Method and apparatus for modeling capacitance in an integrated circuit
First Claim
1. A computer apparatus comprising:
- (a) a central processing unit;
(b) a memory, said memory accessible by said central processing unit, said memory containing an executable program;
wherein said program comprises;
i) a shape file input mechanism, wherein said input mechanism is adapted for inputting a shape file containing layout shapes of a semiconductor device, said layout shapes partitioned into a plurality of tiles;
ii) a decomposer, wherein said decomposer is adapted for decomposing said tiles of said shapes into a plurality of parasitic capacitance components, said plurality of parasitic capacitance components including fringe capacitance components having substantially uniform parasitic capacitance with regard to fringe capacitance and overlap capacitance components having substantially uniform parasitic capacitance with regard to overlap capacitance; and
iii) a parasitic capacitance calculator, wherein said parasitic capacitance calculator is adapted for computing parasitic capacitance of each of said plurality of tiles, said parasitic capacitance computation including calculation of the capacitance of each of said plurality of parasitic capacitance components.
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Abstract
According to the present embodiment, a method for calculating the parasitic capacitance in a semiconductor device is disclosed. According to the preferred method, a layout file containing the shapes of a semiconductor device is provided. The dimensions of the layout file are then adjusted to wafer dimensions so as reflect actual production devices. The shapes of the layout file are then partitioned into simpler shapes, typically abutted rectangles, called tiles. Each tile is then decomposed into overlap and fringe capacitance components, each component having a uniform capacitance environment with respect to its capacitance elements. The parasitic capacitance of the semiconductor device can thus be accurately computed, with an efficient use of resources. Additionally the preferred embodiment is easily adaptable to a wide range of technology types.
75 Citations
41 Claims
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1. A computer apparatus comprising:
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(a) a central processing unit; (b) a memory, said memory accessible by said central processing unit, said memory containing an executable program;
wherein said program comprises;i) a shape file input mechanism, wherein said input mechanism is adapted for inputting a shape file containing layout shapes of a semiconductor device, said layout shapes partitioned into a plurality of tiles; ii) a decomposer, wherein said decomposer is adapted for decomposing said tiles of said shapes into a plurality of parasitic capacitance components, said plurality of parasitic capacitance components including fringe capacitance components having substantially uniform parasitic capacitance with regard to fringe capacitance and overlap capacitance components having substantially uniform parasitic capacitance with regard to overlap capacitance; and iii) a parasitic capacitance calculator, wherein said parasitic capacitance calculator is adapted for computing parasitic capacitance of each of said plurality of tiles, said parasitic capacitance computation including calculation of the capacitance of each of said plurality of parasitic capacitance components. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A computer apparatus for calculating a parasitic capacitance of a semiconductor device comprising:
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(a) a central processing unit; (b) a memory, said memory accessible by said central processing unit, said memory containing an executable program;
wherein said program includes;i) a layout file input mechanism, wherein said layout file input mechanism is adapted for inputting a layout file, said layout file containing shapes of a semiconductor device; ii) a technology file input mechanism, wherein said technology file input mechanism is adapted for a inputting a technology file, said technology file adapted for adjusting dimensions of said shapes of said semiconductor device in said layout file to wafer dimensions; iii) a partitioner, wherein said partitioner is adapted for partitioning said shapes of said semiconductor device into a plurality of tiles, said tiles each including a portion of a semiconductor shape; iv) a decomposer, wherein said decomposer is adapted for decomposing said plurality of tiles of each of said plurality of shapes into a plurality of parasitic capacitance components, said plurality of parasitic capacitance components including overlap capacitance components having substantially uniform parasitic capacitance with regard to overlap capacitance and fringe capacitance components having substantially uniform parasitic capacitance with regard to fringe capacitance; and v) a parasitic capacitance calculator, wherein said parasitic capacitance calculator is adapted for computing capacitance of said semiconductor device by computing said plurality of parasitic capacitance components. - View Dependent Claims (12, 13, 14, 15, 16, 17)
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18. A program product comprising:
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a) a recordable media; and b) a program recorded on said recordable media, the program used to calculate the parasitic capacitance of a semiconductor device, the program including; i) a shape file input mechanism, wherein said input mechanism is adapted for inputting a shape file containing layout shapes of a semiconductor device, said layout shapes partitioned into a plurality of tiles; ii) a decomposer, wherein said decomposer is adapted for decomposing said tiles of said shapes into a plurality of parasitic capacitance components, said plurality of parasitic capacitance components including fringe capacitance components having substantially uniform parasitic capacitance with regard to fringe capacitance and overlap capacitance components having substantially uniform parasitic capacitance with regard to overlap capacitance; and iii) a parasitic capacitance calculator, wherein said parasitic capacitance calculator is adapted for computing parasitic capacitance of each of said plurality of tiles, said parasitic capacitance computation including calculation of the capacitance of each of said plurality of parasitic capacitance components. - View Dependent Claims (19, 20, 21, 22)
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23. A method for calculating parasitic capacitance in semiconductor circuit design, comprising the steps of:
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a) inputting a shape file, said shape file containing layout shapes of a semiconductor device; b) decomposing said shapes into a plurality of parasitic capacitance components, said plurality of parasitic capacitance components including fringe capacitance components having substantially uniform parasitic capacitance with regard to fringe capacitance and overlap capacitance components having substantially uniform parasitic capacitance with regard to overlap capacitance; and c) computing parasitic capacitance of said semiconductor device, said computation including calculating the capacitance of each of said plurality of parasitic capacitance components. - View Dependent Claims (24, 25, 26, 27, 28, 29, 30, 31, 32, 33)
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34. A computer implemented method for calculating the parasitic capacitance in a semiconductor design, comprising the steps of:
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a) inputting a layout file, said layout file containing shapes of a semiconductor device; b) inputting a technology file, said technology file adapted to adjust said shapes of said semiconductor device in said layout file to wafer dimensions; c) partitioning said shapes of said semiconductor device into a plurality of tiles, said tiles each including a portion of a semiconductor shape; d) decomposing said plurality of tiles of each of said plurality of shapes into a plurality of parasitic capacitance components, said plurality of parasitic capacitance components including overlap capacitance components having substantially uniform parasitic capacitance with regard to overlap capacitance and fringe capacitance components having substantially uniform parasitic capacitance with regard to fringe capacitance; and e) computing capacitance of said semiconductor device by computing capacitance of said plurality of parasitic capacitance components. - View Dependent Claims (35, 36, 37, 38, 39, 40)
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41. A computer implemented method for calculating the parasitic capacitance in a semiconductor design, comprising the steps of:
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a) inputting a layout file, said layout file containing shapes of a semiconductor device; b) inputting a technology file, said technology file an executable file adapted to adjust said shapes of said semiconductor device in said layout file to wafer dimensions; c) partitioning said shapes of said semiconductor device into a plurality of butted rectangle tiles, said tiles each including a portion of a semiconductor shape; d) storing said wafer dimension layout shapes, said tiles of said shapes in a quad-data base e) creating a netlist data base; f) decomposing said plurality of tiles of said plurality of shapes into a plurality overlap-up and overlap-down parasitic capacitance components, g) decomposing edges of said plurality of tiles of said plurality of shapes into a plurality of fringe capacitance components, each of said fringe capacitance components having a uniform parasitic capacitance environment with respect to fringe-up, fringe-down, and fringe line-to-line capacitance; h) creating a geometry file, said geometry file containing wafer geometry dimensions corresponding to said parasitic capacitance components; and i) computing capacitance of said semiconductor device, said computing done by computing plurality of parasitic capacitance components using said wafer dimension geometry file.
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Specification