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Rapid non-invasive optical analysis using broad bandpass spectral processing

  • US 5,818,048 A
  • Filed: 11/03/1994
  • Issued: 10/06/1998
  • Est. Priority Date: 07/15/1992
  • Status: Expired due to Fees
First Claim
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1. An apparatus for determining, the concentration of a constituent of interest in a sample which has transmittance, emission or reflectance in a selected region of the spectrum comprising:

  • a radiation source which generates a spectrum of illuminating radiation for illuminating at least a portion of said sample;

    detection means in the form of three or more detectors adapted to generate an output, each of said detectors having a spectral response in a portion of said spectrum of illuminating radiation emitted by said radiation source, at least one of said detectors having a broadband spectral response, at least one of said detectors further having an overlap in spectral response with another of said detectors; and

    analysis means for analyzing said outputs from said detectors to generate a signal indicative of the concentration of said constituent of interest in said sample.

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