System for providing in-situ temperature monitoring and temperature control of a specimen being exposed to plasma environments

• US 5,821,502 A
• Filed: 07/01/1996
• Issued: 10/13/1998
• Est. Priority Date: 07/01/1996
• Status: Expired due to Fees

• Current Assignee: Rockwell International Corporation
• Original Assignee: Boeing North American Incorporated (The Boeing Co.)
• Inventors: Lukins, Ronald E., Cooksey, Martin P.
• Primary Examiner(s): Paschall, Mark H.
• Application Number:
  US08/673,526
• Time in Patent Office: 834 Days
• Field of Search: 219/121.41, 219/121.44, 219/121.43, 219/121.48, 219/496, 219/497, 219/494, 356/311-316, 356/244, 156/345, 315/111.21, 315/111.51, 315/111.31
• US Class Current: 219/496
• CPC Class Codes: B23K 10/02 Plasma welding

Abstract

A housing provides temperature monitoring and temperature control of a specimen, while the specimen is being exposed to plasma environments for in-situ reactivity studies or other plasma processing purposes. The housing is adaptable for use with a temperature controller and a pressure measurement device. The housing includes a temperature monitoring mechanism and temperature control connections. The temperature monitoring mechanism provides in-situ specimen temperature indications. It includes a first enclosure having a specimen supporting portion on an exterior surface thereof. A fluid conduit has a first end in fluid communication with an interior portion of the first closure. A second enclosure has an interior portion thereof in fluid communication with a second end of the fluid conduit. The second enclosure includes the ability for attachment to a pressure measurement device. Temperature indications of a test specimen positioned on the specimen supporting portion are correlated with pressures in the first and second enclosures. The correlations provide commensurate indications of pressure to the pressure measurement device to provide the in-situ specimen temperature indications. The temperature control connections allow use with a temperature controller for providing a desired temperature of the specimen supporting portion.

Claims

1. A housing for providing temperature monitoring and temperature control of a specimen, while the specimen is being exposed to plasma environments for in-situ reactivity studies or other plasma processing purposes, said housing being adaptable for use with a temperature controller and a pressure measurement device, said housing comprising:

a) temperature monitoring means for providing in-situ specimen temperature indications, said temperature monitoring means comprising;

i) a first enclosure having a specimen supporting portion on an exterior surface thereof;

ii) a fluid conduit having a first end in fluid communication with an interior portion of said first enclosure; and

iii) a second enclosure having an interior portion thereof in fluid communication with a second end of said fluid conduit, said second enclosure including means for attachment to a pressure measurement device;

wherein temperature indications of a test specimen positioned on said specimen supporting portion are correlated with pressures in said first and second enclosures based upon mathematical relationships therebetween, said correlations providing commensurate indications of pressure to said pressure measurement device to provide said in-situ specimen temperature indications; and

b) temperature control connection means for providing connection to a temperature controller for providing a desired temperature of said specimen supporting portion.

2. The apparatus of claim 1, further comprising:

means for providing diagnostic instrumentation to said housing for accessing a portion of said housing adjacent to, and in fluid communication with, a third enclosure containing said specimen.

3. The apparatus of claim 1, wherein said housing comprises:

a main portion including said first enclosure, said fluid conduit, and said second enclosure, said main portion further including an outwardly extending flange having a seal thereon, said flange for providing desired positioning of said third enclosure in a plasma chamber.

4. The apparatus of claim 3, wherein said housing further comprises:

a cap connectable to said main portion including means for providing diagnostic instrumentation to said housing for accessing a portion of said housing adjacent to and in fluid communication with a third enclosure containing said specimen.

5. The apparatus of claim 4, further including a biasing grid positionable relative to said cap, so as to form a portion of said third enclosure, said biasing grid for altering the electromagnetic fields and charged particle distribution adjacent to the specimen.

6. The apparatus of claim 3, wherein said means for providing diagnostic instrumentation comprises a plurality of conduits extending through said cap for providing access to sensors.

7. A system for providing temperature monitoring and temperature control of a specimen, while the specimen is being exposed to plasma environments for in-situ reactivity studies or other plasma processing purposes, comprising:

a) a housing, comprising;

i) temperature monitoring means for providing in-situ specimen temperature indications, said temperature monitoring means comprising;

a first enclosure having a specimen supporting portion on an exterior surface thereof;

a fluid conduit having a first end in fluid communication with an interior portion of said first enclosure; and

a second enclosure having an interior portion thereof in fluid communication with a second end of said fluid conduit, said second enclosure including means for attachment to a pressure measurement device;

wherein temperature indications of a test specimen positioned on said specimen supporting portion are correlated with pressures in said first and second enclosures based upon mathematical relationships therebetween, said correlations providing commensurate indications of pressure to said pressure measurement device to provide said in-situ specimen temperature indications; and

ii) temperature control connection means for providing connection to a temperature controller for providing a desired temperature of said specimen supporting portion;

b) a pressure measurement device attached to said second enclosure; and

c) a temperature controller attached to said temperature control connection means.

8. The apparatus of claim 7 further comprising:

means for providing diagnostic instrumentation to said housing for accessing a portion of said housing adjacent to, and in fluid communication with, a third enclosure containing said specimen.

9. The apparatus of claim 7, wherein said housing comprises:

a main portion including said first enclosure, said fluid conduit, and said second enclosure, said main portion further including an outwardly extending flange having a seal thereon, said flange for providing desired positioning of said third enclosure in a plasma chamber.

10. The apparatus of claim 9, wherein said housing further comprises:

a cap connectable to said main portion including means for providing diagnostic instrumentation to said housing for accessing a portion of said housing adjacent to and in fluid communication with a third enclosure containing said specimen.

11. The apparatus of claim 10, further including a biasing grid positionable relative to said cap, so as to form a portion of said third enclosure, said biasing grid for altering the electromagnetic fields and charged particle distribution adjacent to the specimen.

12. The apparatus of claim 9, wherein said means for providing diagnostic instrumentation comprises a plurality of conduits extending through said cap for providing access to sensors.

13. The system of claim 7, further comprising:

diagnostic instrumentation; and

means for providing said diagnostic instrumentation to said housing for accessing a portion of said housing adjacent to, and in fluid communication with, a third enclosure containing said specimen.

14. The system of claim 13, wherein said diagnostic instrumentation comprises an additional pressure measurement device.

15. The apparatus of claim 13, wherein said diagnostic instrumentation comprises means for measuring electromagnetic radiation.

16. The system of claim 13, wherein said diagnostic instrumentation comprises means for extracting and providing gases to and from said third enclosure.