Optical measuring method and an optical measuring apparatus for determining the internal structure of an object
First Claim
Patent Images
1. An optical measuring method comprising:
- a first step of, in a first state in which a measured object is placed in a predetermined place, emitting probe light from a light source onto said measured object and detecting said probe light transmitted or reflected by said measured object by means of light detecting means to obtain a first mean time delay of said probe light;
a second step of, in a second state in which said measured object is not placed in said predetermined place, emitting said probe light from said light source to said predetermined place and detecting said probe light passing through said predetermined place without intervention of said measured object by said light detecting means to obtain a second mean time delay; and
a third step of subtracting said second mean time delay from said first mean time delay to obtain a true mean time delay.
1 Assignment
0 Petitions
Accused Products
Abstract
An optical measuring method and an optical measuring apparatus are capable of obtaining the true mean time delay of a light waveform within a short time for the purpose of obtaining information on the internal structure of an object. Calculations include a first mean time delay when the light path includes the object, a second mean time delay when the light path does not include the object, and a subtraction of the second mean time delay from the first mean time delay to obtain a true mean time delay.
17 Citations
18 Claims
-
1. An optical measuring method comprising:
-
a first step of, in a first state in which a measured object is placed in a predetermined place, emitting probe light from a light source onto said measured object and detecting said probe light transmitted or reflected by said measured object by means of light detecting means to obtain a first mean time delay of said probe light; a second step of, in a second state in which said measured object is not placed in said predetermined place, emitting said probe light from said light source to said predetermined place and detecting said probe light passing through said predetermined place without intervention of said measured object by said light detecting means to obtain a second mean time delay; and a third step of subtracting said second mean time delay from said first mean time delay to obtain a true mean time delay. - View Dependent Claims (2, 3, 4, 5)
-
-
6. An optical measuring apparatus comprising:
-
a light source for emitting probe light to be guided to a predetermined place; light detecting means for detecting said probe light output from said predetermined place; and a first arithmetic processing portion for calculating a first mean time delay of the probe light transmitted or reflected by a measured object, based on said probe light detected by said light detecting means in a first state in which said measured object is placed in said predetermined place, calculating a second mean time delay of the probe light passing through said predetermined place without intervention of said measured object, based on said probe light detected by said light detecting means in a second state in which said measured object is not placed in said predetermined place, and subtracting said second mean time delay from said first mean time delay to obtain a true mean time delay. - View Dependent Claims (7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
-
Specification