Method and apparatus for imaging a sample on a device

• US 5,834,758 A
• Filed: 09/04/1996
• Issued: 11/10/1998
• Est. Priority Date: 09/02/1994
• Status: Expired due to Term

• Current Assignee: Affymetrix, Inc. (Thermo Fisher Scientific Incorporated)
• Original Assignee: Affymetrix, Inc. (Thermo Fisher Scientific Incorporated)
• Inventors: Walton, Ian, Stern, David, Trulson, Mark, Fodor, Stephen P. A., Rava, Richard, Fiekowsky, Peter
• Primary Examiner(s): Westin, Edward P.
• Assistant Examiner(s): Lee, John R.
• Application Number:
  US08/708,335
• Time in Patent Office: 797 Days
• Field of Search: 250/201.2, 250/201.3, 250/201.4, 250/458.1, 250/459.1, 250/461.1, 250/462.1
• US Class Current: 250/201.2
• CPC Class Codes: B01J 2219/00605 the compounds being directly bound or immobilised to solid supports
• CPC Class Codes: B01J 2219/0061 The surface being organic
• CPC Class Codes: B01J 2219/00612 the surface being inorganic
• CPC Class Codes: B01J 2219/00637 by coating it with another layer
• CPC Class Codes: B01J 2219/00659 Two-dimensional arrays
• CPC Class Codes: B01J 2219/00702 Processes involving means for analysing and characterising the products
• CPC Class Codes: G01N 2021/6417 Spectrofluorimetric devices
• CPC Class Codes: G01N 2021/6423 Spectral mapping, video display
• CPC Class Codes: G01N 2021/6441 with two or more labels
• CPC Class Codes: G01N 21/6428 Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes" in vivo A61B5/00; immunoassay G01N33/53
• CPC Class Codes: G01N 21/6452 Individual samples arranged in a regular 2D-array, e.g. multiwell plates
• CPC Class Codes: G01N 21/6456 Spatial resolved fluorescence measurements; Imaging

Abstract

Labeled targets on a support synthesized with polymer sequences at known locations according to the methods disclosed in U.S. Pat. No. 5,143,854 and PCT WO 92/10092 or others, can be detected by exposing selected regions of sample 1500 to radiation from a source 1100 and detecting the emission therefrom, and repeating the steps of exposition and detection until the sample is completely examined.

Claims

1. In a imaging system for imaging a sample on a support having a first surface and a second surface, the sample being located at or near said second surface, said second surface being weakly reflective relative to said first surface, a method for focusing an excitation radiation on said weakly reflective surface comprising the steps of:

a) focusing excitation radiation on said first surface;

b) focusing excitation radiation on said second surface; and

c) finely focusing excitation radiation on said second surface.

2. The method as recited in claim 1 wherein said step of focusing said first surface comprises the steps of:

a) directing an excitation radiation at said first surface through excitation optics, said excitation radiation being reflected by said first surface;

b) focusing said reflected excitation radiation to a spot, said spot traversing a slit perpendicularly as said first surface is moved in a direction relative to said excitation radiation, said slit configured such that said spot is located substantially in the center of said slit when said first surface is focused;

c) detecting said amount of reflected excitation radiation passing through said slit;

d) determining if said amount of reflected excitation radiation passing through said slit has peaked;

e) moving said support closer relative to said excitation radiation and repeating steps a-e until said amount of reflected excitation radiation passing through said slit has peaked.

3. The method as recited in claim 2 wherein said step of focusing said second surface comprises the steps of:

a) moving said support closer relative to said excitation radiation and a distance which the said support is moved is equal to about half the thickness of said support;

b) directing an excitation radiation at said second surface, said excitation radiation being reflected by said second surface;

c) focusing said reflected excitation radiation to a spot, said spot traversing said slit perpendicularly as said second surface is moved in a direction relative to said excitation radiation, said slit configured such that said spot is located substantially in the center of said slit when said second surface is focused;

d) detecting said amount of reflected excitation radiation passing through said slit;

e) determining if said amount of reflected excitation radiation passing through said slit has peaked; and

f) moving said support closer relative to said excitation radiation and repeating steps b-f until said amount of reflected excitation radiation passing through said slit has peaked.

4. The method as recited in claim 3 wherein said step of finely focusing said second surface comprises the steps of:

a) directing an excitation radiation at said second surface, said excitation radiation being reflected by said second surface;

b) focusing said reflected excitation radiation through said slit;

c) detecting said amount of reflected excitation radiation passing through said slit, said slit configured such that said reflected excitation radiation is located substantially at the center of said slit when said second surface is located substantially in a focal plane of said excitation light

d) determining if said amount of reflected excitation radiation passing through said slit has peaked; and

e) moving said support farther relative to said excitation radiation and repeating steps a-e until said amount of reflected excitation radiation passing through said slit has peaked.

5. The method of claim 1, wherein said second surface comprises a plurality of different polymer sequences, wherein each of said different polymer sequences is coupled to said second surface in a different known location.

6. The method of claim 5, wherein said plurality of different polymer sequences comprises a plurality of different nucleic acid sequences.

7. The method of claim 6, wherein said sample is a labeled target nucleic acid.