Method for producing capacitive ceramic absolute pressure sensors sorted in zero-point long-term stability defect classes

• US 5,836,063 A
• Filed: 03/05/1997
• Issued: 11/17/1998
• Est. Priority Date: 03/23/1996
• Status: Expired due to Fees

• Current Assignee: Envec Mess-Und Regeltechnik GmbH + Company
• Original Assignee: Envec Mess-Und Regeltechnik GmbH + Company
• Inventors: Klausmann, Lukas, Hegner, Frank
• Primary Examiner(s): Eley, Timothy V.
• Assistant Examiner(s): Halpern, Benjamin M.
• Application Number:
  US08/811,708
• Time in Patent Office: 622 Days
• Field of Search: 29/25.42, 73/718, 73/724
• US Class Current: 29/25.42
• CPC Class Codes: G01L 27/005 Apparatus for calibrating pressure sensors
• CPC Class Codes: G01L 9/0075 using a ceramic diaphragm, e.g. alumina, fused quartz, glass
• CPC Class Codes: Y10T 29/435 Solid dielectric type

Abstract

In this method for producing capacitive alumina-ceramic absolute pressure sensors sorted in high-precision zero-point long-term stability defect classes referred to a measured-value span c_sp, the sensors are firstly produced conventionally: a substrate is provided with an annular first electrode and, at the center, a circular second electrode insulated from the first; a diaphragm is provided with a third electrode, and the substrate and diaphragm are joined tightly together in a vacuum by the mutually facing electrodes, at an outer edge through the interposition of an active brazing ring with the formation of a chamber, with the result that a pressure-dependent capacitance C_p and a pressure-independent capacitance C_r are produced. Then, using the equation c=(C_p -C_r)/C_p =k₁ (p-p₀)+k₀, at room temperature and under a vacuum (=p→0) a first zero value c_n1 =-k₁ p₀ +k₀ is determined by means of a capacitance zero-point measuring device having the zero-point measuring error F_n. A second zero value c_n2 =-k₁ p₀ '"'"'+k₀ is determined for each sensor by means of the same measuring device after the sensors have been stored in a gas during a period t in such a way that the pressure and/or temperature of the gas was raised, or its molecular weight was lowered, with respect to normal atmospheric conditions. Then the difference δc_n between the first and second zero values δc_n =c_n1 -c_n2 =-k₁ δp₀ is formed, and the value δc_n /c_sp is compared with the value F_n /c_sp. It is also possible to make use analogously of the zero-point temperature coefficient.

Claims

1. A method for producing capacitive alumina-ceramic absolute pressure sensors sorted in high-precision zero-point long-term stability defect classes which comprises the following steps:

forming a disk-shaped substrate having an annular first electrode near the edge of the substrate and a circular second electrode near the center of the substrate, the first electrode being electrically insulated from the second electrode,

forming a diaphragm having a third electrode;

forming an absolute pressure sensor by tightly joining the outer edge of the substrate to the outer edge of the diaphragm using an active brazing ring, a chamber being formed between the substrate and the diaphragm, the first electrode facing the third electrode making a virtually pressure independent reference capacitance, and the second electrode facing the third electrode making a pressure-dependent capacitance;

determining a measured-value span for the absolute pressure sensor;

determining a first zero value for the absolute pressure sensor in a first condition having a first gas at a first temperature and under a near-vacuum pressure using a high-precision capacitance zero-point measuring device having a guaranteed zero-point measuring error;

storing the absolute pressure sensor in a second condition having at least one of a second gas, a second temperature and a second pressure, the second gas having a lower molecular weight than the first gas, the second temperature being greater than normal room temperature, the second pressure being greater than normal atmospheric pressure;

after the storing step, determining a second zero value for the absolute pressure sensor in the first condition using the high-precision capacitance zero-point measuring device;

calculating a pressure sensor ratio by dividing the difference between the first zero value and the second zero value by the measured-value span of the absolute pressure sensor;

calculating a reference ratio by dividing the guaranteed zero-point measuring error of the high-precision capacitance zero-point measuring device by the measured-value span of the absolute pressure sensor;

selecting a minimum value which is greater than the reference ratio;

comparing the pressure sensor ratio to the minimum value; and

classifying the absolute pressure sensor into the high-precision zero-point long-term stability defect classes based on the comparison between the pressure sensor ratio and the minimum value.

2. The method of claim 1, wherein the step of forming an absolute pressure sensor by tightly joining the outer edge of the substrate to the outer edge of the diaphragm is performed in a vacuum.

3. The method of claim 1, wherein the step of forming an absolute pressure sensor by tightly joining the outer edge of the substrate to the outer edge of the diaphragm is performed in an inert gas, and the chamber is evacuated.

4. The method of claim 1, wherein the surface area of the first electrode is virtually equal to the surface area of the second electrode.

5. A method for producing capacitive alumina-ceramic absolute pressure sensors sorted in high-precision zero-point long-term stability defect classes which comprises the following steps:

forming a disk-shaped substrate having an annular first electrode near the edge of the substrate and a circular second electrode near the center of the substrate, the first electrode being electrically insulated from the second electrode,

forming a diaphragm having a third electrode;

forming an absolute pressure sensor by tightly joining the outer edge of the substrate to the outer edge of the diaphragm using an active brazing ring, a chamber being formed between the substrate and the diaphragm, the first electrode facing the third electrode making a virtually pressure independent reference capacitance, and the second electrode facing the third electrode making a pressure-dependent capacitance;

determining a measured-value span for the absolute pressure sensor;

determining a first zero-point temperature coefficient value for the absolute pressure sensor at a first temperature and a second temperature in a first condition having a first gas under a near-vacuum pressure using a high-precision capacitance zero-point temperature coefficient measuring device having a guaranteed temperature coefficient measuring error, the first temperature being different from the second temperature, one of the first temperature and the second temperature being equal to room temperature;

storing the absolute pressure sensor in a second condition having at least one of a second gas, a raised temperature and a second pressure, the second gas having a lower molecular weight than the first gas, the raised temperature being greater than normal room temperature, the second pressure being greater than normal atmospheric pressure;

after the storing step, determining a second zero-point temperature coefficient value for the absolute pressure sensor at the first temperature and the second temperature in the first condition using the high-precision capacitance zero-point temperature coefficient measuring device;

calculating a pressure sensor ratio by dividing the difference between the first zero-point temperature coefficient value and the second zero-point temperature coefficient value by the measured-value span of the absolute pressure sensor;

calculating a reference ratio by dividing the guaranteed temperature coefficient measuring error of the high-precision capacitance zero-point temperature coefficient measuring device by the measured-value span of the absolute pressure sensor;

selecting a minimum value which is greater than the reference ratio;

comparing the pressure sensor ratio to the minimum value; and

classifying the absolute pressure sensor into the high-precision zero-point long-term stability defect classes based on the comparison between the pressure sensor ratio and the minimum value.

6. The method of claim 5, wherein the step of forming an absolute pressure sensor by tightly joining the outer edge of the substrate to the outer edge of the diaphragm is performed in a vacuum.

7. The method of claims 5, wherein the step of forming an absolute pressure sensor by tightly joining the outer edge of the substrate to the outer edge of the diaphragm is performed in an inert gas, and the chamber is evacuated.

8. The method of claim 5, wherein the surface area of the first electrode is virtually equal to the surface area of the second electrode.