage to said sensor when said switching means is in an on position; and

a control means coupled to said switching means and to said sensor means for selectively turning said switching means to an off state to disconnect the reference voltage from said sensor means, and for monitoring the rate of voltage decay at the output signal of said sensor means and comparing the monitored rate of voltage decay to a preset rate of voltage decay to produce an error indication when the monitored rate of voltage decay does not match the preset rate of voltage decay.

2. A sensor diagnostic apparatus according to claim 1 wherein said switching means is a solid state transistor having its base coupled to said control means.

3. A sensor diagnostic apparatus according to claim 1 further comprising a counter coupled to said control means for recording the number of instances when the monitored rate of voltage decay does not match the preset rate of voltage decay.

4. A sensor diagnostic apparatus according to claim 1 wherein said control means further comprises at least one buffer for recording the number of instances when the monitored rate of voltage decay either matches or does not match the preset rate of voltage decay.

5. A sensor diagnostic apparatus according to claim 1 further comprising a plurality of sensor means and a plurality of switching means, wherein each of said sensor means is coupled to one of said switching means such that said reference voltage is provided to each of said sensor means through a separately controlled switching means.

6. A sensor diagnostic apparatus according to claim 1 further comprising a multiplexer coupled between the plurality of said sensor means and said switching means, and said control means for multiplexing the operation of said plurality of switching means and the output signals of said plurality of sensor means, with said control means.

7. A sensor diagnostic apparatus according to claim 1 wherein said control means is a microprocessor.

8. A method of diagnosing a faulty sensor, said sensor having an output signal and being coupled to a reference voltage through a switch, said switch being responsive to a control circuit, said control circuit further coupled to the output signal of said sensor, wherein said method comprises the steps of:

disconnecting the reference voltage to said sensor by turning said switch to an open position;

monitoring the rate of voltage decay in the output signal of said sensor;

comparing the monitored rate of voltage decay to an expected rate of voltage decay; and

indicating a fault condition for said sensor when the monitored rate of voltage decay does not match the expected rate of voltage decay.

9. A method of diagnosing a faulty sensor, according to claim 8, further comprising the step of recording in a counter each instance in which a fault is indicated for the sensor.

10. A method of diagnosing a faulty sensor, according to claim 9, further comprising the step of restoring power to said sensor by turning said switch to a closed position if the number or percentage of faults attributed to said sensor is below a threshold value.

11. A method of diagnosing faulty sensors, according to claim 8, further comprising the step of multiplexing both the control of a plurality of switches and the monitoring of the output signals of a plurality of sensors, to said control circuit so that said sensors are diagnosed at different times.

12. A method of diagnosing faulty sensors, according to claim 11, wherein at least two of said sensors are not being diagnosed and are at a steady state condition at all times.