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Apparatus and method for detection and thickness measurement of coatings over a surface

  • US 5,781,115 A
  • Filed: 04/03/1995
  • Issued: 07/14/1998
  • Est. Priority Date: 04/03/1995
  • Status: Expired due to Fees
First Claim
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1. A system for determining the thickness of a material on a conductive surface, comprising:

  • a generator for producing a Radio Frequency signal;

    a first antenna for transmitting a polarized Radio Frequency signal;

    a second antenna for receiving both components of a de-polarized reflected Radio Frequency signal after said signal is reflected from a conductive surface having a material thereon;

    a vector analyzer and processor for producing an output vector signal indicative of the thickness and permittivity of the material on the conductive surface based upon the de-polarized reflected signal; and

    a display for showing the location and thickness of the material on the conductive surface.

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