Synchronous semiconductor memory device and synchronous memory module

• US 5,815,462 A
• Filed: 02/12/1997
• Issued: 09/29/1998
• Est. Priority Date: 06/27/1996
• Status: Expired due to Fees

• Current Assignee: Mitsubishi Denki Kabushiki Kaisha (Mitsubishi Electric Corporation), Mitsubshi Electric Engineering Company Limited (Mitsubishi Electric Corporation)
• Original Assignee: Mitsubishi Denki Kabushiki Kaisha (Mitsubishi Electric Corporation), Mitsubshi Electric Engineering Company Limited (Mitsubishi Electric Corporation)
• Inventors: Murai, Yasumitsu, Sawada, Seiji, Araki, Takashi, Konishi, Yasuhiro, Iwamoto, Hisashi
• Primary Examiner(s): Hoang, Huan
• Application Number:
  US08/800,905
• Time in Patent Office: 594 Days
• Field of Search: 365/233, 365/230.01, 365/230.08, 365/189.05, 365/230.04
• US Class Current: 365/233.11
• CPC Class Codes: G11C 7/1039 using pipelining techniques, i.e. using latches between functional memory parts, e.g. row/column decoders, I/O buffers, sense amplifiers
• CPC Class Codes: G11C 7/1072 for memories with random access ports synchronised on clock signal pulse trains, e.g. synchronous memories, self timed memories
• CPC Class Codes: G11C 7/22 Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
• CPC Class Codes: G11C 7/225 Clock input buffers

Abstract

A first clock signal for controlling the inputting of an external signal and for controlling internal operation and a second clock signal for controlling data output are applied to separate clock input nodes, respectively. Data output timing with respect to the first clock signal can be adjusted and thus clock access time and data hold time can be adjusted. Internal data read path is pipelined to include a first transfer gate responsive to the first clock signal for transferring internal read data and a second transfer gate responsive to the second clock signal for transferring the internal read data from the first transfer gate for external outputting through an output buffer. A synchronous semiconductor memory device is provided capable of setting clock access time and data hold time at the optimal values depending on the application and of reducing the clock access time.

Claims

1. A synchronous semiconductor memory device comprising:

a first node receiving an externally applied first clock signal applied repetitively;

a first clock buffer for receiving the first clock signal to generate a first internal clock signal corresponding to the first clock signal;

input buffer means receiving an externally applied control signal and address signal in synchronization with said first internal clock signal applied from said first clock buffer to produce an internal control signal and an internal address signal for selecting a memory cell in a memory cell array including a plurality of memory cells;

a second node receiving an externally applied second clock signal, separate from said first clock signal and repetitively applied in parallel with said first clock signal;

a second clock buffer for receiving the second clock signal to produce a second internal clock signal corresponding to the second clock signal; and

output buffer means receiving and buffering internal read data read from the selected memory cell to produce and output external read data to an output node in synchronization with said second internal clock signal applied from the second clock buffer.

2. The synchronous semiconductor memory device according to claim 1, wherein the first clock signal is the same in frequency as, but different in phase from the second clock signal.

3. The synchronous semiconductor memory device according to claim 1, wherein the second clock signal precedes in phase the first clock signal, but is the same in frequency as the first clock signal.

4. The synchronous semiconductor memory device according to claim 1, further comprising means for activating an output enable signal in synchronization with said second internal clock signal, wherein

said output buffer means includes means activated in response to activation of said output enable signal for externally outputting said received internal read data.

5. The synchronous semiconductor memory device according to claim 1, wherein

said first clock buffer includes means for receiving the first clock signal for producing a one shot pulse signal of a predetermined pulse width in accordance with a leading edge of said first clock signal for application to said input buffer means as the first internal clock signal;

and

said second clock buffer includes means for receiving the second clock signal for producing a one shot pulse signal of the predetermined pulse width in accordance with a leading edge of said second clock signal for application to said output buffer means as the second internal clock signal.

6. The synchronous semiconductor memory device according to claim 1, further comprising:

a read data bus;

internal read means for selecting a memory cell of said memory cell array according to the internal control signal and the internal address signal from said input buffer means, for transmitting data of the selected memory cell onto said read data bus as said internal read data, said data of the selected memory cell being sensed and amplified by a sense amplifier; and

first transfer gate means provided between said read data bus and said output buffer means and turned on in response to said second internal clock signal for transferring the internal read data on said read data bus to said output buffer means.

7. The synchronous semiconductor memory device according to claim 6, further comprising first latch means provided between said first transfer gate means and said output buffer means for latching and transferring data transferred from said first transfer gate means to said output buffer means.

8. The synchronous semiconductor memory device according to claim 6, further comprising second latch means provided between said internal read means and said first transfer gate means for latching and transferring the internal read data read out by said internal read means on said read data bus to said first transfer gate means.

9. The synchronous semiconductor memory device according to claim 8, further comprising second transfer gate means provided between said internal read means and said second latch means and turned on after said first transfer gate means is turned off for transferring internal read data read out by said internal read means to said second latch means.

10. The synchronous semiconductor memory device according to claim 9, wherein said internal read means outputs said internal read data, when said first internal clock signal attains a first level, onto said read data bus, and further comprising:

control means responsive to turning off of said first transfer gate means and to outputting of said internal read data of said internal read means for turning on said second transfer gate means.

11. The synchronous semiconductor memory device according to claim 9, further comprising control means taking a logic product of the first internal clock signal and an inverted version of the second internal clock signal for turning on said second transfer gate means in accordance with a signal indicating a result of the logic product.

12. A synchronous semiconductor memory device comprising:

a first node for receiving an externally applied first clock signal applied repetitively;

a second node for receiving an externally applied second clock signal repetitively applied in parallel with said first clock signal when the second clock signal is applied to the synchronous semiconductor memory device;

input buffer circuitry receiving an externally applied control signal and address signal in synchronization with said first clock signal to produce an internal control signal and an internal address signal for selecting a memory cell in a memory cell array including a plurality of memory cells;

clock selection circuitry for selecting a clock signal applied to one of the first and second nodes; and

output buffer circuitry for receiving and buffering internal read data read from the selected memory cell to produce and output external read data externally in synchronization with the clock signal selected by said clock selection circuitry.

13. The synchronous semiconductor memory device according to claim 12, wherein

said first and second nodes each are a lead for receiving an externally applied signal, and wherein

said clock selection circuitry includes

a pad provided corresponding to said second node, and

an interconnection line alternatively selecting and electrically connecting one of said first and second nodes to said pad.

14. The synchronous semiconductor memory device according to claim 12, wherein said clock selection circuitry includes:

a first switching element coupled to receive said first clock signal from said first node;

a second switching element coupled to receive said second clock signal applied from said second node; and

switching control means coupled to an internal node receiving a fixed voltage for alternatively turning on one of said first and second switching elements according to a fixed potential on said internal node.

15. The synchronous semiconductor memory device according to claim 12, wherein said clock selection circuitry includes:

a first switching element coupled to receive said first clock signal from said first node;

a second switching element coupled to receive said second clock signal applied from said second node; and

control means responsive to an external mode designating signal for alternatively turning on one of said first and second switching elements.

16. The synchronous semiconductor memory device according to claim 12, wherein said clock selection circuitry includes:

a first transistor coupled to said first node,

a second transistor coupled to said second node,

a data register for storing latency data indicating the number of clock cycles required from application of an access command instructing reading out of data to an external outputting of valid data, and

means coupled between said data register and said first and second transistors for alternatively turning on one of said first and second transistors in accordance with said latency data.

17. A synchronous memory module comprising:

a plurality of synchronous semiconductor memory devices each including (a) a first pad, (b) input buffer means for incorporating a control signal and an address signal externally applied in synchronization with a clock signal externally applied to said first pad to produce an internal control signal and an internal address signal for selecting a memory cell in a memory array including a plurality of memory cells, (c) a second pad provided separately from said first pad, and (d) output means for buffering an internal read data read from the selected memory cell to produce and externally output thus produced read data in synchronization with a clock signal externally applied to said second pad; and

internal clock generating means receiving a repetitively applied external clock signal for producing first and second clock signals in synchronization with the external clock signal, and for commonly applying said first clock signal to said first pad of each of said plurality of synchronous semiconductor memory devices and commonly applying said second clock signal to said second pad of each of said plurality of synchronous semiconductor memory devices.

18. The synchronous memory module according to claim 17, wherein said first and second clock signals are a same common clock signal.

19. The synchronous memory module according to claim 17, wherein said first clock signal is different in phase from and the same in frequency as said second clock signal.

20. The synchronous memory module according to claim 19, wherein said second clock signal is in advance in phase of said first clock signal.