Method of extracting contours using multifractal analysis

• US 5,809,169 A
• Filed: 03/15/1996
• Issued: 09/15/1998
• Est. Priority Date: 03/17/1995
• Status: Expired due to Fees

• Current Assignee: Alcatel SA (Nokia Corporation)
• Original Assignee: Alcatel Alsthom Compagnie Generale d'Electricite (Nokia Corporation)
• Inventors: Renouard, Frederic, Rezzouk, Jamal
• Primary Examiner(s): Tran, Phuoc
• Application Number:
  US08/616,344
• Time in Patent Office: 914 Days
• Field of Search: 382/199, 382/249, 382/108, 382/202, 382/204
• US Class Current: 382/199
• CPC Class Codes: G06T 2207/10032 Satellite or aerial image; Remote sensing
• CPC Class Codes: G06T 2207/30181 Earth observation
• CPC Class Codes: G06T 7/12 Edge-based segmentation
• CPC Class Codes: G06T 7/149 involving deformable models, e.g. active contour models
• CPC Class Codes: G06V 20/13 Satellite images

Abstract

A method of extracting a contour of a contrasted area in a digitized image made up of pixels having different intensity levels defining the contrasted area is based on minimizing the energy of an initial active contour to which are applied stresses derived from a potential image obtained by processing the image. The potential image is obtained from a multifractal analysis of the image so that each element of the potential image is representative of a local fractal dimension in the locality of a corresponding pixel in the image. This improves the behavior of the active contour when it is deformed by the stresses.

Claims

1. Method of extracting a contour of a contrasted area in a digitized image made up of pixels having different intensity levels defining said contrasted area, said method being based on minimizing the energy of an initial active contour to which are applied stresses derived from a potential image obtained by processing said image, wherein said potential image is obtained from a multifractal analysis of said image so that each element of said potential image is representative of a local fractal dimension in the locality of a corresponding pixel in said image.

2. Method according to claim 1 wherein said local fractal dimension is an estimate of the Holder coefficient calculated from a multifractal measurement based on counting pixels in different localities centered on the pixel of interest having an intensity near that of said pixel of interest.

3. Method according to claim 1 wherein said local fractal dimension is an estimate of the Holder coefficient calculated from a multifractal measurement based on counting pixels in different localities centered on the pixel of interest having an intensity near that of said pixel of interest and contiguous with the latter.

4. Method according to claim 2 including a step of hysteresis thresholding of said local fractal dimensions to obtain said potential image.

5. Method according to claim 3 including a step of hysteresis thresholding of said local fractal dimensions to obtain said potential image.