Method and arrangement for identifying crystalline and polycrystalline materials
First Claim
1. A method for identifying crystalline and polycrystalline material in an object, comprising:
- placing the object in an examination region;
passing x-rays having a polychromatic energy distribution through a diaphragm to create a central x-ray beam in a fan plane that is projected into the examination region for irradiating a cross section of the object, the x-rays being diffracted by individual subregions of the object along the cross section in dependence of the presence of at least one of crystalline and polycrystalline material in a respective one of the individual subregions;
arranging collimators with collimating windows beyond the examination region with respect to the diaphragm, each collimating window covering a fixed, predetermined subregion of the examination region and extracting at least one diffracted plane fan beam from the respective individual subregion of the object;
providing a detector comprising a silicon photodiode including an end face having an area of 1 mm2 to 5 mm2 behind a respective one of the collimating windows so that each diffracted x-ray plane fan beam exiting a respective one of the collimating windows is incident on a respective one of the end faces of the silicon photodiodes; and
capturing energy spectra of the diffracted x-ray plane fan beam exiting a respective one of the collimating windows with a respective one of the silicon photodiodes for converting the captured energy spectra into signals usable in a data processing arrangement.
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Abstract
A method and apparatus is provided for identifying crystalline and polycrystalline material in an object placed in an examination region. X-rays having a polychromatic energy distribution are passed through a diaphragm to create a central x-ray beam in a fan plane that is projected into the examination region for irradiating a cross section of the object. The x-rays are diffracted by individual subregions of the object along the cross section in dependence of the presence of crystalline and/or polycrystalline material in the individual subregions. Collimators with collimating windows are arranged beyond the examination region with respect to the diaphragm, each collimating window covering a fixed, predetermined subregion of the examination region and extracting at least one diffracted plane fan beam from the respective individual subregion of the object. Energy spectra of the diffracted x-ray plane fan beams exiting the respective one of the collimating windows are captured with a detector located behind each of the collimating windows for converting the captured energy spectra into signals usable in a data processing arrangement.
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Citations
17 Claims
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1. A method for identifying crystalline and polycrystalline material in an object, comprising:
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placing the object in an examination region; passing x-rays having a polychromatic energy distribution through a diaphragm to create a central x-ray beam in a fan plane that is projected into the examination region for irradiating a cross section of the object, the x-rays being diffracted by individual subregions of the object along the cross section in dependence of the presence of at least one of crystalline and polycrystalline material in a respective one of the individual subregions; arranging collimators with collimating windows beyond the examination region with respect to the diaphragm, each collimating window covering a fixed, predetermined subregion of the examination region and extracting at least one diffracted plane fan beam from the respective individual subregion of the object; providing a detector comprising a silicon photodiode including an end face having an area of 1 mm2 to 5 mm2 behind a respective one of the collimating windows so that each diffracted x-ray plane fan beam exiting a respective one of the collimating windows is incident on a respective one of the end faces of the silicon photodiodes; and capturing energy spectra of the diffracted x-ray plane fan beam exiting a respective one of the collimating windows with a respective one of the silicon photodiodes for converting the captured energy spectra into signals usable in a data processing arrangement. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. An arrangement for identifying crystalline and polycrystalline material in an object, comprising:
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an x-ray source including a diaphragm for projecting a central x-ray beam having a polychromatic energy distribution in a fan plane into an examination region containing the object for irradiating a cross section of the object, the x-rays being diffracted by individual subregions of the object along the cross section in dependence of the presence of at least one of crystalline and polycrystalline material in a respective one of the individual subregions; collimators arranged beyond the examination region relative to the x-ray source, the collimators being arranged in at least one row symmetrically around the axis of the central x-ray beam in a plane extending perpendicularly to the fan plane of the central x-ray beam and including collimating windows extending in parallel with respect to one another and respectively at a fixed angle α
with respect to the axis of the central x-ray beam, each collimating window covering a fixed, predetermined subregion of the examination region and extracting at least one diffracted plane fan beam from the respective individual subregion of the object; anddetectors each arranged at a respective one of the collimating windows of the collimators in the plane of the respectively collimated fan beam for capturing energy spectra of the diffracted x-ray plane fan beam exiting a respective one of the collimating windows and converting the energy spectra into signals for subsequent use in a data processing arrangement, wherein the detectors each comprises a silicon photodiode including an end face having an area of 1 mm2 to 5 mm2 behind a respective one of the collimating windows so that each diffracted x-ray plane fan beam exiting a respective one of the collimating windows is incident on a respective one of the end faces of the silicon photodiodes. - View Dependent Claims (12, 13, 14, 15, 16, 17)
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Specification