Method and apparatus for programmable thermal sensor for an integrated circuit
First Claim
1. A method for detecting a threshold temperature in an integrated circuit comprising the steps of:
- generating a voltage reference that is substantially independent of a temperature of the integrated circuit;
receiving at least one programmable input specifying a value corresponding to a threshold temperature for the integrated circuit;
generating a sensing voltage that varies substantially linearly with the temperature of the integrated circuit;
scaling the sensing voltage in accordance with the value to generate a comparison voltage, wherein the comparison voltage is substantially equal to the voltage reference when the temperature of the integrated circuit is substantially the same as the threshold temperature; and
generating a signal when a difference between the comparison voltage and the voltage reference indicates the integrated circuit has attained said threshold temperature.
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Abstract
A programmable thermal sensor is implemented in an integrated circuit such as a microprocessor. The programmable thermal sensor monitors the temperature of the integrated circuit, and generates an output to indicate that the temperature of the integrated circuit has attained a pre-programmed threshold temperature. In a microprocessor implementation, the microprocessor contains a processor unit, an internal register, microprogram and clock circuitry. The microprogram writes programmable input values, corresponding to threshold temperatures, to the internal register. The programmable thermal sensor reads the programmable input values, and generates an interrupt when the temperature of the microprocessor reaches the threshold temperature. In addition to a programmable thermal sensor, the microprocessor contains a fail safe thermal sensor that halts operation of the microprocessor when the temperature attains a critical temperature.
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Citations
19 Claims
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1. A method for detecting a threshold temperature in an integrated circuit comprising the steps of:
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generating a voltage reference that is substantially independent of a temperature of the integrated circuit; receiving at least one programmable input specifying a value corresponding to a threshold temperature for the integrated circuit; generating a sensing voltage that varies substantially linearly with the temperature of the integrated circuit; scaling the sensing voltage in accordance with the value to generate a comparison voltage, wherein the comparison voltage is substantially equal to the voltage reference when the temperature of the integrated circuit is substantially the same as the threshold temperature; and generating a signal when a difference between the comparison voltage and the voltage reference indicates the integrated circuit has attained said threshold temperature. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. An apparatus for detecting a threshold temperature in an integrated circuit comprising:
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voltage reference means for generating a voltage reference substantially independent of a temperature of the integrated circuit; at least one programmable input for receiving a value corresponding to a threshold temperature of the integrated circuit; temperature sensing means for generating a sensing voltage wherein the sensing voltage varies substantially linearly with the temperature of the integrated circuit, the temperature sensing means scaling the sensing voltage in accordance with the value to generate a comparison voltage, wherein the comparison voltage is substantially equal to the voltage reference when the integrated circuit attains the threshold temperature; and comparison means coupled to the temperature sensing means and the voltage reference means, wherein the comparison means generates a signal when the comparison voltage exceeds the voltage reference to indicate the integrated circuit temperature attained the threshold temperature. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. An apparatus for detecting a threshold temperature in an integrated circuit comprising:
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a bandgap reference circuit providing a voltage reference substantially independent of a temperature of the integrated circuit; a bipolar transistor providing a base-to-emitter voltage (Vbe) as a sensing voltage, wherein the sensing voltage varies substantially linearly with the temperature of the integrated circuit; at least one programmable input receiving a value corresponding to a threshold temperature for the integrated circuit; a voltage divider coupled to the bipolar transistor, wherein the voltage divider scales Vbe in accordance with the value to generate a comparison voltage, wherein the comparison voltage is substantially equal to the voltage reference when the temperature of the integrated circuit is substantially equal to the threshold temperature; and a comparator providing a signal when a difference between the comparison voltage and the voltage reference indicates that the threshold temperature has been attained. - View Dependent Claims (16, 17, 18, 19)
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Specification