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Method and apparatus for programmable thermal sensor for an integrated circuit

  • US 5,838,578 A
  • Filed: 06/06/1996
  • Issued: 11/17/1998
  • Est. Priority Date: 09/21/1993
  • Status: Expired due to Term
First Claim
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1. A method for detecting a threshold temperature in an integrated circuit comprising the steps of:

  • generating a voltage reference that is substantially independent of a temperature of the integrated circuit;

    receiving at least one programmable input specifying a value corresponding to a threshold temperature for the integrated circuit;

    generating a sensing voltage that varies substantially linearly with the temperature of the integrated circuit;

    scaling the sensing voltage in accordance with the value to generate a comparison voltage, wherein the comparison voltage is substantially equal to the voltage reference when the temperature of the integrated circuit is substantially the same as the threshold temperature; and

    generating a signal when a difference between the comparison voltage and the voltage reference indicates the integrated circuit has attained said threshold temperature.

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