Planar type mirror galvanometer incorpotating a displacement detection function

• US 5,767,666 A
• Filed: 09/26/1995
• Issued: 06/16/1998
• Est. Priority Date: 01/31/1994
• Status: Expired due to Term

• Current Assignee: Nippon Signal Company Limited
• Original Assignee: Nippon Signal Company Limited
• Inventors: Asada, Norihiro, Esashi, Masayoshi
• Primary Examiner(s): Karlsen, Ernest F.
• Application Number:
  US08/530,103
• Time in Patent Office: 994 Days
• Field of Search: 324/97, 359/198, 359/199, 359/224, 359/900
• US Class Current: 324/97
• CPC Class Codes: G02B 26/0816 by means of one or more reflecting elements
• CPC Class Codes: G02B 26/0841 the reflecting element being moved or deformed by electrostatic means
• CPC Class Codes: G02B 26/105 with one or more pivoting mirrors or galvano-mirrors G02B26/101 takes precedence

Abstract

The present invention relates to a slim-type small size mirror galvanometer wherein the mirror displacement angle can be detected, made using semiconductor manufacturing techniques. Using semiconductor manufacturing techniques, a movable plate 5 and a torsion bar 6 for axially supporting the movable plate 5 are formed integrally on a silicon substrate 2, with a planar coil 7 and a total reflecting mirror 8 formed on an upper face of the movable plate 5, and permanent magnets 10A, 10B and 11A, 11B fixedly located so as to produce a magnetic field at the planar coil 7. The direction and quantity of current flowing in the planar coil 7 is controlled to variably control the swing angle of the movable plate 5 depending on the balance between the generated magnetic force and the torsion force in the torsion bar 6. Moreover, detection coils 12A, 12B are provided beneath the movable plate 5, and a detection current is superimposed on the drive current in the planar coil 7. The mirror displacement angle is detected by a change in the mutual inductance due to the detection current, between the planar coil and the detection coils 12A, 12B.

Claims

1. A planar type mirror galvanometer incorporating a displacement detection function, comprising;

a semiconductor substrate having a planar movable plate and a torsion bar formed integrally with the semiconductor substrate, the torsion bar supporting said movable plate about a torsion bar axis so that the movable plate is swingable about the axis, a planar coil for generating a magnetic field by means of an electric current for driving the movable plate, laid on an upper face peripheral edge portion of said movable plate, and a reflecting mirror provided on an upper face central portion which is surrounded by said planar coil, and magnets forming pairs with each other fixed to the semiconductor substrate so as to produce a magnetic field at the planar coil portions on the opposite sides of the movable plate which are parallel with the axis of the torsion bar, wherein a plurality of detection coils capable of electromagnetic coupling with said planar coil for detecting displacement of said movable plate are provided adjacent said movable plate and disposed at symmetrical locations with respect to said torsion bar, and a displacement detection current is superimposed on said electric current in the planar coil for driving the movable plate.

2. A planar type mirror galvanometer incorporating a displacement detection function according to claim 1, wherein said movable plate comprises;

a frame shape outer movable plate axially supported relative to the semiconductor substrate by a first torsion bar, and an inner movable plate axially supported inside the outer movable plate by a second torsion bar axially perpendicular to said first torsion bar, with a first planar coil provided on an upper face of said outer movable plate, and a second planar coil provided on an upper face peripheral edge portion of said inner movable plate, and said reflecting mirror provided on a central portion of the inner movable plate which is surrounded by said second planar coil, and said detection coils are respectively disposed at symmetrical locations with respect to said first and second torsion bars.

3. A planar type mirror galvanometer incorporating a displacement detection function according to claim 1, wherein an upper substrate and a lower substrate are respectively provided on upper and lower faces of said semiconductor substrate, and said magnets are fixed to the upper substrate and the lower substrate.

4. A planar type mirror galvanometer incorporating a displacement detection function according to claim 3, wherein at least an upper substrate is made from a glass substrate transparent to light, and said upper substrate and lower substrate seal a movable plate accommodating space.

5. A planar type mirror galvanometer incorporating a displacement detection function according to claim 4, wherein said movable plate accommodating space is evacuated.

6. A planar type mirror galvanometer incorporating a displacement detection function according to claim 4, wherein said movable plate accommodating space is filled with an inert gas.

7. A planar type mirror galvanometer incorporating a displacement detection function according to claim 4, wherein said upper and lower substrates have recesses in respective central portions thereof which face each other when fitted to the semiconductor substrate to form said moveable plate accommodating space.

8. A planar type mirror galvanometer incorporating a displacement detection function according to claim 3, wherein said upper and lower substrates are insulating substrates.

9. A planar type mirror galvanometer incorporating a displacement detection function according to claim 1, wherein said magnets are permanent magnets.