Semiconductor component with embedded fixed charges to provide increased high breakdown voltage
First Claim
1. A semiconductor component with at least one lateral semiconductor structure with a high breakdown voltage with said component including a substrate, a dielectric layer adjoining the substrate, a low-doped semiconductor zone disposed on the dielectric layer and heavily doped semiconductor zones of the semiconductor component which project into the low-doped semiconductor zone from the direction of an outer surface of the semiconductor component, and wherein fixed charges, which reduce the electrical field strength in a blocking state of the lateral structure, are embedded inside the dielectric layer adjoining the substrate, at least opposite an area of the low-doped semiconductor zone which, in the blocking state of the semiconductor component, has a high voltage in respect to the substrate.
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Accused Products
Abstract
A semiconductor component with at least one lateral semiconductor structure with a high breakdown voltage including a substrate, a dielectric layer adjoining the substrate, a low-doped semiconductor zone disposed on the dielectric layer and heavily doped semiconductor zones of the semiconductor component which project into the low-doped semiconductor zone from the direction of the outer surface of the semiconductor component. Fixed charges, which reduce the electrical field strength in the blocking component of the lateral structure, are embedded inside the dielectric layer adjoining the substrate at least opposite that area of the low-doped semiconductor zone which, in the blocking state of the semiconductor component, has a high voltage in respect to the substrate.
35 Citations
14 Claims
- 1. A semiconductor component with at least one lateral semiconductor structure with a high breakdown voltage with said component including a substrate, a dielectric layer adjoining the substrate, a low-doped semiconductor zone disposed on the dielectric layer and heavily doped semiconductor zones of the semiconductor component which project into the low-doped semiconductor zone from the direction of an outer surface of the semiconductor component, and wherein fixed charges, which reduce the electrical field strength in a blocking state of the lateral structure, are embedded inside the dielectric layer adjoining the substrate, at least opposite an area of the low-doped semiconductor zone which, in the blocking state of the semiconductor component, has a high voltage in respect to the substrate.
Specification