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Method of detecting defects in materials using infrared thermography

  • US 5,834,661 A
  • Filed: 11/12/1996
  • Issued: 11/10/1998
  • Est. Priority Date: 11/15/1995
  • Status: Expired due to Fees
First Claim
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1. A method of detecting defects in materials using infrared thermography, comprising:

  • placing a rear surface of an examination object close to a front surface of a thermoelectric plate controlled by a temperature controller;

    positioning a front surface of the examination object in a vacuum chamber;

    disposing an infrared camera outside the vacuum chamber facing the examination object and maintaining a vacuum between the examination object and the infrared camera; and

    detecting defects in the examination object from thermal images obtained by the infrared camera.

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