Micromirror type image forming apparatus and administration method for the same

• US 5,796,508 A
• Filed: 02/27/1997
• Issued: 08/18/1998
• Est. Priority Date: 02/28/1996
• Status: Expired due to Term

• Current Assignee: Fujifilm Corporation (Fujifilm Holdings Corporation)
• Original Assignee: Fuji Photo Film Co Limited (Fujifilm Holdings Corporation)
• Inventors: Suzuki, Kenji
• Primary Examiner(s): Font, Frank G.
• Assistant Examiner(s): Smith, Zandra V.
• Application Number:
  US08/807,357
• Time in Patent Office: 537 Days
• Field of Search: 355/37, 355/35, 355/41, 359/224, 359/855, 359/872, 345/84
• US Class Current: 359/224.1
• CPC Class Codes: B41J 2/465 using masks, e.g. light-switching masks
• CPC Class Codes: G01M 11/005 Testing of reflective surfaces, e.g. mirrors
• CPC Class Codes: G02B 26/0841 the reflecting element being moved or deformed by electrostatic means
• CPC Class Codes: G02B 26/105 with one or more pivoting mirrors or galvano-mirrors G02B26/101 takes precedence

Abstract

A digital micromirror device is provided with micromirrors disposed in matrix form. Each micromirror is changed between a valid reflection state and an invalid reflection state according to mirror drive data. In the valid reflection state, reflected spot light is guided to an image forming optical path and a photographic paper is exposed. In the invalid reflection state, reflected spot light is guided to an eliminating optical path. A photodetector performing a photometry of the spot light is disposed at the eliminating optical path. The micromirrors are set in the invalid reflection state one by one and the reflected spot light is measured by the photodetector so as to examine the existence of a faulty micromirror or scatter of reflectance of the micromirror. All micromirrors are set in the invalid reflection state at the same time and an output of the photodetector is inspected so as to examine whether light amount of a light source is proper or improper.

Claims

1. A micromirror type image forming apparatus including a micromirror device having at least one micromirror array in which a plurality of micromirrors are disposed and a light source for illuminating said micromirror device, each of said micromirrors is changeable between a valid reflection state and an invalid reflection state, in said valid reflection state, light from said light source being reflected toward an image forming optical path and in said invalid reflection state, said light being reflected toward an eliminating optical path, said micromirror type image forming apparatus comprising:

a photometry unit for measuring photometric values of said light reflected by said micromirror in said invalid reflection state, said photometry unit being disposed at said eliminating optical path.

2. A micromirror type image forming apparatus according to claim 1, wherein said photometry unit comprises a diffusion member and a photodetector, said diffusion member diffusing said light from said micromirror and said photodetector being disposed at rear side of said diffusion member.

3. A micromirror type image forming apparatus according to claim 1, wherein said photometry unit comprises an image formation optical system and an image sensor having a plurality of pixels which transfer incident-light to electricity, said image sensor being constituted of at least one line pixels and disposed at an image formation face of said image formation optical system.

4. A micromirror type image forming apparatus according to claim 3, wherein said micromirrors and said pixels are disposed in a matrix respectively.

5. A micromirror type image forming apparatus according to claim 3, wherein said micromirrors and said pixels are disposed in a line respectively.

6. A micromirror type image forming apparatus according to claim 4 or 5, wherein a number of said micromirrors is same with that of said pixels so as to correspond to each other one by one.

7. A micromirror type image forming apparatus according to claim 1, said micromirror device is illuminated by said light from said light source via a lens and a balance filter, said lens paralleling said light and said balance filter performing shading correction.

8. A micromirror type image forming apparatus according to claim 1, further comprising a controller disposed at the eliminating optical path, the controller being operative to determine a micromirror fault by comparing photometric values measured by the photometry unit, and upon detection of the micromirror fault, to move the micromirror device to correct the micromirror fault.

9. An administration method for a micromirror type image forming apparatus including a micromirror device in which a plurality of micromirrors are disposed, and a light source for illuminating said micromirror device, each of said micromirrors is changeable between a valid reflection state and an invalid reflection state, in said valid reflection state, light from said light source being reflected toward an image forming optical path and in said invalid reflection state, said light being reflected toward an eliminating optical path, said administration method comprising the steps of:

setting all of said micromirrors in said invalid reflection state;

performing photometry of light reflected by all of said micromirrors with a photometry unit disposed at said eliminating optical path; and

adjusting luminance of light illuminating said micromirror device such that a photometry value obtained by said photometry unit corresponds to a basic value.

10. An administration method for a micromirror type image forming apparatus including a micromirror device in which a plurality of micromirrors are disposed and a light source for illuminating said micromirror device, each of said micromirrors is changeable between a valid reflection state and an invalid reflection state, in said valid reflection state, light from said light source being reflected toward an image forming optical path and in a said invalid reflection state, said light being reflected toward an eliminating optical path, said administration method comprising the steps of:

changing each of said micromirrors between said valid reflection state and said invalid reflection state;

performing photometry of reflected light from each of said micromirrors individually with a photometry unit disposed at said eliminating optical path; and

detecting a faulty micromirror in an abnormal reflection state by an output signal of said photometry unit.

11. An administration method for a micromirror type image forming apparatus according to claim 10, wherein said micromirror is changed one by one in order and said reflected light of said micromirror is measured with said photometry unit.

12. An administration method for a micromirror type image forming apparatus according to claim 10, wherein said photometry unit has a plurality of pixels disposed in a manner that each of said pixels corresponds to each of said micromirrors and said micromirrors are changed at the same time.

13. An administration method for a micromirror type image forming apparatus according to claim 10, further comprising the step of:

displaying a position of said faulty micromirror on a display.

14. An administration method for a micromirror type image forming apparatus including a micromirror device in which a plurality of micromirrors are disposed and a light source for illuminating said micromirror device, each of said micromirrors is changeable between a valid reflection state and an invalid reflection state, in said valid reflection state, light from said light source being reflected toward an image forming optical path and in said invalid reflection state, said light being reflected toward an eliminating optical path, said administration method comprising the steps of:

setting all of said micromirrors in one state of said valid reflection state and said invalid reflection state;

obtaining a first photometry value by measuring reflected light from said micromirrors in said one state with a photometry unit disposed at said eliminating optical path;

setting one of said micromirrors in the other state of said valid reflection state and said invalid reflection state;

obtaining a second photometry value by measuring reflected light from said micromirrors in which one of said micromirrors is set in said other state with said photometry unit; and

comparing said first photometry value with said second photometry value in order to judge said micromirror as faulty when said both photometry values coincide with each other.

15. An administration method for a micromirror type image forming apparatus including a micromirror device in which a plurality of micromirrors are disposed and a light source for illuminating said micromirror device, each of said micromirrors is changeable between a valid reflection state and an invalid reflection state, in said valid reflection state, light from said light source being reflected toward an image forming optical path and in said invalid reflection state, said light being reflected toward an eliminating optical path, said administration method comprising the steps of:

setting each of said micromirrors in said invalid reflection state;

performing photometry of reflected light from each of said micromirrors with a photometry unit disposed at said eliminating optical path; and

obtaining scatter relative to reflectance of each of said micromirrors.

16. An administration method for a micromirror type image forming apparatus including a micromirror device in which a plurality of micromirrors are disposed and a light source for illuminating said micromirror device, each of said micromirrors is changeable between a valid reflection state and an invalid reflection state, in said valid reflection state, light from said light source being reflected toward an image forming optical path and in said invalid reflection state, said light being reflected toward an eliminating optical path, said administration method comprising the steps of:

setting all of said micromirrors in one state of said valid reflection state and said invalid reflection state;

obtaining a first photometry value by measuring reflected light from said micromirrors in said one state with a photometry unit disposed at said eliminating optical path;

setting one of said micromirrors in the other state of said valid reflection state and said invalid reflection state;

obtaining a second photometry value by measuring reflected light from said micromirrors in which one of said micromirrors is set in said other state with said photometry unit;

obtaining a difference between said first photometry value and said second photometry value;

determining an average value of said differences obtained regarding to all of said micromirrors;

obtaining scatter relative to reflectance of each of said micromirrors in accordance with gaps between said differences and said average value.

17. A micromirror type image forming apparatus including a micromirror device having at least one micromirror array in which a plurality of micromirrors are disposed and a light source for illuminating said micromirror device, each of said micromirrors is changeable between a valid reflection state and an invalid reflection state, in said valid reflection state, light from said light source being reflected toward an image forming optical path and in said invalid reflection state, said light being reflected toward an eliminating optical path, said micromirror type image forming apparatus comprising:

a photometry unit for performing photometry of said light reflected by said micromirror in said invalid reflection state, said photometry unit being disposed at said eliminating optical path;

said micromirror device being illuminated by said light from said light source via a lens and a balance filter, said lens paralleling said light and said balance filter performing shading correction.