Apparatus and method for determining the speed of a semiconductor chip

• US 5,818,250 A
• Filed: 07/03/1996
• Issued: 10/06/1998
• Est. Priority Date: 07/03/1996
• Status: Expired due to Term

• Current Assignee: Hewlett Packard Enterprise Development LP (Hewlett-Packard Enterprise Company)
• Original Assignee: Silicon Graphics Incorporated (Graphics Properties Holdings, Inc.)
• Inventors: Chao, Chia-Chi, Pak, Edward Tonguk, Yoon, James Euisik, Yeung, Norman Kung-Po
• Primary Examiner(s): BROCK, MICHAEL J
• Application Number:
  US08/675,849
• Time in Patent Office: 825 Days
• Field of Search: 324/763, 324/765, 324/73.1, 324/537, 438/18
• US Class Current: 324/762.02
• CPC Class Codes: G01R 31/30 Marginal testing, e.g. by varying supply voltage testing computers during standby operation or idle time G06F11/22
• CPC Class Codes: G06F 11/2236 to test CPU or processors
• CPC Class Codes: G06F 2201/88 Monitoring involving counting

Abstract

A method of testing a speed of a semiconductor chip. A test time interval is specified. A test oscillator is fabricated as part of the semiconductor under test. The test oscillator contains elements that simulate a critical path of the semiconductor chip. Hence, the test oscillator'"'"'s frequency is sensitive to process variations. The number of cycles of the oscillator occurring during the test time interval is counted. Based upon this count value, the speed of the semiconductor chip under test is determined.

Claims

1. A method of testing a speed of a semiconductor chip, comprising the steps of:

starting a time interval;

running an oscillator, wherein the oscillator is included as part of the semiconductor chip being tested;

ending the time interval;

determining a number of cycles of the oscillator that had occurred during the time interval;

determining the speed of the semiconductor chip based upon the number of cycles of the oscillator;

loading a test value into a counter;

incrementing the counter for each cycle of the oscillator during the time interval;

determining whether the counter overflows at the end of the time interval, wherein the semiconductor chip passes the test if the counter had overflowed and the semiconductor chip fails the test if the counter did not overflow;

increasing the test value repeatedly until the semiconductor chip fails the test.

2. The method of claim 1 further comprising the steps of:

loading a test value into a memory;

incrementing a counter for each cycle of the oscillator during the time interval;

comparing a counter value stored in the counter to the test value, wherein the semiconductor chip passes the test if the counter value is greater than or equal to the test value and the semiconductor chip fails the test if the counter value is less than the test value.

3. The method of claim 1, wherein the oscillator is comprised of a plurality of elements that simulate a critical path of the semiconductor chip being tested.

4. The method of claim 3, wherein the elements include an inverter, a multiplexer, a NAND gate, and a NOR gate.

5. The method of claim 3, wherein the elements include a pass gate, a stacked-P structure, and a stacked-N structure.

6. The method of claim 1, wherein the oscillator is comprised of a ring oscillator.

7. The method of claim 1 further comprising the step of converting the number of cycles of the oscillator to a frequency of operation corresponding to the semiconductor chip.

8. The method of claim 1, wherein the oscillator is comprised of a plurality of elements having small device sizes which render the elements more sensitive to process variations.

9. An apparatus for testing an operational speed of the semiconductor chip, comprising:

a timer for indicating a time interval;

an oscillator running at a test frequency;

a counter coupled to the oscillator, wherein the counter is incremented for each cycle of the oscillator during the time interval, wherein a faster semiconductor chip would result in more counts counted by the counter than a slower semiconductor chip;

a circuit coupled to the counter for determining the speed of the semiconductor chip based upon a count value stored in the counter, wherein a test value is loaded into the counter and a pass condition is indicated if the counter overflows at the end of the time interval;

otherwise, a fail condition is indicated if the counter does not overflow at the end of the time interval.

10. The apparatus of claim 9, wherein a test value is loaded into a memory and the semiconductor chip passes the test if the counter value is greater than or equal to the test value and the semiconductor chip fails the test if the counter value is less than the test value.

11. The apparatus of claim 9, wherein the oscillator is comprised of a plurality of elements that simulate a critical path of the semiconductor chip being tested.

12. The apparatus of claim 11, wherein the elements include an inverter, a multiplexer, a NAND gate, and a NOR gate.

13. The apparatus of claim 11, wherein the elements include a pass gate, a stacked-P structure, and a stacked-N structure.

14. The apparatus of claim 9, wherein the oscillator is comprised of a ring oscillator.

15. The apparatus of claim 9 further comprising a circuit coupled to the counter for converting the number of cycles of the oscillator to a frequency of operation corresponding to the semiconductor chip.

16. The apparatus of claim 9, wherein the oscillator is comprised of a plurality of elements having small device sizes which render the elements more sensitive to process variations.

17. A method of testing a speed of a semiconductor chip, comprising the steps of:

starting a time interval;

running an oscillator, wherein the oscillator is included as part of the semiconductor chip being tested;

ending the time interval;

determining a number of cycles of the oscillator that had occured during the time interval;

determining the speed of the semiconductor chip based upon the number of cycles of the oscillator;

loading a test value into a counter;

incrementing the counter for each cycle of the oscillator during the time interval;

determining whether the counter overflows at the end of the time interval, wherein the semiconductor chip passes the test if the counter had overflowed and the semiconductor chip fails the test if the counter did not overflow;

repeatedly increasing the test value until the semiconductor chip fails the test.

18. An apparatus for testing an operational speed of the semiconductor chip, comprising:

a timer for indicating a time interval;

an oscillator running at a test frequency;

a counter coupled to the oscillator, wherein the counter is incremented for each cycle of the oscillator during the time interval, wherein a faster semiconductor chip would result in more counts counted by the counter than a slower semiconductor chip;

a circuit coupled to the counter for determining the speed of the semiconductor chip based upon a count value stored in the counter, wherein a test value is loaded into the counter and a pass condition is indicated if the counter overflows at the end of the time interval;

otherwise, a fail condition is indicated if the counter does not overflow at the end of the time interval and, wherein the test value is incrementally increased until the semiconductor chip fails the test.