Method for generating an optimized integrated circuit cell library

• US 5,802,349 A
• Filed: 01/22/1996
• Issued: 09/01/1998
• Est. Priority Date: 01/22/1996
• Status: Expired due to Fees

• Current Assignee: Freescale Semiconductor, Inc. (NXP Semiconductors NV)
• Original Assignee: Motorola, Inc. (Motorola Solutions, Inc.)
• Inventors: Sirichotiyakul, Supamas, Rigg, Dana M., Chase, Mark, Chamoun, Sleiman, Tolar, James H. II
• Primary Examiner(s): Teska, Kevin J.
• Assistant Examiner(s): MOHAMED, AYNI Y
• Application Number:
  US08/589,240
• Time in Patent Office: 953 Days
• Field of Search: 364/488-491, 364/578, 395/500
• US Class Current: 716/103
• CPC Class Codes: G06F 30/30 Circuit design
• CPC Class Codes: G06F 30/33 Design verification, e.g. functional simulation or model checking
• CPC Class Codes: G06F 30/3308 using simulation

Abstract

A cell library (21) is optimized for specific operating characteristics. A stimulus file (23) is divided into a number of simulation run files. The simulation run files (27) are distributed to more than one computer work station so that the simulation of the cell occurs in parallel. The netlist (24) of each cell is parameterized to allow the cell to be changed and resimulated to better meet the specific operating characteristics. A cost function (32) is provided which uses the results of a transistor level simulation to calculate the quality of the cell design relative to the specific operating characteristics. Simulated annealing (34) is used to generate new simulation parameter values from a cost generated from the cost function (32). The cell is resimulated a number of times to optimize for the specific operating characteristics and the best design is retained for a new cell library (39). The process is repeated for each cell of the cell library (21).

Claims

1. A method for generating an integrated circuit cell library optimized for specific operating characteristics, the method comprising the steps of:

(a) providing a cost fiction;

(b) using simulated annealing to generate parameter values for simulation of a cell of the integrated circuit cell library;

(c) simulating said cell in parallel with more than one computer work station wherein said more than one computer work station simultaneously runs a transistor level simulation of said cell;

wherein said simulating step comprises the steps of;

generating a parameterized netlist of said cell; and

reading said parameterized netlist to said more than one computer work station;

(d) providing simulation results from said more than one computer work station to said cost function;

(e) calculating a cost which corresponds to a quality of said cell relative to the specific operating characteristics;

(f) providing said cost for a simulated annealing process to generate new parameter values for simulation;

(g) resimulating said cell with said new parameter values;

(h) providing simulation results from simulations with said new parameter values to said cost function; and

(i) calculating a cost from said simulation results with said new parameter values.

2. The method as recited in claim 1 further including a step of generating a stimulus file for said cell of the integrated circuit cell library.

3. The method as recited in claim 2 further including the steps of:

dividing said stimulus file into a plurality of simulation run files; and

distributing said plurality of simulation run files to said more than one work station.

4. The method as recited in claim 1 further including the steps of:

(j) repeating step (f); and

(k) repeating steps (g), (h), and (i).

5. The method as recited in claim 4 further including the steps of:

(l) selecting a new library cell having parameter values best optimized for the specific operating characteristics; and

(m) incorporating said new library cell in a new integrated circuit cell library.

6. The method as recited in claim 5 further including the steps of:

(n) repeating steps (a), (b), (c), (d), and (e);

(o) repeating step (f);

(p) repeating steps (g), (h), and (i);

(q) repeating steps (j) and (k); and

(r) repeating steps (l) and (m)

for each cell of the integrated circuit cell library.

7. A method of generating an integrated circuit cell library optimized for specific operating characteristics comprising the steps of:

(a) generating a stimulus file for a cell of the integrated circuit cell library;

(b) generating a parameterized netlist of said cell for a transistor level simulation of said cell;

(c) having more than one computer work station read said parameterized netlist of said cell;

(d) dividing said stimulus file into a plurality of simulation run files;

(e) distributing said plurality of simulation run files to said more than one computer work station;

(f) simulating said cell simultaneously at each of said more than one computer work station;

(g) evaluating simulation results from said more than one computer work station;

(h) generating new parameter values for said parameterized netlist based on previous simulation results; and

(i) providing a cost function;

wherein said step of evaluating simulation results from said more than one computer work station includes a step of;

(j) providing said simulation results to said cost function to generate a cost, said cost corresponds to a quality of said cell relative to the specific operating characteristics; and

wherein said step of generating new parameters for said parameterized netlist includes a step of;

(k) applying simulated annealing to said cost to generate new parameter values.

8. The method as recited in claim 7 further including the steps of:

(l) repeating simulation of said cell for each new set of parameter values;

(m) stopping simulation of said cell after a predetermined number of simulations;

(n) selecting parameter values of said cell producing a best cost; and

(o) generating a new library optimized for the specific operating characteristics wherein a new library cell having parameter values corresponding to said best cost is included in said new library.

9. The method as recited in claim 8 further including the steps of;

(p) repeating steps (a), (b), (c), (d), (e), (f), (g), and (h);

(q) repeating step (i); and

(r) repeating steps (l), (m), (n), and (o)

for each cell of the integrated circuit cell library.

10. A method of automating the process of generating a cell library for specific operating characteristics, the method comprising the steps of:

(a) generating a stimulus file for a cell of the cell library;

(b) generating a parameterized netlist of said cell;

(c) reading said parameterized netlist to more than one computer work station;

(d) dividing said stimulus file into a plurality of simulation run files wherein each simulation run file is a simulatable portion of said stimulus file;

(e) distributing a simulation run file to each of said more than one computer work station;

(f) providing a cost unction for evaluating simulation results for the specific operating characteristics of said cell;

(g) simulating said cell with said more than one computer work station;

(h) generating a cost which corresponds to a quality of said cell meeting the specific operating characteristics by providing simulation results to said cost function;

(i) Applying simulated annealing to said cost to generate new parameter values to optimize said cell for the specific operating characteristics;

(j) repeating steps f, g, and h with said new parameters;

(k) stopping simulation of said cell after a predetermined number of simulations; and

(l) repeating steps a, b, c, d, e, f, g, h, i, j, and k for each cell of the integrated circuit cell library.