Orientation location system of an observation instrument

• US 5,828,447 A
• Filed: 02/25/1997
• Issued: 10/27/1998
• Est. Priority Date: 08/29/1994
• Status: Expired due to Fees

• Current Assignee: Centre National D'Etudes Spatiales
• Original Assignee: Centre National D'Etudes Spatiales
• Inventors: Duchon, Paul, Otrio, Georges
• Primary Examiner(s): Font, Frank G.
• Assistant Examiner(s): STAFIRA, MICHAEL PATRICK
• Application Number:
  US08/793,508
• Time in Patent Office: 609 Days
• Field of Search: 356/152.1, 356/141, 356/255, 356/153, 356/138, 356/1, 356/150, 356/151, 356/247, 356/152.2, 356/152.3, 250/203 R, 250/202, 250/224, 250/225, 250/208
• US Class Current: 356/152.1
• CPC Class Codes: B64G 1/22 Parts of, or equipment specially adapted for fitting in or to, cosmonautic vehicles
• CPC Class Codes: B64G 3/00 Observing or tracking cosmonautic vehicles
• CPC Class Codes: G01C 21/025 with the use of startrackers
• CPC Class Codes: G01S 5/163 Determination of attitude using inertial means G01C9/00; control of attitude G05D1/49
• CPC Class Codes: G02B 23/16 Housings; Caps; Mountings; Supports, e.g. with counterweight

Abstract

An observation instrument located on a satellite is provided with light sources, whose radiation is reflected by the facets of at least one optical dihedron, whose shape is such that it deflects very slightly or not at all the reflected beam, even if it is displaced. Thus, the reflected beam, which is representative of the sighting axis of the instrument is reflected to a sensor, having a known orientation, in order to give the real direction of the axis. The invention has application to locations or tracking on the ground by the instrument.

Claims

1. Orientation location system of an observation instrument comprising a light source integral with the instrument emitting a light pattern to the focal plane of the instrument, a mirror-equipped light reflecting system and a light sensor provided with an orientation reference, the reflecting system being designed so as to transmit light from the source to the sensor, the mirrors comprising a dihedron having two facets on which the light from the source is successively reflected, characterized in that the dihedron is integral with a sighting change mirror rotating in front of the instrument, the reflecting facets of the dihedron forming a right angle and being joined by an edge perpendicular to the plane of the sighting change mirror.

2. Location system according to claim 1, characterized in that the dihedron is a right angled triangular section prism, defined by reflecting facets and by a transparent facet by which the light from the source enters the prism and passes out of the same, the reflecting facets being obtained by a coating of the prism.

3. Location system according to claim 1, characterized in that the reflecting system comprises a second prism fixed with respect to the instrument and reflecting to the sensor the light from the source reflected by the dihedron fixed to the mirror, the reflecting facts of the prism forming a right angle and being joined by an edge coplanar to the edge of the dihedron fixed to the mirror, the light sensor being a stellar sensor.

4. Location system according to claim 3, characterized in that the second prism is provided with a semireflecting strip traversed by the light from the source and reflecting a light from stars.

5. Location system according to claim 4, characterized in that the plane of the semireflecting strip is integral with the edge of the second prism and perpendicular thereto.

6. Location system according to claim 1, characterized in that it comprises a second system for reflecting to a light sensor, the second reflecting system comprising a dihedron having two reflecting facets forming a right angle and joined by an edge perpendicular to the rotation axis of the sighting change mirror, the edges of the dihedrons not being parallel, the reflecting systems being useful for different angular travel portions of the sighting change mirror, an optical system being placed between the instrument and the dihedrons in order to defocus the light from the source and form a widened light beam, the dihedrons intercepting different portions of the widened beam.