Method and apparatus for optically measuring specimen

• US 5,760,900 A
• Filed: 01/26/1993
• Issued: 06/02/1998
• Est. Priority Date: 03/18/1989
• Status: Expired due to Fees

• Current Assignee: Canon Kabushiki Kaisha (Canon Inc.)
• Original Assignee: Canon Kabushiki Kaisha (Canon Inc.)
• Inventors: Ito, Yuji, Saito, Atsushi, Toge, Yoshiyuki, Yamazaki, Tatsuya, Miyamoto, Moritoshi
• Primary Examiner(s): Pham, Hoa Q.
• Application Number:
  US08/008,993
• Time in Patent Office: 1,953 Days
• Field of Search: 356/335-343, 356/349, 356/39, 356/73, 356/442, 356/318, 356/72, 356/317, 250/573-575, 250/461.2, 307/427, 435/7.2, 435/808, 435/968, 436/528, 436/531, 436/533, 436/537, 436/548, 436/172
• US Class Current: 356/338
• CPC Class Codes: G01N 15/1434 Optical arrangements
• CPC Class Codes: G01N 15/1459 the analysis being performed on a sample stream
• CPC Class Codes: G01N 2015/1477 Multiparameters
• CPC Class Codes: Y10S 435/808 Optical sensing apparatus

Abstract

A specimen measurement apparatus and method includes sequentially moving individual specimens, radiating first and second radiation beams on first and second positions spaced apart from each other in a moving direction of the specimens, time-serially detecting light components emerging from specimens passing the first and second positions using the same light detector, and an optical selector, arranged in an optical path between the radiation positions and a light detector, for, when a specimen passes the first position, selectively guiding a light component having a first optical characteristic emerging from the specimen to the light detector, and for, when the specimen passes the second position, selectively guiding a light component having a second optical characteristic emerging from the specimen to the light detector.

Claims

1. A specimen measurement apparatus comprising:

a flow path through which specimens individually pass;

irradiation means for irradiating first and second radiation beams on first and second positions along the flow path spaced apart from each other in a moving direction of the specimens;

a light detector for time-serially detecting light components emerging from specimens passing the first and second positions;

a first aperture arranged at a position conjugate with the first position to define a first optical path extending from the first position to said light detector;

a second aperture arranged at a position conjugate with the second position to define a second optical path extending from the second position to said light detector, which is different from the first optical path;

a first optical filtering member arranged in said first optical path for filtering the light component having the first optical characteristic; and

a second optical filtering member, arranged in said second optical path for filtering the light component having the second optical characteristic,

wherein the light detector is arranged at a position conjugate with the first and second apertures.

2. An apparatus according to claim 1, wherein said irradiation means comprises a first light source for generating the first radiation beam, and a second light source for generating the second radiation beam.

3. An apparatus according to claim 1, wherein said irradiation means comprises means for splitting a radiation beam from one light source into two light beams to generated the first and second radiation beams.

4. An apparatus according to claim 1, wherein said irradiation means comprises a laser light source.

5. An apparatus according to claim 1, wherein the first and second radiation beams have different wavelengths.

6. An apparatus according to claim 1, wherein the optical characteristic is a wavelength of light.

7. An apparatus according to claim 1, wherein the specimen has a cell.

8. An apparatus according to claim 1, wherein the specimen has a carrier particle.

9. An apparatus according to claim 1, further comprising storage means for storing a value detected by said light detector as measurement data.

10. An apparatus according to claim 9, further comprising analysis means for analyzing the specimens on the basis of the data stored in said storage means.

11. An apparatus according to claim 10, further comprising output means for outputting an analysis result of said analysis means.

12. An apparatus according to claim 1, further comprising means for forming a sheath flow to sequentially allow individual specimens to pass therethrough.

13. An apparatus according to claim 1 further comprising

determination means for determining that a plurality of specimens pass first and second positions at substantially the same time;

and

means for cancelling detection by said light detection means on the basis of a determination result of said determination means.

14. An apparatus according to claim 13, wherein said determination means comprises:

means for independently detecting a timing at which the specimen passes the first position, and a timing at which the specimen passes the second position, and comparing the two timings.

15. An apparatus according to claim 13, wherein said determination means comprises:

means for detecting a timing at which the specimen passes the first position; and

means for detecting whether or not another specimen passes the first position with a predetermined period from the detected timing.

16. An apparatus according to claim 1, further comprising:

setting means for setting a measurement mode;

first radiation means for generating a first radiation beam, and radiating the beam at a first position where the specimen passes;

second radiation means for generating a second radiation beam, and radiating the beam at a second position different form the first position;

light detection means for time-serially detecting light components having first and second optical characteristics different from each other and emerging from the specimens passing the first and second positions using the same light; and

control means for controlling a presence/absence of operations of said first and second radiation means in accordance with the set measurement mode.

17. An apparatus according to claim 16, wherein said control means switches between a mode for operating one of said first and second radiation means, and inactivating the other radiation means, and a mode for operating both said first and second radiation means in accordance with the measurement mode set by said setting means.

18. An apparatus according to claim 17, wherein said first and second radiation means comprise laser light sources, and when the radiation means is inactivated, said laser light source is set in a sleep mode or a power source of said light source is cut off.

19. A specimen measurement method comprising:

a step of time-serially irradiating first and second radiation beams onto individual specimens;

a first detection step of selecting a light component having a first optical characteristic of light components emerging from a specimen when the first radiation beam is irradiated, and causing a light detector to detect the selected light component;

a second detection step of selecting a light component having a second optical characteristic of light components emerging from the specimen when the second radiation beam is irradiated, and causing the same light detector to detect the selected light component; and

a step of changing a detection sensitivity of said light detector in synchronization with the irradiation of the first and second radiation beams.

20. A method according to claim 19, further comprising:

the step of determining that a plurality of specimens pass the first and second positions at substantially the same time; and

the step of cancelling detection by said light detector on the basis of a determination result.

21. A method according to claim 19, further comprising the step of performing a pre-treatment of specimens in advance.

22. A method according to claim 19, further comprising the step of analyzing the specimen on the basis of a value detected by said light detector.

23. A method according to claim 19, wherein the radiation beam is a laser beam.

24. An apparatus for inspecting particles comprising:

a flow path through which the particles individually pass;

a light source for generating a light beam;

a deflector for deflecting said light beam along a direction of said flow path;

a controller for controlling the deflector to switch a deflection angle of said light beam, stepwise in synchronization with passing of the particle; and

a detector for detecting light from the particle which is irradiated with said light beam.

25. An apparatus according to claim 24, wherein the controller controls the deflector so as to switch step-by-step a position where the light beam is irradiated.

26. An apparatus according to claim 25 wherein said position is switched in advance of passing of the articles.

27. An apparatus according to claim 24, wherein said deflector comprises an acousto-optical deflecting device.

28. An apparatus according to claim 24, wherein said detector detects scattered light and/or fluorescent light from said particle.

29. An apparatus according to claim 24, wherein said particles flow through a flow cell.

30. An apparatus according to claim 24, wherein said particles are cells.