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Circuit with built-in test and method thereof

  • US 5,790,562 A
  • Filed: 05/06/1996
  • Issued: 08/04/1998
  • Est. Priority Date: 05/06/1996
  • Status: Expired due to Fees
First Claim
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1. A built-in self test circuit method comprising the steps of:

  • determining a response set of a circuit to be tested;

    pruning the response set by removing all vertices of the response set that have a degree of one;

    synthesizing a minimum required logic response of the response set by categorizing the pruned response set into a plurality of at least two categories, wherein no two adjacent vertices of the pruned response are in the same category, and carrying the categorization to the remainder of the response set; and

    implementing a space compaction circuit according to the minimum required logic response, wherein the space compaction circuit is responsive to the circuit to be tested and outputs an error signal in response to a defect in the circuit to be tested.

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