×

Infrared assessment system

  • US 5,775,806 A
  • Filed: 09/12/1996
  • Issued: 07/07/1998
  • Est. Priority Date: 09/12/1996
  • Status: Expired due to Fees
First Claim
Patent Images

1. A process for analyzing an object to determine its functional status, comprising:

  • scanning a reference object with an infrared detector to measure infrared radiation emitted from the reference object and determining its heating rate thereby;

    scanning a test object with an infrared detector to measure infrared radiation emitted from the test object and determining its heating rate thereby;

    comparing the reference and test object heating rates to determine if the test object is functioning within specified tolerances;

    graphically displaying a thermal image generated from the infrared detector; and

    identifying the test object if it exceeds specified tolerances.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×