Testing series passive components without contacting the driven node

• US 5,760,596 A
• Filed: 03/03/1997
• Issued: 06/02/1998
• Est. Priority Date: 06/07/1995
• Status: Expired due to Fees

• Current Assignee: Agilent Technologies, Inc.
• Original Assignee: Hewlett-Packard Company (HP Inc.)
• Inventors: Peiffer, Ronald J., Parker, Kenneth P.
• Primary Examiner(s): Karlsen, Ernest F.
• Assistant Examiner(s): Solis, Jose M.
• Application Number:
  US08/810,202
• Time in Patent Office: 456 Days
• Field of Search: 324/430, 324/715, 324/754, 324/756, 324/771, 324/755
• US Class Current: 324/715
• CPC Class Codes: G01R 31/50 Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections testing of sparking plugs H01T13/58

Abstract

A method of testing series passive components in electronic assemblies. Only one test pin per passive component is required, thereby reducing the cost and complexity of test fixtures and the electronic assemblies. A passive component is connected between the output of a driving circuit and (optionally) an input of a receiving circuit. The output of the driving circuit is placed in a low impedance state. The receiving end of the passive component is stimulated and the response is measured. For reactive components, the stimulus and response are AC. For resistors, multiple DC measurements may be made. A optional DC bias may be provided to limit DC current and to further reduce the small signal output impedance of the driving circuit.

Claims

1. A method of testing a passive component, the passive component having first and second terminals, the first terminal of the passive component connected to an output of a circuit, the circuit having an output that is capable of being placed in multiple states and having an output impedance that is greater than zero, the method comprising the following steps:

(a) applying power to the circuit;

(b) placing the output impedance of the circuit in a low impedance state;

(c) driving the second terminal of the passive component with an AC electrical stimulus of a known value;

(d) measuring an AC electrical response at the second terminal of the passive component; and

(e) computing the approximate impedance of the passive component using the known value of the AC electrical stimulus and the AC electrical response.

3. The method of claim 1, step (b) further comprising:

placing the output impedance of the circuit in a known low impedance state.

4. The method of claim 3, step (c) further comprising:

driving the second terminal of the passive component with a DC stimulus sufficient to generate DC current flow through the output of the circuit.

5. The method of claim 1, the AC stimulus of step (c) being a voltage source.

6. The method of claim 1, the AC stimulus of step (c) being a current source.

2. A method of testing a resistor, the resistor having first and second terminals, the first terminal connected to an output of a circuit, the circuit having an output that is capable of being placed in multiple states and having an impedance that is greater than zero, the method comprising the following steps:

(a) applying power to the circuit;

(b) placing the output impedance of the circuit in a low impedance state;

(c) driving the second terminal of the resistor with a DC electrical stimulus of a known first value;

(d) measuring a first DC electrical response at the second terminal of the resistor;

(e) driving the second terminal of the resistor with a DC electrical stimulus of a known second value;

(f) measuring a second DC electrical response at the second terminal of the resistor; and

(g) computing the approximate impedance of the resistor using the known first and second values of the DC electric stimuli and the first and second measured DC electric responses.

7. The method of claim 2, step (b) further comprising:

placing the output impedance of the circuit in a known low impedance state.