Method for characterizing interconnect timing characteristics using reference ring oscillator circuit

• US 5,790,479 A
• Filed: 09/17/1996
• Issued: 08/04/1998
• Est. Priority Date: 09/17/1996
• Status: Expired due to Term

• Current Assignee: Xilinx, Inc. (Advanced Micro Devices, Inc.)
• Original Assignee: Xilinx, Inc. (Advanced Micro Devices, Inc.)
• Inventors: Conn, Robert O.
• Primary Examiner(s): MISKA, VIT W
• Application Number:
  US08/710,465
• Time in Patent Office: 686 Days
• Field of Search: 368/113, 368/118, 327/261-267, 327/39, 327/45-47, 324/73.1, 324/76.41, 324/658, 324/681-686
• US Class Current: 368/118
• CPC Class Codes: G01R 27/04 in circuits having distributed constants , e.g. having very long conductors or involving high frequencies
• CPC Class Codes: G01R 31/2853 Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections G01R31/31717 takes precedence; test of chip-to-PCB or lead-to-PCB connections G01R31/66
• CPC Class Codes: G01R 31/2882 Testing timing characteristics
• CPC Class Codes: G01R 31/3016 Delay or race condition test, e.g. race hazard test
• CPC Class Codes: G01R 31/31725 Timing aspects, e.g. clock distribution, skew, propagation delay for tester hardware G01R31/31937
• CPC Class Codes: G01R 31/318516 Test of programmable logic devices [PLDs]

Abstract

A reference ring oscillator circuit (RROC) is used to determine timing characteristics of a test interconnect structure in an integrated circuit. The RROC includes an odd number of inverters coupled together in a ring manner and has defined test segments at which a test interconnect can be loaded. Reference timing characteristics of the unloaded RROC are determined according to a calibration method including the steps of: (a) directly measuring signal propagation delay through each segment of the RROC; (b) modeling each test segment using an RC tree type reference circuit model having reference elements; (c) simulating the reference circuit model to provide a functional relationship between two reference capacitors; (d) defining upper and lower bounds for propagation delay through the test segment in terms of the reference elements; (e) determining values for the reference capacitor elements; and (f) measuring a reference frequency of oscillation of the unloaded RROC.

Claims

1. A method of determining timing characteristics of a test interconnect structure, said method comprising the steps of:

a) determining timing characteristics of reference logic units and reference interconnect structures that comprise a reference ring oscillator circuit using direct measurement;

b) measuring a first frequency of oscillation of said reference ring oscillator circuit;

c) inserting said test interconnect structure onto one of said reference interconnect structures of said reference ring oscillator circuit;

d) measuring a second frequency of oscillation of said reference ring oscillator circuit having said test interconnect structure inserted therein;

e) subtracting the period of said first frequency from the period of said second frequency to determine a first time value; and

f) based on said first time value and determined timing characteristics of said one of said reference interconnect structures, determining said timing characteristics of said test interconnect structure.

2. A method as described in claim 1 wherein said step a) comprises the step of implementing said reference ring oscillator circuit by configuring a programmable integrated circuit.

3. A method as described in claim 1 wherein said step a) comprises the steps of:

measuring propagation delays through said reference logic units and through said reference interconnect structures using a scanning electron microscope to directly measure input and output signal wave forms; and

based on said propagation delays, determining said timing characteristics of said reference logic units and said reference interconnect structures.

4. A method as described in claim 1 wherein said reference ring oscillator circuit comprises an odd number of logic units coupled together using said reference interconnect structures, wherein each of said logic units realizes an inverter stage.

5. A method as described in claim 1 wherein said step c) comprises the step of coupling said test interconnect structure to said one of said reference interconnect structures using a programmable interconnect point (PIP).

6. A method as described in claim 1 wherein said timing characteristics of said test interconnect structure represent capacitance values and wherein said capacitance values of said test interconnect structure are based on an interconnect model representative of said test interconnect structure.

7. A method as described in claim 1 further comprising the step of recording said timing characteristics associated with said test interconnect structure in a format indexed by said test interconnect structure.

8. A method as described in claim 1 wherein said logic units are configurable logic blocks of a field programmable gate array.

9. A method as described in claim 1 wherein the reference ring oscillator circuit is implemented on a same substrate as said test interconnect structure.

10. A method of determining timing characteristics of a test interconnect structure, said method comprising the steps of:

configuring a programmable integrated circuit to implement a reference ring oscillator circuit (RROC), said RROC comprising an odd number (x) of segments coupled in a ring manner wherein each segment comprises a reference interconnect structure which couples a pair of inverters;

measuring a reference frequency of oscillation of said RROC;

determining capacitance values for reference capacitors of a first segment of said x segments by direct measurement;

inserting said test interconnect structure onto said first segment;

measuring a test frequency of oscillation of said RROC having said test interconnect structure inserted therein;

subtracting the period of said reference frequency from the period of said test frequency to determine a time value;

adding said time value to a measured signal propagation delay through said first segment to provide a calculated signal propagation delay; and

determining capacitance of said test interconnect structure based on determined values for said reference capacitors of said first segment and said calculated signal propagation delay.

11. A method as described in claim 10 wherein said step of determining capacitance values for reference capacitors of a first segment of said x segments by direct measurement comprises the steps of:

directly measuring signal propagation delay through each of segment of said x segments of said RROC;

modeling said first segment of said RROC using a reference circuit model comprising an RC tree network having reference resistors and said reference capacitors;

simulating said reference circuit model using a computer implemented simulator to provide a functional relationship between said reference capacitors of said reference circuit model;

defining upper and lower bounds for signal propagation delay through said reference circuit model, said upper and lower bounds defined in terms of said reference capacitors and reference resistors of said reference circuit model; and

determining values for said reference capacitors of said reference circuit model of said first segment.

12. A method of determining timing characteristics associated with an interconnect structure of a field programmable gate array, said method comprising the steps of:

a) constructing a ring oscillator circuit having x segments, each segment comprising a reference interconnect structure, wherein x is an odd number;

b) determining capacitance values associated with inverter stages and reference interconnect structures of said ring oscillator circuit based on direct measurement of signal propagation delays within each segment of said x segments;

c) measuring a first frequency of oscillation of said ring oscillator circuit;

d) inserting a test interconnect structure onto one of said reference interconnect structures of said ring oscillator circuit;

e) measuring a second frequency of oscillation of said reference ring oscillator circuit having said test interconnect structure inserted therein;

f) subtracting the period of said first frequency from the period of said second frequency to determine a time value; and

g) based on said time value and determined capacitance values of said one of said reference interconnect structures, determining said timing characteristics of said test interconnect structure.

13. A method as described in claim 12 wherein said step b) comprises the step of measuring signal propagation delays within each segment of said x segments using a scanning electron microscope to directly measure input and output signal wave forms at accessible test points of each segment.

14. A method as described in claim 12 wherein said step d) comprises the step of coupling said test interconnect structure to said one of said reference interconnect structures using a programmable interconnect point (PIP).

15. A method as described in claim 12 wherein said timing characteristics of said test interconnect structure represent capacitance values and wherein capacitance values of said test interconnect structure are based on an interconnect model representative of said test interconnect structure.

16. A method as described in claim 12 further comprising the step of recording said timing characteristics associated with said test interconnect structure in a format indexed by said interconnect structure.

17. A method as described in claim 12 wherein said inverter stages are individually realized with configurable logic blocks of said field programmable gate array.

18. A method as described in claim 12 wherein the ring oscillator circuit is implemented on a same substrate as the test interconnect structure.