Trench sidewall patterned by vapor phase etching
First Claim
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1. A patterned substrate for integrated circuits, comprising:
- a substrate with a trench, said substrate having a top surface, said trench extending to at least a first point below said top surface of said substrate;
an insulator layer positioned on sidewalls of said trench, said insulator layer extending from said first point up said sidewalls of said trench to a second point above said first point and below said top surface of said substrate, said insulator layer including a dopant; and
a masking material positioned in said trench adjacent said insulator layer, said masking material extending from at or below said first point to a third point between said first point and said second point.
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Abstract
Hydrogen fluoride undercut of oxide layers may be reduced by using a low pressure mixture of gaseous hydrogen fluoride and gaseous ammonia mixture. Organic photoresists can be used as a masking material when using the gaseous hydrogen fluoride/ammonia mixture without resulting in an enhanced reaction rate. In addition, because of the reaction conditions, the dimensions in the oxide layer being etched can be specifically sized smaller than openings made in the overcoating masking material.
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Citations
2 Claims
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1. A patterned substrate for integrated circuits, comprising:
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a substrate with a trench, said substrate having a top surface, said trench extending to at least a first point below said top surface of said substrate; an insulator layer positioned on sidewalls of said trench, said insulator layer extending from said first point up said sidewalls of said trench to a second point above said first point and below said top surface of said substrate, said insulator layer including a dopant; and a masking material positioned in said trench adjacent said insulator layer, said masking material extending from at or below said first point to a third point between said first point and said second point. - View Dependent Claims (2)
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Specification
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Current AssigneeInternational Business Machines Corporation
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Original AssigneeInternational Business Machines Corporation
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InventorsNatzle, Wesley C., Kleinhenz, Richard L., Yu, Chienfan
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Primary Examiner(s)Wallace, Valencia
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Assistant Examiner(s)Hardy, David B.
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Application NumberUS08/865,261Time in Patent Office537 DaysField of Search257/301, 257/302, 257/513, 257/510, 438/561, 438/563US Class Current257/510CPC Class CodesH01L 21/31111 by chemical meansH01L 21/31144 using masksH01L 28/40 Capacitors
