Method of selecting device threshold voltages for high speed and low power

• US 5,774,367 A
• Filed: 07/24/1995
• Issued: 06/30/1998
• Est. Priority Date: 07/24/1995
• Status: Expired due to Fees

• Current Assignee: Freescale Semiconductor, Inc. (NXP Semiconductors NV)
• Original Assignee: Motorola, Inc. (Motorola Solutions, Inc.)
• Inventors: Snyder, Daniel J., Chamoun, Sleiman N., Ramondetta, Karen S., Reyes, Alberto J.
• Primary Examiner(s): BUTLER, DENNIS
• Application Number:
  US08/506,447
• Time in Patent Office: 1,072 Days
• Field of Search: 395/551, 395/558, 365/189.9, 365/226, 365/227, 327/530, 327/544, 364/488, 364/489, 364/490, 364/491
• US Class Current: 716/108
• CPC Class Codes: G06F 30/327 Logic synthesis; Behaviour synthesis, e.g. mapping logic, HDL to netlist, high-level language to RTL or netlist

Abstract

A method of selecting device (14-16, 18-24, 28-30) threshold voltages for high speed and low overall power involves identifying (42) the critical paths by predetermined timing criteria. All transistors have an initial, typically high, threshold voltage (40). Transistors outside the critical paths keep the initial high threshold voltages to minimize static power drain. The transistors in the critical path are selected (43) according to a predetermined sorting function to have a low threshold voltage and thereby switch faster. Although the lower threshold voltage devices consume more static power in standby mode, the power drain is accepted as a trade-off in favor of increased speed through the critical path. The supply voltage is reduced to minimize dynamic power. The integrated circuit is thus optimized to run at a higher frequency with lower overall power consumption.

Claims

1. A computer implemented method of selecting a device threshold voltage, comprising the steps of:

identifying a critical path through a circuit;

selecting devices in said critical path according to a predetermined cost function to adjust the threshold voltage of at least one of the selected devices, wherein the cost function includes at least two components, a first component dependent on process parameters and a second component dependent on design specific parameters; and

adjusting the threshold voltage of said at least one of the selected devices in said critical path to meet predetermined timing criteria.

2. The method of claim 1 wherein said step of identifying a critical path includes the steps of:

assigning an operating frequency for a clock signal; and

setting timing constraints for nodes within said circuit relative to said clock signal.

3. The method of claim 2 wherein said step of identifying a critical path further includes the steps of:

summing propagation delays of circuit elements of said circuit between first and second nodes;

identifying a path between said first and second nodes as critical if said sum of propagation delays exceeds said timing constraint for a signal arriving at said second node; and

identifying a path between said first and second nodes as non-critical if said sum of propagation delays meets said timing constraint for said signal arriving at said second node.

4. The method of claim 2 wherein said step of identifying a critical path further includes the steps of:

allocating an absolute propagation delay between first and second nodes;

identifying a path between said first and second nodes as critical if said absolute propagation delay exceeds said timing constraint for a signal arriving at said second node; and

identifying a path between said first and second nodes as non-critical if said absolute propagation delay meets said timing constraint for said signal arriving at said second node.

5. The method of claim 1 wherein said step of identifying a critical path includes the steps of:

applying an input vector to inputs of said circuit;

comparing a measured output vector to a known good output vector;

identifying an output and associated path as critical if said measured vector disagrees with said known good output vector; and

identifying an output and associated path as non-critical if said measured vector agrees with said known good output vector.

6. The method of claim 1 wherein said second component dependent on design specific parameters includes a component that has a largest individual propagation delay.

7. The method of claim 1 wherein said second component dependent on design specific parameters includes a component that has a least impact on static power consumption.

8. The method of claim 1 wherein said second component dependent on design specific parameters includes a sub-component that has a least impact on static power consumption and a sub-component that has a largest individual propagation delay.

9. A computer implemented method of selecting a device threshold voltage, comprising the steps of:

providing a netlist of devices in a circuit each including an initial threshold voltage;

identifying a critical path through said circuit;

selecting devices in said critical path according to a predetermined cost function to adjust the initial threshold voltage, wherein the cost function includes at least two components, a first component dependent on process parameters and a second component dependent on design specific parameters; and

adjusting the threshold voltage of said selected devices in said critical path to meet predetermined timing criteria.

10. The method of claim 9 wherein said step of identifying a critical path includes the steps of:

assigning an operating frequency for a clock signal; and

setting timing constraints for nodes within said circuit relative to said clock signal.

11. The method of claim 10 wherein said step of identifying a critical path further includes the steps of:

summing propagation delays of circuit elements of said circuit between first and second nodes;

identifying a path between said first and second nodes as critical if said sum of propagation delays exceeds said timing constraint for a signal arriving at said second node; and

identifying a path between said first and second nodes as non-critical if said sum of propagation delays meets said timing constraint for said signal arriving at said second node.

12. The method of claim 10 wherein said step of identifying a critical path further includes the steps of:

allocating an absolute propagation delay between first and second nodes;

identifying a path between said first and second nodes as critical if said absolute propagation delay exceeds said timing constraint for a signal arriving at said second node; and

identifying a path between said first and second nodes as non-critical if said absolute propagation delay meets said timing constraint for said signal arriving at said second node.

13. The method of claim 9 wherein said step of identifying a critical path includes the steps of:

applying an input vector to inputs of said circuit;

comparing a measured output vector to a known good output vector;

identifying an output and associated path as critical if said measured vector disagrees with said known good output vector; and

identifying an output and associated path as non-critical if said measured vector agrees with said known good output vector.

14. The method of claim 9 wherein said second component dependent on design specific parameters includes a component that has a largest individual propagation delay.

15. The method of claim 9 wherein said second component dependent on design specific parameters includes a component that has a least impact on static power consumption.

16. The method of claim 9 wherein said second component dependent on design specific parameters includes a component a sub-component that has a least impact on static power consumption and a sub-component that has a largest individual propagation delay.

17. An apparatus for selecting a device threshold voltage, comprising:

means for identifying a critical path through a circuit;

means for selecting devices in said critical path according to a predetermined cost function to adjust a threshold voltage of at least one selected device, wherein the cost function includes at least two components, a first component dependent on process parameters and a second component dependent on design specific parameters; and

means for adjusting the threshold voltage of said at least one selected device in said critical path to meet predetermined timing criteria.

18. The apparatus of claim 17 wherein said means for identifying a critical path includes:

means for defining an operating frequency for a clock signal;

means for setting timing constraints for nodes within said circuit relative to said clock signal;

means for summing propagation delays of circuit elements of said circuit between first and second nodes;

means for identifying a path between said first and second nodes as critical if said sum of propagation delays exceeds said timing constraint for a signal arriving at said second node; and

means for identifying a path between said first and second nodes as non-critical if said sum of propagation delays meets said timing constraint for said signal arriving at said second node.

19. The apparatus of claim 18 wherein said means for selecting devices in said critical path includes means for sorting devices by a predetermined cost function.