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Particle analysis system and method

  • US 5,818,583 A
  • Filed: 11/08/1996
  • Issued: 10/06/1998
  • Est. Priority Date: 11/08/1996
  • Status: Expired due to Term
First Claim
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1. A method of particle analysis, comprising:

  • (a) exposing a number of particles in a particle suspension to an incident light with a time-varying intensity, the particles being sufficiently close to one another to multiply scatter light;

    (b) detecting multiply scattered light from the particles in response to the incident light to provide a first value corresponding to a measurement of an optical property of the particles, the first value being determined as a function of time-dependent propagation of the multiply scattered light through the particle suspension;

    (c) establishing a second value corresponding to an estimation of at least one of volume fraction and size distribution of the particles;

    (d) calculating a third value as a function of the second value, the third value corresponding to a prediction of the optical property based on the estimation;

    (e) comparing the first and third values to establish an error;

    (f) changing the second value as a function of the error; and

    (g) repeating said calculating, comparing, and changing until the error reaches a desired minimum.

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