Dual beam laser device for linear and planar alignment

• US 5,838,430 A
• Filed: 07/03/1996
• Issued: 11/17/1998
• Est. Priority Date: 07/03/1996
• Status: Expired due to Term

• Current Assignee: Nearfield Systems Inc. (Quadrant Management Incorporated)
• Original Assignee: Nearfield Systems Inc. (Quadrant Management Incorporated)
• Inventors: Slater, Dan, Kramer, David M.
• Primary Examiner(s): Hantis, K.
• Application Number:
  US08/675,655
• Time in Patent Office: 867 Days
• Field of Search: 356/138, 356/73, 356/150, 356/400, 356/248, 356/249, 356/250, 356/153, 356/148, 356/149, 356/399, 356/247, 356/401, 356/351, 356/152.1-152.3, 356/140 , 356/141.1-141.5, 250/234
• US Class Current: 356/138
• CPC Class Codes: G01B 11/26 for measuring angles or tapers; for testing the alignment of axes
• CPC Class Codes: G01B 11/27 for testing the alignment of axes means for centering or aligning a light guide within a ferrule G02B6/3834
• CPC Class Codes: G01C 15/004 Reference lines, planes or sectors

Abstract

A high precision alignment apparatus is provided that utilizes a semiconductor laser device, such as a laser diode, to provide a source laser beam. The alignment apparatus permits the division of a pair of beam components from the source laser beam useful for either linear or planar alignment. A centroid measurement between the beam components provides a corrected reference point that accounts for the inherent instability of the source laser beam to yield a high level of alignment accuracy. For linear alignment purposes, the beam components are collinearly directed. In the alternative, for planar alignment purposes, the beam components may be either collinear or directed in opposite directions, and rotated to sweep respective planar regions. The laser alignment apparatus is capable of providing a level of accuracy heretofore achievable only with gas lasers, while maintaining the economical attributes of commercial semiconductor laser diodes.

Claims

1. An apparatus for providing a reference beam for use in an alignment system, comprising:

a collimated light source providing a light beam;

means for dividing said light beam into a first and second beam component, wherein said first and second beam components are projected outwardly from said dividing means in opposite directions;

means for detecting a common centroid of said first and second beam components that is independent of drift of said light beam; and

means for rotating said dividing means about an axis to cause the first and second beam components to sweep respective planar regions.

2. An apparatus for providing a reference beam for use in an alignment system, comprising:

a collimated light source providing a light beam;

means for dividing said light beam into a first and second beam component, wherein said first and second beam components are projected outwardly from said dividing means in opposite directions, wherein said dividing means further comprises a housing and a beamsplitter disposed within said housing at a predetermined angle, said beamsplitter having a reflective coating which reflects said first beam component therefrom, said second beam component being transmitted through said beamsplitter;

means for detecting a common centroid of said first and second beam components that is independent of drift of said light beam; and

means for rotating said housing about an axis to cause said first and second beam components to sweep a planar region.

3. An apparatus for providing a planar reference beam for use in an alignment system, comprising:

a collimated light source providing a light beam;

a wedge having first and second faces that respectively reflect first and second beam components of said light beam in opposite directions;

means for rotating said wedge about an axis to cause the first and second beam components to sweep respective planar regions; and

means for detecting a common centroid of said first and second beam components.

4. The apparatus of claim 3, wherein said detecting means further comprises a photodetector oriented remotely from said wedge to permit said first and second beam components to impinge thereon and provide said common centroid measurement therefrom.

5. The apparatus of claim 3, wherein said rotating means further comprises a motor.

6. An apparatus for providing a reference beam for use in an alignment system comprising:

a collimated light source providing a light beam;

means for dividing said light beam into first and second beam components, said dividing means comprising;

first optical means disposed at a predetermined angle with respect to said light beam for reflecting said first beam component therefrom and for transmitting said second beam component therethrough;

second optical means for collinearly reflecting said reflected first beam component back to said first optical means, said first beam component being thereby transmitted through said first optical means; and

third optical means for coaxially reflecting said second beam component back to said first optical means, said reflected second beam component being thereby reflected off of said first optical means in an overlapping manner with said first beam component;

means for detecting a common centroid of said first and second beam components; and

means for rotating said dividing means about an axis to cause said first and second beam components to sweep a planar region.

7. An apparatus for providing a planar reference beam for use in an alignment system, comprising:

a light source providing a light beam;

means for dividing said light beam into a first and second beam component directed in opposite directions, said dividing means comprising;

first optical means for reflecting said first beam component therefrom in a first direction and for transmitting said second beam component therethrough; and

second optical means for collinearly reflecting said transmitted second beam component back to said first optical means, said first beam component being thereby reflected therefrom in a second direction opposite to said first direction of said first beam component;

means for rotating said dividing means about a central axis to cause said first and second beam components to sweep respective planar regions; and

means for detecting a common centroid of said first and second beam components.

8. The apparatus of claim 7, wherein said first optical means is disposed at a predetermined angle with respect to said central axis.

9. The apparatus of claim 7, wherein said first optical means further comprises a beamsplitter having a reflective coating on at least a first surface thereof.

10. The apparatus of claim 7, wherein said second optical means further comprises a retroreflector.

11. The apparatus of claim 7, wherein said detecting means further comprises:

at least one photodetector oriented to permit said first and second beam components to impinge thereon and provide said common centroid measurement therefrom.

12. The apparatus of claim 7, wherein said detecting means further comprises:

a first photodetector oriented to permit said first beam component to impinge thereon;

a second photodetector oriented to permit said second beam component to impinge thereon; and

means associated with said first and second photodetectors for providing said common centroid measurement therefrom.

13. The apparatus of claim 7, wherein said light source further comprises a laser diode.

14. The apparatus of claim 7, wherein said rotating means further comprises a motor.

15. An apparatus for providing a planar reference beam for use in an alignment system, comprising:

a collimated light emitting source providing a light beam and means for rotating said light emitting source at a first rotational rate;

reflecting means having at least first and second surfaces for reflecting said light beam in a normal direction and means for rotating said reflecting means at a second rotational rate to cause said reflected light beam to sweep through a substantially planar region, said second rotational rate being less than said first rotational rate; and

means oriented to permit said reflected light beam to impinge thereon for detecting a centroid of said reflected light beam.

16. The apparatus of claim 15, wherein said detecting means further comprises a photodetector oriented remotely from said reflecting means.

17. The apparatus of claim 15, wherein said second rotational rate is half said first rotational rate.

18. The apparatus of claim 15, wherein said second rotational rate is harmonically related to said first rotational rate.

19. The apparatus of claim 15, wherein said reflecting means further comprises a pentaprism.

20. An apparatus for providing a reference beam for an alignment system, comprising:

a collimated light source providing a first and a second laser beam directed in opposite directions;

means for rotating said collimated light source about an axis to cause said first and second laser beams to sweep respective planar regions; and

means for detecting a common centroid of said first and second beam laser beams.

21. The apparatus of claim 20, wherein said collimated light source further comprises a gas laser.