Method and device for identifying designated materials in the composition of an object

• US 5,768,334 A
• Filed: 07/12/1996
• Issued: 06/16/1998
• Est. Priority Date: 05/28/1993
• Status: Expired due to Term

• Current Assignee: Heimann Systems
• Original Assignee: Europ Scan
• Inventors: Perion, Didier, Maitrejean, Serge
• Primary Examiner(s): Porta, David P.
• Assistant Examiner(s): Bruce, David Vernon
• Application Number:
  US08/556,909
• Time in Patent Office: 704 Days
• Field of Search: 378/53, 378/56, 378/57
• US Class Current: 378/53
• CPC Class Codes: G01N 23/04 and forming images of the material
• CPC Class Codes: G01N 23/083 the radiation being X-rays
• CPC Class Codes: G01V 5/22 Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays

Abstract

The method comprises the following stages: first the attenuation function of at least three reference materials are determined across a wide x-ray spectrum and projection functions (F_p1, F_p2, F_p3, F_p4) forming a base are derived therefrom, then the attenuation function in said x-ray spectrum of at least one target material is determined and the attenuation function of each target material is projected onto said base; further, for each point of the object (1), the attenuation function of the object (1) is determined in said x-ray spectrum and projected onto said base, and the projections so obtained are compared with the projection from each target material and from this comparison an inference is made whether at least one target material enters the constitution of the object (1) at the point of inspection.

Application: luggage inspection and control.

Claims

1. A method for identifying at least one specific target material in the constitution of an object (1),

characterized in that it comprises the following stages:

A. Previously determining the attenuation function across a wide x-ray spectrum of at least two reference materials and therefrom deriving base-forming projection functions (F_p1,F_p2 . . . ),

B. During a second preliminary stage, deter the attenuation of at least one target material across said x-ray spectrum and projecting the attenuation function of each target material onto said base,

C. For each point of the object (1),

determining the attenuation function of the object (1) for said x-ray spectrum,

projecting the attenuation function of the object (1) onto said base

comparing the projections so obtained with the projections from each target material and deducing from this comparison whether at least one target material is pant of the constitution of the object (1) at the point being tested.

2. Method defined in claim 1, characterized in that the x-ray spectrum evinces a range between at least 30 Kev and 100 Kev.

3. Method defined in claim 1, characterized in that the objects attenuation function, further the reference-material attenuation functions and the target-material test functions all are expressed in terms of an independent variable u bijectively related to the energy E of the x-rays.

4. Method defined in claim 3, characterized in that the variable u is selected to be the attenuation value of a fixed thickness of a calibration material (18).

5. Method defined in claim 4, characterized in that the calibration material evinces an effective Z in a range from 5 to 26.

6. Method defined in claim 1, characterized in that the projection functions are mutually orthogonal.

7. Method defined in claim 6, characterized in that the projection functions are eigenfunctions associated with eigenvalues determined by diagonalizing a matrix constituted by the scalar products of the reference-material attenuation functions.

8. Method defined in claim 7, characterized in that during a preliminary stage and for each target material, a set of projection coefficients resulting from the projection of the target-material attenuation functions onto said base is determined, said eigenvalues being arranged in decreasing order, in that a set of comparison coefficients for the target materials is derived from each set of projection coefficients by dividing each projection coefficient of the set under consideration by the coefficient of the particular set corresponding to the projection onto projection function associated to the largest of the eigenvalues, these sets of comparison coefficients for the target materials being used in comparisons allowing inferring whether at least one target material is part of the constitution of object (1).

9. Method defined in claim 8, characterized in that, because the inspected object is constituted of discrete bodies (1, 2, 3),

an image is made of the contours (5) of the discrete bodies, said contours (5) being transition zones between the different discrete bodies,

for each point of the object (1), a set of projection coefficients resulting from the projection of the attenuation function of the object onto said base is determined,

variations in the sets of projection coefficients of object inside the transition zones (5) are determined, and

from said variations, comparison coefficients with the comparison coefficients of the target materials are derived.

10. Method defined in claim 1, characterized in that the effective atomic numbers of the reference materials are regularly spaced in a range from 3 to 30.

11. Method defined in claim 10, characterized in that a first reference material is selected from the materials evincing an effective atomic number in a range from 3 to 7, in that a second reference material is selected from the materials evincing an effective atomic number in a range from 7 to 10, in that a third reference material is selected from the materials evincing an effective atomic number in a range from 10 to 17 and in that a fourth reference material is selected from among the materials evincing an effective atomic number in the range from 17 to 30.

12. Method defined in claim 11, characterized in that at least one of the reference materials is selected as follows:

the first reference material is polyethylene, the second reference material is PTFE, the third reference material is duralumin, the fourth reference material is iron.

13. Method defined in claim 1, characterized in that the target materials are explosives and/or drugs.

14. Apparatus implementing a method defined in claim 1,

characterized in that it comprises:

means (10, 12, 16, 17, 18, 20 or

     30) determining attenuation functions across a wide x-ray spectrum, said attenuation functions being expressed in terms of an independent variable u which is bijectively related to the energy of the x-rays,

processing means (26) able to project attenuation functions onto functions forming a base and previously determined from the attenuation functions of at least three reference materials,

conveying means (28) for an object (1) to be analyzed, said conveying means allowing to expose said object to the attenuation-function determining means,

comparison means (27) comparing the object'"'"'s attenuation-function projection with previously implemented attenuation-function projections of at least one target material, in order to infer from this comparison whether at least one target material is present in the object constitution,

displays (36) to display at least one object image by distinguishing the points at which a target material is present in the object constitution.

15. Apparatus defined in claim 14, characterized in that it furthermore comprises image-processing means (29) able to geometrically isolate each object substance to form a contour image.

16. Apparatus defined in claim 14, characterized in that the attenuation-function determining means comprise a calibration-material component (18) and evince different thicknesses, said component (19) being displaceable at will into the x-ray beam (14, 15).

17. Apparatus defined in claim 14, characterized in that the attenuation-function determining means comprise a source (10, 12, 16, 17) emitting an x-ray beam in sequence in several spectral ranges and further comprise a strip (20) of detectors (22), each detector (22) responding to all the spectral ranges.

18. Apparatus defined in claim 14, characterized in that the attenuation-function determining means comprise an x-ray beam generator (32, 34) with a wide and fixed spectrum and a strip (20) of stacked detectors (30), each detector (30a, 30b . . . ) of a stack acting as a high-pass filter for the adjacent and following detector.