Generic interface test adapter

• US 5,793,218 A
• Filed: 12/15/1995
• Issued: 08/11/1998
• Est. Priority Date: 12/15/1995
• Status: Expired due to Fees

• Current Assignee: Lear Astronics Corporation
• Original Assignee: Lear Astronics Corporation
• Inventors: Reid, Kenneth, Oster, Melvin G., Fuchs, Brian K.
• Primary Examiner(s): Karlsen, Ernest F.
• Application Number:
  US08/573,026
• Time in Patent Office: 970 Days
• Field of Search: 324/754, 324/755, 324/758, 324/761, 324/158.1
• US Class Current: 324/750.24
• CPC Class Codes: G01R 31/2808 Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards probe, multiprobe, probe manipulator or probe fixture G01R1/067
• CPC Class Codes: G01R 31/2844 using test interfaces, e.g. adapters, test boxes, switches, PIN drivers G01R31/2889 takes precedence

Abstract

A generic interface test adapter for connecting between a test station and a unit under test. The generic interface test adapter includes an interface frame and an interchangeable circuit card assembly that are configured to route the signals between test station and the unit under test. The interface frame includes an interface plane having a plurality of contact pins or spring-loaded probes, and the circuit card assembly has a plurality of contact pads, aligned to mated with the contact pins. The electrical connections between the test station and the unit under test can be reconfigured merely by changing the interchangeable circuit card assembly. A pressure frame is provided to securely hold the circuit card assembly against the interface plane to provide electrical connection. The pressure frame is pulled toward the interface frame by a cam and angled cam slot mechanism operated by a lever arm.

Claims

1. A generic interface test adaptor for configuring the coupling between a test station and a variety of line replaceable units and a variety of shop replaceable units under test, the generic interface test adaptor comprising:

a first connector for coupling a predetermined line replaceable unit with the generic interface test adaptor;

an interface plane having a first surface, a first field of contact pins, and a second field of contact pins, wherein a first end of the first field of contact pins and a first end of the second field of contact pins extend from the first surface, the second end of the first field of contact pins for coupling to the test station, and a second end of the second field of contact pins for coupling to the first connector;

an interface frame for housing the interface plane, the first connector attached to the interface frame;

a first interface card for configuring the generic interface test adaptor to test the predetermined line replaceable unit, the first interface card having,

a second surface configured to couple with the first surface,

a first field of contact pads and a second field of contact pads arranged on the second surface such that, when the second surface is brought into mating alignment with the first surface, electrical contact is established between the first end of the first field of contact pins and the first field of contact pads and between the first end of the second field of contact pins and the second field of contact pads, and

a first set of conductive traces for coupling the first field of contact pads to the second field of contact pads, the first set of conductive traces arranged according to the predetermined line replaceable unit under test such that electrical coupling is made between the test station and the predetermined line replaceable unit; and

a second interface card for configuring the generic interface test adaptor to test a predetermined shop replaceable unit, the second interface card having,

a third surface configured to couple with the first surface,

a fourth surface opposite the third surface,

a third field of contact pads arranged on the third surface such that, when the third surface is brought into mating alignment with the first surface, electrical contact is established between the first end of the first field of contact pins and the third field of contact pads, and

at least one second connector, arranged on the fourth surface, for coupling the predetermined shop replaceable unit with the generic interface test adaptor, and

a second set of conductive traces for coupling the third field of contact pads to the at least one second connector, the second set of conductive traces configured according to the predetermined shop replaceable unit under test such that electrical coupling is made between the test station and the predetermined shop replaceable unit.

2. A generic interface test adapter as defined in claim 1, further comprising

a pressure frame that presses the first interface card against the interface plane when the predetermined line replaceable unit is under test and presses the second interface card against the interface plane when the predetermined shop replaceable unit is under test.

3. A generic interface test adapter as defined in claim 2, wherein the interface frame further includes a pair of card guides mounted on telescopic guides protruding from the interface frame at a direction perpendicular to, and at opposite ends of, the interface plane, wherein the card guides align the first interface card and second interface card with the interface plane.

4. A generic interface test adapter as defined in claim 2, wherein:

the interface frame includes sliding cams and an actuator mechanism for actuating the sliding cams; and

the pressure frame includes cam follower plates having angled cam slots associated with the sliding cams such that, when the actuator mechanism is in an engaged position, the pressure frame presses the either the first interface card or the second interface card, depending on whether the line replaceable unit or shop replaceable unit is under test, against the interface plane with sufficient force to provide electrical contact between the first end of the first field of contact pins and the first end of the second field of contact pins and the corresponding field of contact pads.

5. A generic interface test adapter as defined in claim 1, wherein the first field of contact pins and the second field of contact pins comprise spring-loaded metal probes.

6. A generic interface test adapter as defined in claim 1, wherein:

the interface plane includes at least one rf style contact pin having an axial center conductor and a coaxial shield; and

the first interface card and the second interface card each have a concentric pair of contact pads associated with the rf contact pin and an rf transmission line electrically coupled to the concentric pair of contact pads.

7. A generic interface test adapter as defined in claim 2, wherein the first connector includes a plurality of electrical connectors attached to the interface frame.