Method of detecting defects in materials using infrared thermography
First Claim
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1. A method of detecting defects in materials using infrared thermography, comprising:
- placing a rear surface of an examination object close to a front surface of a thermoelectric plate controlled by a temperature controller;
positioning a front surface of the examination object in a vacuum chamber;
disposing an infrared camera outside the vacuum chamber facing the examination object and maintaining a vacuum between the examination object and the infrared camera; and
detecting defects in the examination object from thermal images obtained by the infrared camera.
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Abstract
A method of detecting defects in materials using infrared thermography, includes placing the rear surface of an object to be inspected close to the front surface of a thermoplate controlled by a temperature controller, and the front surface of the object in a vacuum chamber. At the other end of the vacuum chamber, on the outside, an infrared camera is arranged facing the object, so that a vacuum is maintained between the object and the camera. Defects are detected from thermal images of the object, obtained with the infrared camera.
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Citations
3 Claims
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1. A method of detecting defects in materials using infrared thermography, comprising:
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placing a rear surface of an examination object close to a front surface of a thermoelectric plate controlled by a temperature controller; positioning a front surface of the examination object in a vacuum chamber; disposing an infrared camera outside the vacuum chamber facing the examination object and maintaining a vacuum between the examination object and the infrared camera; and detecting defects in the examination object from thermal images obtained by the infrared camera. - View Dependent Claims (2, 3)
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Specification
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Current AssigneeKabushiki Kaisha Square Enix
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Original AssigneeKabushiki Kaisha Square Enix
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InventorsTanaka, Makoto, Nonaka, Katsunobu, Sekine, Kazuyoshi
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Primary Examiner(s)Oda, Christine K.
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Application NumberUS08/747,925Time in Patent Office728 DaysField of Search374/5, 374/45, 374/124, 374/129, 374/137, 374/57, 73/866, 250/341.6, 250/330US Class Current73/866CPC Class CodesG01N 25/72 Investigating presence of f...
