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Method and arrangement for identifying crystalline and polycrystalline materials

  • US 5,787,145 A
  • Filed: 03/21/1996
  • Issued: 07/28/1998
  • Est. Priority Date: 03/21/1995
  • Status: Expired due to Term
First Claim
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1. A method for identifying crystalline and polycrystalline material in an object, comprising:

  • placing the object in an examination region;

    passing x-rays having a polychromatic energy distribution through a diaphragm to create a central x-ray beam in a fan plane that is projected into the examination region for irradiating a cross section of the object, the x-rays being diffracted by individual subregions of the object along the cross section in dependence of the presence of at least one of crystalline and polycrystalline material in a respective one of the individual subregions;

    arranging collimators with collimating windows beyond the examination region with respect to the diaphragm, each collimating window covering a fixed, predetermined subregion of the examination region and extracting at least one diffracted plane fan beam from the respective individual subregion of the object;

    providing a detector comprising a silicon photodiode including an end face having an area of 1 mm2 to 5 mm2 behind a respective one of the collimating windows so that each diffracted x-ray plane fan beam exiting a respective one of the collimating windows is incident on a respective one of the end faces of the silicon photodiodes; and

    capturing energy spectra of the diffracted x-ray plane fan beam exiting a respective one of the collimating windows with a respective one of the silicon photodiodes for converting the captured energy spectra into signals usable in a data processing arrangement.

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