Successive approximation analog-to-digital converter using balanced charge integrating amplifiers

• US 5,793,322 A
• Filed: 11/07/1996
• Issued: 08/11/1998
• Est. Priority Date: 11/07/1995
• Status: Expired due to Term

• Current Assignee: California Institute of Technology
• Original Assignee: California Institute of Technology
• Inventors: Fossum, Eric R., Pain, Bedabrata, Zhou, Zhimin
• Primary Examiner(s): Young, Brian K.
• Application Number:
  US08/744,955
• Time in Patent Office: 642 Days
• Field of Search: 341/155, 341/161
• US Class Current: 341/161
• CPC Class Codes: H03M 1/403 using switched capacitors
• CPC Class Codes: H04N 25/53 Control of the integration time
• CPC Class Codes: H04N 25/616 involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
• CPC Class Codes: H04N 25/78 Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
• CPC Class Codes: H04N 3/155 Control of the image-sensor operation, e.g. image processing within the image-sensor

Abstract

An analog-to-digital converter for on-chip focal-plane image sensor applications. The analog-to-digital converter utilizes charge integrating amplifiers in a charge balancing architecture to implement successive approximation analog-to-digital conversion. This design requires minimal chip area and has high speed and low power dissipation for operation in the 2-10 bit range. The invention is particularly well suited to CMOS on-chip applications requiring many analog-to-digital converters, such as column-parallel focal-plane architectures.

Claims

1. An analog-to-digital converter comprising:

two signal inputs receiving two senses of a differential analog signal;

a reference voltage input receiving and storing a reference voltage;

a voltage to charge converter coupled to the signal and reference inputs generating differential and reference charges;

first and second charge integrating circuits, coupled to the voltage to charge converter, receiving and storing input charges from the voltage to charge converter, and generating an output signal proportional to the stored charge;

a comparator having two inputs respectively receiving outputs of said first and second charge integrating circuit and generating an output signal indicating which of said two inputs is larger;

said charge integrating circuits subtracting a portion of the reference charge from the charge stored in the charge integrating circuit having the larger stored charge as determined by the comparator; and

a register storing and outputting the results of a series of comparator outputs, each result representing a lesser significant new bit in an output digital word that represents the voltage of the differential analog signal.

2. An analog-to-digital converter as in claim 1 wherein when the first charge integrating circuit has the larger signal, a digital "one" is stored by the register, otherwise a digital "zero" is stored.

3. An analog-to-digital converter as in claim 1 wherein the charge integrating circuits include sample and reset input switches responsive to the comparator output to transfer a portion of the reference charge in the sample and hold capacitor to the charge integrating circuit having the larger signal.

4. An analog-to-digital converter as in claim 3 wherein said sample and hold comparators each carry an equal charge.

5. An analog-to-digital converter as in claim 1 wherein the predetermined fraction is one-half.

8. An imaging system according to claim 5 wherein the sample and hold capacitors include two charge sharing capacitors, one of which transfers one-half of the total charge to the charge integrating amplifier circuit, after which the charge in the second capacitor is shared with the first so each will have one-half the value prior to the transfer.

6. An imaging system comprising:

an array of image sensor pixels;

an input, receiving reset and sample output signals from individual pixels in the image sensor and also receiving an input reference voltage;

sample and hold capacitors coupled to the input and converting the output signals to respective charge values;

a reset charge integrating amplifier circuit coupled to the sample and hold capacitors receiving said reset input charge values, said reset charge integrating amplifier circuit having an output;

a sample charge integrating amplifier circuit coupled to the sample and hold capacitors receiving said sample input charge value signal, said sample charge integrating amplifier circuit having an output;

a comparator having reset and sample inputs, the reset input receiving the output of the reset charge integrating circuit and the sample input receiving the output of the sample charge integrating circuit, the comparator producing an output indicating which input is larger;

a switch, selectively opening and closing to allow the reference voltage to be stored as charge in the sample and hold capacitors;

the sample and reset charge integrating circuits including sample and reset input switches responsive to the comparator output to transfer a portion of the reference charge in the sample and hold capacitor to the charge integrating circuit having the larger signal as determined by said comparator;

wherein each charge integrating circuit subtracts the portion of the reference charge from the existing reset or sample charge therein, and wherein the comparator repeats the comparator determination for each new smaller value of charge integrating circuit output; and

a register storing and outputting a results of each comparator determination, each comparator determination representing a lesser significant new bit in the output digital word representing the differential voltage between the sample and reset inputs, such that the sample being larger represents a digital one and the reset being larger represents a digital zero.

7. The imaging system of claim 6 wherein said portion of the reference charge is one-half.

9. An imaging system according to claim 6 wherein said array of image sensors includes a column-parallel read output architecture.

10. An imaging system comprising:

an array of image sensors comprising an array of pixel sensors;

a column-parallel readout circuitry;

a plurality of successive approximation analog-to-digital converters on said substrate, each analog-to-digital converter comprising;

two inputs receiving a differential analog signal;

a reference voltage input receiving a reference voltage;

a voltage to charge converter coupled to the differential and reference inputs;

first and second charge integrating amplifier circuits, coupled to the voltage to charge converter receiving two input signals from the voltage to charge converter, and generating an output signal;

a comparator having two inputs receiving the output signal of each charge integrating amplifier circuit, wherein a corresponding charge integrating circuit subtracts a portion of the reference charge from the charge integrating circuit having the larger signal, and wherein the voltage to charge converter reduces the reference voltage each time a comparison is made by a predetermined fraction; and

a register storing and outputting the results of each comparison, each comparison representing a lesser significant new bit in the output digital word that represents the differential voltage between the sample and reset inputs, such that when the first charge integrating circuit has the larger signal, a digital "one" is stored, otherwise a digital "zero" is stored.

11. An imaging system according to claim 10, wherein each column has one associated analog-to-digital converter.

12. An imaging system according to claim 10, wherein each analog-to-digital converter is connected to more than one column.

13. A method of performing analog-to-digital conversion comprising:

receiving a differential analog signal;

receiving a reference voltage;

converting the differential and reference inputs into differential and reference charges respectively, integrating the differential analog signal and the reference voltage, and generating an output signal in response thereto;

comparing the differential analog signal with the reference voltage;

subtracting a portion of the reference charge from the compared signal having the larger signal, and reducing the reference voltage each time a comparison is made by a predetermined fraction; and

storing and outputting the results of each comparing as a digital word representing the value of the differential analog signal, each comparing representing a lesser significant new bit in the output digital word, such that when the differential analog signal has the larger signal, a digital "one" is stored, otherwise a digital "zero" is stored.

14. A method of performing analog-to-digital conversion comprising:

converting a first side of a differential signal to be digitized into a charge value;

transferring said charge to a first branch of a charge integrating amplifier circuit;

converting a reference voltage to a charge value;

splitting the reference charge value in half;

converting the second side of the differential signal to be digitized into a charge value;

transferring the second side charge value to a second branch of the charge integrating amplifier circuit;

comparing the value of the charge on the first branch of the charge integrating amplifier circuit with the one on the second branch;

transferring one half of the split reference charge to the charge integrating amplifier circuit branch with the lesser signal as determined in the comparing step, wherein the charge is increased by a value of one-half of the reference signal;

splitting the other one-half of the reference signal into two charges of one-fourth reference signal value;

repeating the comparing, transferring and splitting steps n-times and outputting a digital word containing n bits, wherein each bit represents which branch had the larger charge in the comparing step.