Coordinate measuring apparatus having a spatially adjustable probe pin

• US 5,848,477 A
• Filed: 02/11/1997
• Issued: 12/15/1998
• Est. Priority Date: 02/16/1996
• Status: Expired due to Fees

• Current Assignee: Carl Zeiss Industrielle Messtechnik GmbH (Carl-Zeiss-Stiftung)
• Original Assignee: Carl-Zeiss-Stiftung
• Inventors: Lonardoni, Ronald, Bernhardt, Ralf, Wiedmann, Wolfgang
• Primary Examiner(s): Fulton, Christopher W.
• Application Number:
  US08/798,540
• Time in Patent Office: 672 Days
• Field of Search: 33/503, 33/556, 33/558.01, 33/559, 33/DIG. 1
• US Class Current: 33/503
• CPC Class Codes: G01B 21/047 Accessories, e.g. for positioning, for tool-setting, for measuring probes
• CPC Class Codes: G01B 5/012 Contact-making feeler heads therefor
• CPC Class Codes: Y10S 33/01 Magnetic

Abstract

The invention is directed to a coordinate measuring apparatus wherein the drives (3, 5, 6) for the measuring sleds of the apparatus are controlled on circularly-shaped paths to machine-control adjust the spatial orientation of the probe pin 9. The probe pin is attached to a passive rotation-pivot joint and has a probe ball which is driven into one of several centering gaps of a body 10. In this way, a separate drive for the rotation-pivot joint 8 is not needed.

Claims

1. A coordinate measuring apparatus for measuring a workpiece, the coordinate measuring apparatus comprising:

a probe head unit including a probe head and a probe pin with a contact element for contacting the workpiece;

a structure for accommodating the workpiece;

an assembly moveable relative to said structure for adjusting the spatial orientation (θ

, φ

) of said probe pin;

said probe head unit further including a joint for permitting at least one of said probe head and said probe pin to pivot about at least one axis; and

, a releasable holding device for selectively arresting movement of said joint to hold said probe pin in fixed relationship to said assembly and for releasing said joint to permit said joint to move thereby allowing said probe pin to pivot relative to said assembly;

a device mounted on said coordinate measuring apparatus and defining a receptacle for receiving said contact element centered therein;

a control system for driving said assembly to adjust said spatial orientation (θ

, φ

) of said probe pin; and

, said control system being adapted to move said joint along spatial paths so as to maintain said contact element centered in said receptacle.

2. The coordinate measuring apparatus of claim 1, said device being a convex body defining a surface having a plurality of said receptacles formed therein.

3. The coordinate measuring apparatus of claim 2, said convex body being configured in the manner of a hedge hog or a mace.

4. The coordinate measuring apparatus of claim 2, said convex body being configured to have a plurality of spherical bodies thereon to define a plurality of said receptacles.

5. The coordinate measuring apparatus of claim 1, said joint being journalled so as to permit said probe pin to pivot about two mutually perpendicular axes.

6. The coordinate measuring apparatus of claim 5, said joint being a spherical bearing or a cardanic bearing.

7. The coordinate measuring apparatus of claim 1, said releasable holding device including a latching device for latching said joint to permit said probe pin to assume any one of a plurality of predetermined angular positions.

8. The coordinate measuring apparatus of claim 7, said latching device being an electromagnetic device for clamping and unclamping said joint;

and, said control system being adapted to drive said electromagnetic device.

9. The coordinate measuring apparatus of claim 8, said electromagnetic device including a permanent magnet and electromagnet driven by said control system for clamping and unclamping said joint.

10. A coordinate measuring apparatus for measuring a workpiece, the coordinate measuring apparatus comprising:

a probe head unit including a probe head and a probe pin with a contact element for contacting the workpiece;

a structure for accommodating the workpiece;

an assembly moveable relative to said structure for adjusting the spatial orientation (θ

, φ

) of said probe pin;

said probe head unit further including a pivot means for permitting at least one of said probe head and said probe pin to pivot about at least one axis; and

, a releasable holding device for selectively arresting movement of said pivot means to hold said probe pin in fixed relationship to said assembly and for releasing said pivot means to permit said pivot means to move thereby allowing said probe pin to pivot relative to said assembly;

a device mounted on said coordinate measuring apparatus and defining a receptacle for receiving said contact element centered therein;

a control system for driving said assembly to adjust said spatial orientation (θ

, φ

) of said probe pin; and

,

said control system being adapted to move said axis along spatial circular paths referred to the position of said contact element as a center point.

11. A method for aligning a probe pin in a coordinate measuring apparatus including a control system and a probe head unit including a probe head and a probe pin with a contact element for contacting a workpiece, the probe head unit further including a joint for permitting at least one of said probe head and said probe pin to pivot relative to said apparatus, the method comprising the steps of:

moving said probe pin so that said contact element thereof seats centered in a receptacle of a device mounted on said apparatus;

utilizing said control system to drive said joint on a path in such a manner that said contact element remains centered in said device and to thereby produce a pivot movement of said probe pin to newly orientate said probe pin; and

,

then moving said probe pin with said contact element out of said receptacle.

12. The method of claim 11, comprising the further steps of:

inputting to said control system a desired change in the alignment of said probe pin;

determining the spacing of said contact element from said joint; and

,

computing in said control system the circular path in correspondence to said spacing along which said joint must be made to travel by simultaneously driving several measurement slides of said apparatus to achieve said alignment.

13. The method of claim 11, comprising the further steps of:

sequentially carrying out several individual pivot operations to pivot said probe pin over a larger angular range (θ

, φ

); and

,

changing the receptacle centered into between each two of said pivot operations.

14. A method for aligning a probe pin in a coordinate measuring apparatus including a control system and a probe head unit including a probe head and a probe pin with a contact element for contacting a workpiece, the probe head unit further including pivot means for permitting at least one of said probe head and said probe pin to pivot relative to said apparatus about at least one axis, the method comprising the steps of:

moving said probe pin so that said contact element thereof seats centered in a receptacle of a device mounted on said apparatus;

utilizing said control system to drive said pivot means along a spatial circular path referred to the position of said centered contact element to thereby produce a pivot movement of said probe pin while said contact element maintains its position in said receptacle to newly orientate said probe pin; and

,

then moving said probe pin with said contact element out of said receptacle.

15. The method of claim 14, comprising the further steps of:

inputting to said control system a desired change in the alignment of said probe pin;

determining the spacing of said contact element from said pivot means; and

,

computing in said control system the circular path in correspondence to said spacing along which said pivot means must be made to travel by simultaneously driving several measurement slides of said apparatus to achieve said alignment.