Method and arrangement for configuring electronic device for multiple testing formats

• US 5,757,680 A
• Filed: 10/11/1996
• Issued: 05/26/1998
• Est. Priority Date: 10/11/1996
• Status: Expired due to Term

• Current Assignee: Avaya Incorporated
• Original Assignee: Lucent Technologies, Inc. (Nokia Corporation)
• Inventors: Fishman, David A., Kiley, David A., McGuire, Daniel James, Boston, Ronald E.
• Primary Examiner(s): Trammell, James P.
• Assistant Examiner(s): SHAH, KAMINI S
• Application Number:
  US08/729,479
• Time in Patent Office: 592 Days
• Field of Search: 364/579, 364/705.05, 379/21, 379/29, 379/27, 455/550, 455/557, 455/37.1, 455/33.2, 340/825.07, 340/825.44
• US Class Current: 702/121
• CPC Class Codes: H04M 3/24 with provision for checking the normal operation

Abstract

Disclosed is an electronic device that can communicate with a plurality of testing devices that utilize a plurality of communication formats. To accommodate the plurality of testing devices, the electronic device can be configured to communicate with external test equipment using multiple communication path configurations and multiple message protocols. An exemplary method of the present invention is a method of configuring an electronic device for communicating with either of a first or second testing device. The first and second testing devices use, respectively, first and second physical communication path configurations and first and second message protocols. As an initial matter, the method of the present invention includes identifying a presently-used testing device, the presently-used testing device comprising one of the first and second testing devices. Once the presently-used testing device is identified, the electronic device self-configures to a select physical communication path configuration, the select communication path configuration comprising that of the first and second communication path configurations which corresponds to the presently-used testing device. Next, the electronic device receives a message from the presently-used testing device, the message containing information relating to a testing routine to be performed. Once the message is received, the message protocol corresponding to the presently-used testing device is employed to obtain the information relating to the test routine to be performed. Finally, the test routine identified in obtained information is performed.

Claims

1. A method of configuring an electronic device for communicating with either one of at least a first and second testing device, the first and second testing devices using, respectively, first and second communication path configurations, the first and second testing devices further using, respectively, first and second protocols, the method comprising:

a) determining a presently-used testing device, the presently-used testing device comprising one of the first and second testing devices;

b) enabling the electronic device to communicate using a select communication path configuration, the select communication path configuration comprising that of the first and second communication path configurations which is used by the presently-used testing device;

c) receiving a message from the presently-used testing device, the message having a format defined by that of the first and second protocols which is used by the presently-used testing device, the message containing information relating to a test routine to be performed;

d) obtaining the information relating to the test routine to be performed from the message; and

e) performing the test routine.

2. The method of claim 1 wherein step d) further comprises:

first translating the received message into a format defined by the first protocol if the received message is in a format defined by the second protocol; and

interpreting the received message using the first protocol.

3. The method of claim 2 wherein step d) further comprises obtaining a test routine identifier and one or more test routine parameters from the received message.

4. The method of claim 1 wherein the first communication path configuration is a full duplex communication path configuration and the second communication path configuration is a half-duplex communication path configuration and the electronic device includes a transmit line and a receive line, and step b) further comprises interconnecting the transmit line and receive line if the select communication path configuration is the second communication path configuration.

5. The method of claim 1 wherein the first and second testing devices use, respectively, first and second communication port configurations, and wherein the method further comprises the step of configuring a communication port within the electronic device to that of the first and second communication port configurations which is used by the presently-used testing device.

6. The method of claim 1 further comprising the steps of:

f) obtaining test data for use in an outgoing message;

g) generating an outgoing message having the format defined by that of the first and second protocols which is used in the presently-used testing device, the outgoing message including the test data; and

h) providing the outgoing message to the presently-used testing device.

7. A test interface for use in an electronic apparatus, the test interface operable to perform test routines, the testing arrangement comprising:

a) a connector for connecting to one of a plurality of testing devices, said connector including a first connecting point and a second connecting point;

b) a communications port operable to receive and transmit test signals and generate test messages therefrom;

c) a first signal line connected to the communications port and further connected to the first connecting point;

d) a second signal line connected to the communications port;

e) means for connecting the second signal line to the second connecting point if a testing device being used communicates using a full duplex signal path and for connecting the second signal line to the first connecting point if the testing device being used communicates using a half-duplex signal path; and

f) a processor connected to the communications port, said processor operable to;

receive test messages in at least two protocols, each of said test messages containing information relating to a test routine to be performed;

identify the test routine to be performed, and

perform the test routine to be performed.

8. The test interface of claim 7 wherein the means for connecting the second signal line to the second connecting point includes a first switch and the means for connecting the second signal to the first connecting point includes a second switch.

9. The test interface of claim 7 wherein the processor and the communications port are integrated onto a single semiconductor substrate.

13. The test interface of claim 8 wherein said means for selectively enabling one of the first and second communication path configurations is operably connected to the processor, and wherein the processor is further operable to control the operation of the means for selectively enabling one of the first and second communication path configurations.

10. A test interface for use in an electronic apparatus, the test interface operable to perform test routines, the test interface comprising:

a) a connection means for connecting to one of the plurality of testing devices;

b) a communication port operable to receive and transmit test message signals and generate test messages therefrom;

c) a first communication path configuration connecting the communication port to the connection means;

d) a second communication path configuration connecting the communication port to the connection means;

e) means for selectively enabling one of the first and second communication path configurations; and

f) a processor connected to the communications port, said processor operable to;

receive test messages in at least two protocols, each of said test messages containing information relating to a test routine to be performed;

identify the test routine to be performed, and

perform the test routine to be performed.

11. The test interface of claim 10 wherein the communication port and the processor are integrated onto a single semiconductor substrate.

12. The test interface of claim 10 wherein the first communication path configuration further comprises a half-duplex communication path configuration and the second communication path configuration comprises a full duplex communication path configuration.

14. The test interface of claim 10 further comprising a memory operably coupled to the processor, said memory storing program instructions executable by the processor.

15. The test interface of claim 14 wherein said memory stores program instructions executable by said processor to cause the processor to:

interpret messages having a first message protocol format to identify the test routine to be performed from a received test message; and

interpret messages having a second message protocol format by first converting the messages into messages having the first message protocol format in order to identify the test routine to be performed from a received test message.

16. The test interface of claim 10 further comprising a memory operable coupled to the processor, said memory storing data comprising:

a first message protocol routine executable by the processor to identify the test routine to be performed from a received test message;

a second message protocol routine executable by the processor to identify the test routine to be performed from a received test message; and

a test operations set executable by the processor to perform the test routine to be performed.

17. The test interface of claim 10 wherein the first communication path configuration and the second communication path configuration each include one or more signal paths and at least one switch.

18. The test interface of claim 17 wherein the first communication path configuration and the second communication path configuration both include at least one common signal path.

19. The test interface of claim 17 wherein the means for selectively enabling on the first and second communication path configuration includes a control line coupled to the processor and coupled the at least one switch, and wherein the processor provides a control signal to the control line that controls the operation of the at least one switch to selectively enable one of the first and second communication path configurations.

20. The test interface of claim 17 wherein said one or more switches comprise one or more integrated circuit buffers.

21. An electronic device for performing an application function, adapted to communicate with either one of a first and a second testing device, the first and the second testing devices using, respectively, a first and a second communication path configuration, the first and the second testing devices further using, respectively, a first and a second protocol, the electronic device comprising:

application means for performing an application function;

a configurable interface for connecting the electronic device to either one of the first and the second testing devices;

means for identifying which one of the first and the second testing devices is a presently-used testing device;

means responsive to an identification of the presently-used testing device, for configuring the configurable interface to enable the one of the first and the second path configurations which is used by the presently-used testing device;

means responsive to receipt of a message from the presently-used testing device through the configurable interface, the message containing information relating to a test to be performed on the application means, said means for interpreting the message according to the one of the first and the second protocols which is used by the presently-used testing device to obtain the contained information; and

means responsive to the interpretation of the message for using the obtained information to perform the test on the application means.

22. The electronic device of claim 21 wherein the application means comprises a wireless telephone.

23. An interface for use in testing an electronic apparatus, the interface adapted to communicate with either one of at least a first and a second testing device, the first and the second testing devices using, respectively, a first and a second communication path configuration, the first and the second testing devices further using, respectively, a first and a second protocol, the interface comprising:

means for connecting the electronic device to either one of the first and the second testing devices;

means for identifying which one of the first and the second testing devices is a presently-used testing device;

means responsive to the identification of the presently-used testing device for enabling the one of the first and the second communication path configurations which is used by the presently-used testing device;

means responsive to receipt of a message through the enabled one of the first and second communication path configurations, the message received from the presently-used testing device and containing information relating to a test to be performed on the application means, said means for causing the message to be interpreted according to the one of the first and the second protocol which is used by the presently-used testing device to obtain the contained information; and

means responsive to the interpretation of the message for causing the test to be performed on the electronic apparatus using the obtained information.