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Method for manufacturing an accelerometer sensor of crystalline material

  • US 5,792,675 A
  • Filed: 10/15/1996
  • Issued: 08/11/1998
  • Est. Priority Date: 12/03/1993
  • Status: Expired due to Term
First Claim
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1. A method of manufacturing a sensor, comprising the steps of:

  • applying a sacrificial layer to a monocrystalline silicon base;

    arranging a polysilicon starting layer on the sacrificial layer;

    creating at least one polycrystalline silicon region by depositing a silicon layer as a polycrystalline silicon layer over the sacrificial layer;

    creating at least one monocrystalline silicon region by depositing a silicon layer as a monocrystalline silicon layer over a portion of the monocrystalline silicon base not covered by the sacrificial layer;

    creating a sensor structure in the silicon layer via an etching of trenches, the sensor structure including at least one portion of the at least one monocrystalline silicon region and at least one portion of the at least one polycrystalline silicon region;

    etching a portion of the monocrystalline silicon base under the at least one portion of the at least one monocrystalline silicon region; and

    etching a portion of the sacrificial layer under the at least one portion of the at least one polycrystalline silicon region.

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